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Impedance and Impedance Matching

Impedance measurement is important not only in passive components industry but also various industries such as materials, power supply, and so on. Physical parameters like capacitance (C), inductance (L) and resistance (R) are measured based on the impedance. Also, material parameters (permittivity: ε, permeability: μ) can be derived through impedance measurements. Keysight has a complete line of impedance test equipment and test accessories to help your measurement. When you choose an impedance measurement product from Keysight, you get more than accurate and reliable test results.

Impedance matching for optimal power transfer, noise and efficiency is routine in electronics, but designing impedance matching networks is always tedious. Matching frequency-dependent complex impedance over broadband is especially difficult. Fortunately, Keysight EEsof EDA has the broadest range of circuit synthesis and simulation software in the industry to help you tackle these problems that our engineers also face daily in the design of our test equipment. Over 70% of the world’s RF and microwave engineers use Keysight EDA design tools because they can repeatedly get it right the first time.

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IMS 2015 Demos from Keysight EEsof EDA 
YouTube video playlist containing International Microwave Symposium (IMS) 2015 demo videos from Keysight EEsof EDA MicroApps.

Demostración básica 2015-06-19

How to Match RF Impedance Effectively By Optimally Selecting SMT Devices 
This video demonstrates a very effective RF impedance matching methodology with SMT devices that helps RF engineers save time and cost. With this methodology, RF engineers can start to match the design with a list of good combinations of SMT devices which satisfies the target impedance and loss specifications instead of trying out unlimited possibilities at the workbench. This methodology should work very well with typical wireless or mobile product designs such as smart phones.

Videos - Cómo Usarlo 2015-06-11

Mobile Phone Load Pull Measurements - Maury Microwave 
Automated Mobile Phone Load Pull Measurement Solution from Maury Microwave and Keysight

Información de Soluciones 2015-03-26

Recommendations for Port Setup When Using ADS Momentum and Modelithics Models 
This application note is intended to help Advanced Design System (ADS) users using Modelithics models, simulate RF & Microwave circuits. The focus is on finding the optimum port setup for EM simulation of circuit layouts that include surface-mount technology (SMT) devices.

Nota de aplicación 2015-02-05

How to Design RF and Microwave Impedance Matching Networks 
This video describes how to design RF and Microwave impedance matching networks.

Videos - Cómo Usarlo 2015-01-14

Power of Impedance Analyzer - Application Note 
This application note describes the necessity of real-characteristics evaluation, and shows that the impedance analyzers only have capabilities to achieve real-characteristics.

Nota de aplicación 2015-01-07

Accessories Selection Guide For Impedance Measurements - Selection Guide 
This selection guide introduces all the impedance test fixtures that can be used with LCR meters, Resistance Meters, Capacitance Meters, Impedance Analyzers, and Combination analyzers.

Guía de selección 2014-08-04

Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers 
This application note presents the technologies and methods for measuring permittivity and permeability. The document focuses on impedance measurement technology with the following advantages: Wide frequency range from 20Hz to 1GHz High measurement accuracy Simple preparations (fabrication of material, measurement setup) for measurement.

Nota de aplicación 2014-08-03

LCR Meters, Impedance Analyzers and Test Fixtures Selection Guide 
This 16-page, black-and-white selection guide matchesapplications to LCR meters, Impedance analyzer, and fixtures cotains brief information on products and applicationliteratures.

Guía de selección 2014-06-02

On-Wafer High Power Load Pull Measurements – bsw TestSystems 
On-Wafer High Power Load Pull Measurement Solution from bsw TestSystems and Keysight

Información de Soluciones 2014-04-16

Automated LAN Cable Test System - Beta LaserMike 
Automated LAN Cable Testing Solution from Beta LaserMike and Keysight.

Información de Soluciones 2014-04-09

Impedance Matching with Vector Receiver Load Pull Measurements - Maury Microwave 
Impedance Matching with Vector Receiver Load Pull Measurements from Maury Microwave and Keysight

Información de Soluciones 2014-04-02

Impedance Matching for High Power Devices - Maury Microwave 
Impedance Matching of High Power Devices with Active and Hybrid Load Pull Measurements from Maury Microwave and Keysight

Información de Soluciones 2014-04-02

The Impedance Measurement Handbook-4th Edition - Application Note 
This 140 page handbook is Keysight Technologies's most detailed information on the basics of impedance measurements using Keysight Technologies's LCR meters and impedance analysers. It provides the theory, test set-upinformation, error discussion, etc.

Nota de aplicación 2013-09-10

Impedance and Network Analysis Application List Application Note 
This document provides the information of unique and new solutions for impedance and network analysis with using Keysight impedance analyzers, LCR meters and ENA series network analyzers.

Nota de aplicación 2012-10-30

Evaluating DC-DC Converters and PDN with the E5061B LF-RF Network Analyzer 
This application note describes measurement methods for evaluating frequency domain characteristics of DC-DC converters and passive PDN components by using the E5061B LF-RF network analyzer.

Nota de aplicación 2012-09-03

Impedance Measurements - Evaluating EMC Components with DC Bias Superimposed 
This application note gives an overview on how to evaluate electromagnetic compatible (EMC) components in a way that satisfies strict EMC requirements. It also introduces various EMC measurement solutions.

Nota de aplicación 2009-02-03

Multifrequency C-V Measurements of Semiconductors (AN 369-5) 
The Keysight 4284A has a DC bias capability of +/- 40V and a wide frequency cover age of 20 Hz - 1 MHz, which enable us to make semiconductor C-V measurements.

Nota de aplicación 2008-12-10

Wide-Range DC Current Biased Inductance Measurement (AN 369-8) 
This application note describes DC current biased inductance measurements that are more accurate and made over a wider frequency range than was previously possible.

Nota de aplicación 2008-11-21

New Technologies for Accurate Impedance Measurement (40Hz to 110MHz) 
Auto-balancing bridge method is the best technique to make an accurate impedance measurement in LF frequency. The recent technical innovation successfully expanded its upper frequency limitation from 40MHz to 110MHz. This Product Note discusses how its made and other new technologies included in...

Nota de aplicación 2008-11-20

Effective Transformer/LF Coil Testing (AN 1305-3) 
Transformers/LF coils have gradually become miniaturized and are used in power supply circuits and digital networks(for example, ISDN), and are manufactured in increasing volume. QA and manufacturing have to improve evaluation of transformers/LF coils, but they are faced with big measurement...

Nota de aplicación 2008-11-20

Balanced Circuit Measurement with an Impedance Analyzer/LCR Meter/Network Analyzer (AN 346-2) 
This application note describes the difference between a balanced circuit and an unbalanced circuit, and also explains how to make an unbalanced circuit measurement by the unbalanced instrument step by step.

Nota de aplicación 2008-04-10

Contact Resistance and Insulation Resistance Measurements of Electromechanical Components (AN1305-1) 
This application note describes the contact resistance and insulation resistance measurement of mechanical components.

Nota de aplicación 2008-04-03

Accelerate Your MEMS Device Development and Manufacturing Efficiency 
This brochure describes a general overview of Keysight's capabilities in MEMS device testing and generates awareness of Keysight impedance MEMS test solution to customer.

Catálogo 2007-11-12

Characterizing MEMS Magneto-Impedance Sensor using the Keysight Impedance Analyzer 
This application brief describes the benefits of using Keysight impedance analyzers for device characterization of MEMS Magneto-Impedance (MI) sensors.

Nota de aplicación 2007-03-31

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