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Manufacturing & Production Test

As the world rapidly transforms with new technologies constantly emerging in the market, engineers in the consumer electronics, industrial and medical industries rush to design products which incorporate the latest trends. The rate of change is increasing, and the pace of product innovation is expanding.

However, a few things remain unchanged, such as the need to reduce your product and design costs to improve margins, and to reduce your time-to-market in order to meet consumers’ increasing expectation for superior and modern products which evolve with the times.

Keysight can help. With our market-leading hardware and software, and over 75 years of test and measurement experience, let us help you solve your most difficult test challenges to keep you ahead of the curve.

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A Flexible Test Solution for Internet of things (IoT) devices with ASK/FSK Modulation - App Note 
Use Keysight’s basic RF instruments to measure and analyze ASK/FSK modulated signals commonly used in a variety of products and systems, ranging from personal consumer electronics and automatic meter reading, to giant industrial devices.

Application Note 2015-04-09

Ethernet 100BASE-TX Cable Test - Test Solution Overview Using the ENA Option TDR 
This describes how to make measurements of 100BASE-TX Ethernet Cable Tests by using the Keysight E5071C ENA Option TDR.

Technical Overview 2015-04-08

PDF PDF 1.90 MB
M9381A PXIe Vector Signal Generator & M9391A PXIe Vector Signal Analyzer - Configuration Guide 
This document provides information for configuring solutions for RF test based on the M9391A PXIe VSA and M9381A PXIe VSG.

Configuration Guide 2015-03-31

PDF PDF 5.25 MB
Automated X-Ray Inspection System Keysight Technologies - Technical Overview 
This is a technical datasheet. Keysight has developed a sealed ultra-high vacumn X-ray tube that provides stable output throughout a significantly long life.

Application Note 2015-03-24

PDF PDF 644 KB
B2961A/B2962A 6.5 Digit Low Noise Power Source - Brochure 
This document describes the benefits of using the B2961A/62A for precision low noise voltage/current sourcing with 6.5 digit, 100 nV/10 fA resolution.

Brochure 2015-03-23

PDF PDF 1.23 MB
Turn-key conducted and radiated EMC test systems for complete test confidence – Frankonia EMC Test 
Turn-key conducted and radiated EMC test systems for complete test confidence – Frankonia and Keysight

Solution Brief 2015-03-17

 
Enhance the Battery Life of your Mobile or Wireless Device - Brochure 
This brochure discusses the number one challenge in the battery-powered device industry which is to maximize battery life. The Keysight N6781A is a 2-quadrant source/measure unit, or SMU, module.

Brochure 2015-03-06

PDF PDF 1.48 MB
Overcome your Test Challenges with the Truevolt Series DMMs - Examples 
View test challenge videos and download application briefs.

Solution Brief 2015-03-03

 
DisplayPort 1.3 Cable-Connector Compliance Test - Test Solution Overview Using the ENA Option TDR 
This describes how to make measurements of VESA DisplayPort 1.3 Cable & Connector Compliance Tests by using the Keysight E5071C ENA Option TDR.

Technical Overview 2015-02-27

PDF PDF 2.17 MB
Signal Generator Selection Guide 
This selection guide provides an overview and side-by-side comparisons to help determine which signal generator is right for you.

Selection Guide 2015-02-25

E5052B Signal Source Analyzer - Brochure 
This 16-page brochure describes the features and benefits of the E5052B (10 MHz to 7 GHz, 26.5 GHz, or 110 GHz) Signal Source Analyzer. The E5052B is a single-instrument solution that offers an indispensable set of measurement functions for evaluating RF & microwave signal sources such as VCOs, crystal oscillators, SAW oscillators, dielectric resonator oscillators, YIG oscillators, PLL synthesizers, RFICs, and L.O. circuits.

Brochure 2015-02-25

PDF PDF 1.92 MB
Imaging Organic and Biological Materials with Low Voltage Scanning Electron Microscopy - App Note 

Application Note 2015-02-20

PDF PDF 3.66 MB
The World’s Highest Pin Count In-Circuit Test Solutions - Brochure 
Keysight's new i3070 and 3070 in-circuit test (ICT) high node count test solution is the world’s highest pin count ICT system, bringing an unprecedented level of performance and portability to users.

Brochure 2015-02-12

PDF PDF 212 KB
i3070 High Node Count Test Solution - Technical Overview 
Keysight's high node count test solution allows any Keysight 3070/i3070 Series 3 or Series 5 four-module test system to be easily upgraded into an ultra-high pin count test system

Technical Overview 2015-02-12

PDF PDF 645 KB
M9068A Phase Noise X-Series Measurement Application for PXI Vector Signal Analyzers 
This document provides technical and other information related to the Phase Noise X-Series measurement application for modular instruments.

Technical Overview 2015-02-10

PDF PDF 2.39 MB
USB3.1 Cable-Connector Assembly Compliance Test - Test Solution Overview Using the ENA Option TDR 
This describes how to make measurements of USB 3.1 cable & connector assemblies Compliance Tests by using the Keysight E5071C ENA Option TDR.

Technical Overview 2015-02-06

PDF PDF 3.42 MB
Solutions for WLAN 802.11ac Manufacturing Test - Application Note 
This “Solutions for WLAN 802.11ac Manufacturing Test” app note gives insight into testing 802.11ac client and infrastructure devices using fast, flexible, cost-effective calibration and non-signaling.

Application Note 2015-02-04

In-Circuit Test Suite - Brochure 
Latest board and functional test solutions to help electronics manufacturers achieve better product quality withmore comprehensive test coverage.

Brochure 2015-02-01

PDF PDF 10.42 MB
Simplify Signal Creation with Signal Studio Software - Brochure 
Signal Studio is a flexible suite of signal-creation tools that reduce the time spent on signal simulation. Its performance-optimized reference signals are validated by Keysight.

Brochure 2015-01-14

PDF PDF 4.19 MB
Detecting Tailgating Boards on the i3070 Inline In-Circuit Tester - Application Note 
Tailgating sensor improvements on the Keysight i3070 Series 5i inline in-circuit tester help to further minimize damages due to operator and upstream loading errors.

Application Note 2015-01-05

PDF PDF 437 KB
Measuring Frequency Response with E5061B LF Network Analyzer 
This application note describes fundamentals on low frequency network analysis by featuring the E5061B LF-RF network analyzer. Here we mainly discuss simple low frequency 2-port device measurements and associated topics.

Application Note 2014-12-05

E4980A Precision LCR Meter 20 Hz to 2 MHz - Brochure 
This brochure provides an overview, specifications and ordering information for the E4980A Precision LCR Meter.

Brochure 2014-12-02

PDF PDF 835 KB
High-Speed Digitizer Technology Expertise 
This brochure presents the added values of the Keysight High-Speed Digitizer Technology, which are: better measurement fidelity, higher measurement throughput and lower total cost of ownership (TCO).

Brochure 2014-11-17

PDF PDF 815 KB
i3070 ICT Fixture Electronic Clock Measurement Modules - Technical Overview 
The Keysight clock measurement modules (CMM)for the i3070 in-circuit test application comes with three types of clock signal measurement to meet your different circuit topologies.

Technical Overview 2014-11-11

PDF PDF 213 KB
InfiniiVision 3000T X-Series Oscilloscopes - Product Fact Sheet 
Quickly see how the InfiniiVision 3000T X-Series oscilloscopes from 100MHz - 1 GHz can help you touch, discover and solve your measurement challenges.

Brochure 2014-09-29

PDF PDF 203 KB

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