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“Shotgunning”, a Bad Fit for Lead-Free Test 
Shotgunning, a common repair technique in functional test, will be negatively affected by lead-free processes. This article explores the technique and draws broad conclusions regarding the impact of lead-free on electronics manufacturing test

어플리케이션 노트 2015-07-14

PDF PDF 99 KB
TS-8989 System Integration Guide - Application Note 
In today’s manufacturing environment, floor space is an increasingly invaluable variable in the cost of test equation.

어플리케이션 노트 2015-06-10

PDF PDF 2.76 MB
5DX Windows 7 Controller Upgrade - Brochure 
Upgrade your 5DX AXI PC controller to enjoy better inspection performance.

브로셔 2015-06-09

PDF PDF 159 KB
Principal Component Analysis-Based Compensation for Measurement Errors 
This paper examines some issues and trends that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing. Published with kind permission of the IEEE

기사 2015-06-08

PDF PDF 1.86 MB
Testing Automotive Electronic Parking Brake Controls with the TS-8989 - Application Note 
This application note discusses the configuration of a typical Keysight TS-8989 PXI Functional Test System for testing automotive electronic parking brake controls.

어플리케이션 노트 2015-05-11

Drive Down the Cost of Test Using the ENA Series of Network Analyzers - Application Note 
In this application note, we discuss the contributions of Keysight Technologies, Inc.’s ENA Series of Vector Network Analyzers (ENA, hereafter) to drive down the cost of test in production lines.

어플리케이션 노트 2015-05-01

PDF PDF 2.46 MB
Measuring Dielectric Properties using Keysight's Materials Measurement Solutions - Brochure 
Quick guide for Keysight materials measurement solutions that can characterize the material under test by measuring dielectric properties such as permittivity and permeability.

브로셔 2015-04-27

PDF PDF 1.66 MB
Characterization of PCB Insertion Loss with a New Calibration Method - Application Note 
In this application note a new method for characterizing PCB loss by using AFR with 1X Open fixtures is proposed.

어플리케이션 노트 2015-03-26

PDF PDF 700 KB
Automated X-Ray Inspection System Keysight Technologies - Technical Overview 
This is a technical datasheet. Keysight has developed a sealed ultra-high vacumn X-ray tube that provides stable output throughout a significantly long life.

어플리케이션 노트 2015-03-24

PDF PDF 644 KB
The World’s Highest Pin Count In-Circuit Test Solutions - Brochure 
Keysight's new i3070 and 3070 in-circuit test (ICT) high node count test solution is the world’s highest pin count ICT system, bringing an unprecedented level of performance and portability to users.

브로셔 2015-02-12

PDF PDF 212 KB
i3070 High Node Count Test Solution - Technical Overview 
Keysight's high node count test solution allows any Keysight 3070/i3070 Series 3 or Series 5 four-module test system to be easily upgraded into an ultra-high pin count test system

기술 개요 2015-02-12

PDF PDF 645 KB
In-Circuit Test Suite - Brochure 
Latest board and functional test solutions to help electronics manufacturers achieve better product quality withmore comprehensive test coverage.

브로셔 2015-02-01

PDF PDF 10.42 MB
Time Domain Reflectometry Theory - Application Note 
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

어플리케이션 노트 2015-01-30

Non-Contact Measurement Method for 13.56 MHz RFID Tags – Application Note 
For engineers working in RFID antenna design and test, this note discusses a non-contact method for measuring resonant frequencies of RFIDs using a network analyzer.

어플리케이션 노트 2014-12-05

PDF PDF 607 KB
i3070 ICT Fixture Electronic Clock Measurement Modules - Technical Overview 
The Keysight clock measurement modules (CMM)for the i3070 in-circuit test application comes with three types of clock signal measurement to meet your different circuit topologies.

기술 개요 2014-11-11

PDF PDF 213 KB
Modifying DDR Libraries for Silicon Nail Test Generation on the Keysight x1149 Boundary Scan Analyzer 
This application note describes how to modify DDR libraries to generate silicon nails tests on the Keysight x1149 Boundary Scan Analyzer.

어플리케이션 노트 2014-08-03

PDF PDF 1.57 MB
Releasing the “Test Sequence” and “Test” to Production on the Keysight x1149 Boundary Scan Analyzer 
This application note describes how to release test sequences and tests to production when using the Keysight x1149 Boundary Scan Analyzer.

어플리케이션 노트 2014-08-03

PDF PDF 5.52 MB
Comparing Boundary Scan Methods White Paper 
The need for reusable tests is driving standalone boundary scan-ICT integration. This article first appeared in the September 2009 issue of Circuits Assembly and is reprinted with kind permission.

기사 2014-07-31

PDF PDF 2.75 MB
오프라인 vs 인라인: 자동 인라인 ICT로 전환 
소형 i1000D ICT 시스템을 이용한 완전 자동 인라인 인-서킷 테스트 전략의 경제성과 다양한 장점에 대해 알아보십시오.

어플리케이션 노트 2014-05-14

i1000D SFP 인서킷 테스트 시스템을 이용한 자동차 퓨즈 박스 테스트 - 어플리케이션 노트 
i1000D SFP(small footprint) 인라인 인-서킷 테스터는 모든 자동차가 원활하게 주행하는 데 없어서는 안 될 핵심 부품인 자동차 내부의 퓨즈박스를 테스트하는 도구입니다.

어플리케이션 노트 2014-03-26

ENA 시리즈 PCB 분석기 - 기술 개요 

기술 개요 2014-02-06

E5063A PCB 분석기로 신뢰할 수 있는 PCB 테스트 스테이션을 구축하십시오 
키사이트 E5063A ENA 시리즈 PCB 분석기는 세 가지 획기적인 개선 사항과 업계에서 가장 저렴한 솔루션으로 더욱 신뢰할 수 있는 PCB 테스트 스테이션을 구축하도록 도와줍니다.

브로셔 2014-02-04

PDF PDF 1.05 MB
High Precision Time Domain Reflectometry - Application Note 
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

어플리케이션 노트 2014-01-23

Impedance and Network Analysis Application List Application Note 
This document provides the information of unique and new solutions for impedance and network analysis with using Keysight impedance analyzers, LCR meters and ENA series network analyzers.

어플리케이션 노트 2012-10-30

Testing DDR Memory; How On-Chip DFT Helps 
This paper discusses DDR memory testing challenges we see today, and how the adoption of DFT capabilities pays off in higher test coverage, better diagnostics and reduced programming/support time.

기사 2012-04-17

PDF PDF 530 KB

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