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Education Corner - For Researchers and Educators

When classmates or colleagues work together, they can change the world. That’s our legacy, and it drives our vision: Keysight is dedicated to meaningful collaboration with researchers and educators. In the research lab, our history of innovation continues to enable new breakthroughs in science and technology. In classrooms and teaching labs, our instruments and software offer students experience with the same tools used by our customers in government and industry. When you connect with Keysight, we can help you shine in the lab and the classroom.

Faculty Spotlight highlights innovative university faculty programs’ collaboration with Keysight in their classroom and research. See the latest from Villanova University where Dr. Gang Feng and his students are studying how nanomaterials and their composites can help detect concussions.

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Join Keysight at EuMW 2017 
EuMW 2017 is coming soon

Seminar

 
FieldFox Handheld Analyzers Education Series 
Series of live and on-demand webcasts

Webcast

 
International Microwave Symposium (IMS) 2017 
June 4 - 9, 2017; Honolulu, Hawaii

Tradeshow

 
RF & Microwave Measurement Fundamentals 
This 4-day class studies the principles of microwaves on transmission lines and power measurements, signal sources, mixers and modulation techniques, and the use of signal types in test applications.

Classroom Training

 
How will you Handle the Interference of Things Caused by Medical/IoT Devices? 
Original broadcast June 20, 2017

Webcast - recorded

 
Mastering Signal Integrity & Power Integrity Design Seminar 
Mastering Signal Integrity & Power Integrity Design Seminar

Seminar Materials 2017-08-18

 
Join Keysight Technologies at MWC Americas 2017 
MWC Americas September 12-14, 2017; San Francisco, CA

Tradeshow

 
Understanding RF and Microwave Analysis Basics Webcast 
Live broadcast September 13, 2017; 10am PT / 1pm ET

Webcast - recorded

 
Smart Testing to Limit Your Risk Exposure in Wireless Medical Devices 
Live broadcast August 23, 2017; 10am PET / 1pm ET

Webcast

 
Automating Everyday Test and Measurement Tasks in Minutes 
Live broadcast July 19, 2017; 10am PT / 1pm ET

Webcast

 
Medical Wireless Technology Applications Offer Opportunities and Challenges 
Original broadcast July 18, 2017

Webcast

 
Tutorials in Signal Integrity - Webcast Library  
Upcoming, live webcasts and past, on-demand webcasts.

Webcast

 
USB Type-C Physical Layer Design Webcast 
Live broadcast November 9, 2017; 10am PT / 1pm ET

Webcast - recorded

 
Characterization and Modeling Challenges for Advanced Semiconductor Technologies - Seminar Materials 
Seminar materials from the "Characterization and Modeling Challenges for Advanced Semiconductor Technologies" seminar.

Seminar Materials 2017-08-14

 
Python-driven Table Generation in Automated Device Model Validation 
MQA is a well-known, automated SPICE model validation software that enables engineers to check and analyze SPICE model libraries, compare different models, and generate quality assurance (QA) reports in a complete and efficient way. MQA 2017 extends these capabilities by introducing the Python Report Formatting System (PyRFS) module, which allows engineers to customize tables—either generate new tables or update existing tables—in .csv and .xlsx file formats.

Seminar Materials 2017-08-10

PDF PDF 2.41 MB
Be Prepared for Next Generation MIPI Physical Layer Design and Evaluation Webcast 
Live broadcast August 24, 2017; 10am PT / 1pm ET

Webcast

 
Static Random Access Memory (SRAM) Cell Modeling in MBP 2017 
The latest release Model Builder Program (MBP) 2017 now features a SRAM cell model generation package that’s designed to address the challenges of modern complex SRAM cell modeling, by enabling engineers to extract transistor-level and memory-cell models in one MBP session.

Seminar Materials 2017-08-10

PDF PDF 1.44 MB
What's New in Keysight Technologies' Device Modeling Portfolio 2017 
Highlights of new capabilities in Keysight's end-to-end device modeling portfolio, Power Electronics modeling solution preview, Wafer-level 1/f noise & Random Telegraph Noise (RTN) measurement solutions, Model Builder Program (MBP), and Model Quality Assurance (MQA).

Seminar Materials 2017-08-10

PDF PDF 3.19 MB
Automatable RTN Measurement Using the B1500A Semiconductor Parameter Analyzer 
As device lithographies have continued to shrink, understanding the impact of random telegraph noise (RTN) on integrated circuits has become increasingly important. Due to its innate random nature and dependence on applied voltage, characterizing RTN on a process requires many measurements to be made across a wafer at multiple gate-to-source biases. This section will cover the basics of RTN measurement and outline a cost-effective Keysight solution using WaferPro Express and the B1500A Semiconductor Device Analyzer.

Seminar Materials 2017-08-10

PDF PDF 2.41 MB
How to Extract BSIM4 DC Model 
Model Builder Program(MBP) 2017 improves the model extraction process through the use of special utilities and scripting. This new, improved modeling process will be demonstrated on a BSIM4 transistor.

Seminar Materials 2017-08-10

PDF PDF 955 KB
The New Re-centering Solution in MBP 2017 Update 1 
A preview of the up-coming new re-centering function for re-centering an existing model to a new specification, with fully customizable device targets definition and scaling graph visualization.

Seminar Materials 2017-08-10

PDF PDF 1.39 MB
Keysight EEsof EDA Customer Education and Services 
Brief overview of Keysight EDA Customer Education and Services.

Training Materials 2017-08-08

 
RF and Microwave Measurement Insights 
Hotspots RF English

Seminar

 
Keysight EEsof EDA Training Course Calendar EUROPE 
Scheduled Keysight EEsof courses for EMEAI

Classroom Training

 
HF/Mikro­wellen­-Messungen 
Hotspots RF German main event

Seminar

 

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