这是我们认为您想要浏览的网页。 查看搜索结果:

 

与专家联系

制造与生产测试

随着世界的迅速转变,市场上的新技术不断涌现,消费电子工业医疗行业的工程师纷纷在产品设计中融入了最新的技术。变化的速度越来越快,而产品创新的脚步也日益扩大。

不过,有些事情没有改变,例如您仍然需要降低产品和设计成本,从而增加利润;加快产品上市速度,以便满足消费者不断增长的期望――性能卓越的现代化产品,可以不断演进升级。

是德科技可以为您提供帮助。凭借市场领先的硬件和软件,以及超过 75 年的测试与测量经验,我们能够帮助您解决最棘手的测试挑战,让您保持领先优势。

缩小范围

行业/技术

按内容类型

按产品类别

26-50 / 319

排序:
是德科技 Mini 在线测试仪 
是德科技 Mini 在线测试仪

应用说明 2016-04-06

是德科技 Mini 在线测试仪 
是德科技 Mini 在线测试仪

产品资料 2016-04-06

是德科技使用 Keysight TS-8989 PXI 功能测试系统测试汽车(电子驻车制动) EPB 控制系统 
是德科技使用 Keysight TS-8989 PXI 功能测试系统测试汽车(电子驻车制动) EPB 控制系统

应用说明 2016-03-24

是德科技使用CVI Labwindows在TS-5400 PXI 系列上开发测试程序 
是德科技使用CVI Labwindows在TS-5400 PXI 系列上开发测试程序

应用说明 2016-03-24

E5052B Signal Source Analyzer - Data Sheet 
This 21-page data sheet provides technical specifications for the E5052B (10 MHz to 7 GHz) signal source analyzer and the E5053A Downconverter (3 GHz to 26.5 GHz). The E5052B is a single-instrument solution that offers an indispensable set of measurement functions for evaluating RF & microwave signal sources such as VCOs, crystal oscillators, SAW oscillators, dielectric resonator oscillators, YIG oscillators, PLL synthesizers, RFICs, and L.O. circuits.

产品资料 2016-03-23

PDF PDF 2.27 MB
E5061B Network Analyzer, 100 kHz to 1.5 GHz/3 GHz, 5 Hz to 3 GHz - Brochure 
This brochure introduces overview of the E5061B network analyzer, including its RF NA options (100 kHz to 1.5/3 GHz), LF-RF NA option (5 Hz to 3 GHz), and impedance analysis option.

手册 2016-03-23

PDF PDF 6.45 MB
Stay ALERT – Don’t Get Hurt 

文章 2016-03-03

 
CX3300 Series Device Current Waveform Analyzer - Product Fact Sheet 
The CX3300 series is the world's first instrument that can precisely visualize low-level current waveforms you have never seen before by 14/16-bit dynamic range, max. 200 MHz bandwidth and low noise.

手册 2016-02-25

PDF PDF 1.13 MB
Right Load Switching and Simulation Design Choices for High Current and Mechatronic Functional Tests 
Key considerations for designing a cost-effective high-power switching and load management automotive functional test solution.

应用说明 2016-02-22

PDF PDF 967 KB
Testing a Network Communication PCBA from Prototype to Manufacturing - Article Reprint 
Early implementation of BST can cut test costs and time.

文章 2016-02-17

PDF PDF 178 KB
The Boundary Scan Toolbox - Article Reprint 
Find out how boundary scan can enable embedded and other value-added test in your toolbox.

文章 2016-02-16

PDF PDF 409 KB
New IEEE Standards for Board and System Tests - Article Reprint 
This article highlights of changes to IEEE Std 1149.1, IEEE Std 1149.6, IEEE P1149.10 and IEEE P1838.

文章 2016-02-16

PDF PDF 190 KB
I'm a Board Test Engineer and I'm Loving It! - Article Reprint 
Life on the road can be relentless, but it’s never boring. Find out why from this personal story of a test engineer.

文章 2016-02-12

PDF PDF 178 KB
Emulating Analog Input Sensors in Automotive Electronics Functional Test - Article Reprint 
This article discusses guidelines for evaluating the digital-analog converters for your automotive electronics functional test needs.

文章 2016-02-09

PDF PDF 318 KB
Manufacturing Test Solutions for SSDS - Article Reprint 
A new system performs both ICT and boundary scan in high-volume settings.

文章 2016-02-09

PDF PDF 222 KB
Testing the Internet of Things - Article Reprint 
Connectivity is embedded in the electronics ecosystem. And test should be embedded in the devices that support it.

文章 2016-02-09

PDF PDF 79 KB
Tester for Hire - Article Reprint 
This article explores the possibility of renting test equipment to help electronics manufacturers juggle capacity according to production demand and available resources.

文章 2016-02-09

PDF PDF 381 KB
Finding Fault - Article Reprint 
testing mission-critical functions in automotive electronics.

文章 2016-02-05

PDF PDF 452 KB
Making Boundary Scan Easy - Article Reprint 
Testing boundary scan devices no longer need be a laborious task.

文章 2016-02-03

PDF PDF 217 KB
Testing of Small Form-Factor Products - Article Reprint 
Boundary scan and embedded test will need to make up for ICT gaps.

文章 2016-02-03

PDF PDF 546 KB
X-Series Signal Analyzers - Brochure 
Brochure for the X-Series signal analyzers.

手册 2016-02-03

PDF PDF 2.09 MB
Automating In-Circuit Test - Article Reprint 
Inline ICT is not as cumbersome as it used to be, and in the longer run, will help manufacturers save costs.

文章 2016-02-02

PDF PDF 87 KB
Testing New Grounds in Automotive Electronics - Article Reprint 
Manufacturers are increasingly designing products for ease of test.

文章 2016-02-02

PDF PDF 279 KB
Cable Assembly Compliance Test Solution Using M937xA PXIe Multiport VNA - Brochure 
The document describes the compliance test solution with the M937xA PXIe Multiport VNA for the high-speed digital standards.

手册 2016-02-01

PDF PDF 771 KB
是德科技 M9393A PXIe 高性能矢量信号分析仪 
是德科技 M9393A PXIe 高性能矢量信号分析仪

手册 2016-02-01

PDF PDF 574 KB

以前 1 2 3 4 5 6 7 8 9 10 ... 下一页