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Non-Contact Measurement Method for 13.56 MHz RFID Tags – Application Note 
For engineers working in RFID antenna design and test, this note discusses a non-contact method for measuring resonant frequencies of RFIDs using a network analyzer.

應用手冊 2014-12-05

PDF PDF 607 KB
TS-8989 PXI Functional Test System - System Integration Guide - Application Note 
In today’s manufacturing environment, floor space is an increasingly invaluable variable in the cost of test equation.

應用手冊 2014-11-06

PDF PDF 611 KB
Drive Down the Cost of Test Using the ENA Series of Network Analyzers - Application Note 
In this application note, we discuss the contributions of Keysight Technologies, Inc.’s ENA Series of Vector Network Analyzers (ENA, hereafter) to drive down the cost of test in production lines.

應用手冊 2014-10-11

PDF PDF 731 KB
Releasing the “Test Sequence” and “Test” to Production on the Keysight x1149 Boundary Scan Analyzer 
This application note describes how to release test sequences and tests to production when using the Keysight x1149 Boundary Scan Analyzer.

應用手冊 2014-08-03

PDF PDF 5.52 MB
Modifying DDR Libraries for Silicon Nail Test Generation on the Keysight x1149 Boundary Scan Analyzer 
This application note describes how to modify DDR libraries to generate silicon nails tests on the Keysight x1149 Boundary Scan Analyzer.

應用手冊 2014-08-03

PDF PDF 1.57 MB
Comparing Boundary Scan Methods White Paper 
The need for reusable tests is driving standalone boundary scan-ICT integration. This article first appeared in the September 2009 issue of Circuits Assembly and is reprinted with kind permission.

專文 2014-07-31

PDF PDF 2.75 MB
Time Domain Reflectometry Theory - Application Note 
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

應用手冊 2014-07-31

Offline vs Inline: Shifting to automated inline ICT - White Paper  
This paper discusses the benefits of adopting an inline in-circuit test strategy for electronics manufacturers looking to increase product quality and reliability while ensuring optimal ROIC.

應用手冊 2014-05-14

Testing Automotive Fuse Boxes with i1000D SFP In-Circuit Test System - Application Note 
The i1000D small footprint in-circuit tester provides excellent test coverage for automotive fuse boxes, which contain vital connections to a vehicle's various electrical systems.

應用手冊 2014-03-26

High Precision Time Domain Reflectometry - Application Note 
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

應用手冊 2014-01-23

Impedance and Network Analysis Application List Application Note 
This document provides the information of unique and new solutions for impedance and network analysis with using Keysight impedance analyzers, LCR meters and ENA series network analyzers.

應用手冊 2012-10-30

Testing DDR Memory; How On-Chip DFT Helps 
This paper discusses DDR memory testing challenges we see today, and how the adoption of DFT capabilities pays off in higher test coverage, better diagnostics and reduced programming/support time.

專文 2012-04-17

PDF PDF 530 KB
Boundary-Scan Advanced Diagnostic Methods 
This paper illustrates how usage of boundary scan circuit information and predictive analysis of potential assembly faults will provide more precise and accurate diagnostic information.

專文 2012-04-17

PDF PDF 1.20 MB
Using a Network and Impedance Analyzer to Evaluate 13.56 MHz RFID Tags and Readers/Writers 
For engineers who work in RFID antenna design and test, this note discusses testing RFID antenna characteristics such as impedance and resonant-frequency with network and impedance analyzers.

應用手冊 2012-02-08

How to build a fixture for use with the Keysight Cover-Extend Technology 
Cover-Extend Technology is Keysight’s latest limited access solution for in-circuit test. This paper documents the necessary information for a fixture vendor to build a Cover-Extend fixture.

應用手冊 2011-06-24

PDF PDF 1.09 MB
Surviving State Disruptions Caused by Test: the "Lobotomy Problem" 
This paper examines some issues and trends that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing. Published with kind permission of the IEEE

專文 2010-12-10

PDF PDF 402 KB
Principal Component Analysis-Based Compensation for Measurement Errors 
This paper examines some issues and trends that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing. Published with kind permission of the IEEE

專文 2010-12-10

PDF PDF 1.10 MB
Solutions for Undetected Shorts on IEEE 1149.1 Self-Monitoring Pins 
This paper presents the problem of undetected shorts on IEEE 1149.1 compliant self-monitoring pins, and potential mitigating solutions.

專文 2010-12-10

PDF PDF 789 KB
Keysight Silicon Nail 可擴大測試範圍 

基本展示 2010-11-09

 
The Proposed IEEE Test Standards 
There is a resurgence of interest in Boundary Scan and Built in Self Test (BIST) initiatives to be part of IEEE standards. This article explains the IEEE standard and their benefits to the industry. Agilent Boundary Scan, 1149.6, 1149.1, bead probes, cover-extend

專文 2010-10-20

PDF PDF 2.83 MB
Limited Access Tools Improve Test Coverage 
Smaller test pads and shrinking board sizes are posing new challenges, and driving innovations to overcome limited access with new test solutions. Agilent Boundary Scan, 1149.6, 1149.1, bead probes, cover-extend

專文 2010-10-20

PDF PDF 275 KB
Boundary Scan Press Releases 

新聞資料 2010-07-14

 
Medalist VTEP v2.0 Powered, with Cover-Extend technology  
This brochure provides an overview of Cover-Extend under the VTEP v2.0 Powered vectorless test suite

型錄 2010-04-06

PDF PDF 237 KB
Medalist i3070 In Circuit Test – Utilizing the most comprehensive Limited Access 
This article introduces the seven most prominent and effective limited access tools on the Keysight Medalist i3070 ICT, collectively known Super 7 suite.

應用手冊 2009-03-06

PDF PDF 342 KB
High Node Count Fixturing Solutions for Keysight Short-Wire Test Fixtures 
This paper discusses problems encountered in building large, high node count vacuum actuated test fixtures for the Keysight 3070 family of board test systems.

應用手冊 2008-04-30

PDF PDF 67 KB

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