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Education Corner - For Researchers and Educators

When classmates or colleagues work together, they can change the world. That’s our legacy, and it drives our vision: Keysight is dedicated to meaningful collaboration with researchers and educators. In the research lab, our history of innovation continues to enable new breakthroughs in science and technology. In classrooms and teaching labs, our instruments and software offer students experience with the same tools used by our customers in government and industry. When you connect with Keysight, we can help you shine in the lab and the classroom.

Faculty Spotlight highlights innovative university faculty programs’ collaboration with Keysight in their classroom and research. See the latest from the University of Leeds where two new Labs showcase high frequency and terahertz electronics research and the National Facility for Innovative Robotic Systems.

Explore YouTube Videos 

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Automating Semiconductor and Power Semiconductor Device Testing Webcast 
Original broadcast June 24, 2015

Webcast - recorded

Fundamentals of Wavelength Dependent Optical Component Testing Webcast 
Original broadcast September 29, 2015

Webcast - recorded

International Symposium for Testing and Failure Analysis (ISTFA 2015) 
Portland, OR; November 3-4, 2015


Modern Remote and Wireless Test Setup and Considerations 
This seminar describes remote/wireless test setups and configurations with LXI compliant instruments with low cost, off the shelf network products. We review local and long distance wireless test, security hurdles and using smart devices and clouds.

Webcast - recorded

Semiconductor Parametric Test: Back to Basics Part 2 
The "Back to Basics Part 2" seminar provides practical tips and techniques on making fast pulse IV measurements and practical capacitance measurement considerations.

Webcast - recorded

Small signal, low level, DC Parametric measurements: Back to Basics Part 1 
The "Back to Basics Part 1" seminar provides practical tips and techniques on making low level DC Parametric measurements.

Webcast - recorded