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Education Corner - For Researchers and Educators

When classmates or colleagues work together, they can change the world. That’s our legacy, and it drives our vision: Keysight is dedicated to meaningful collaboration with researchers and educators. In the research lab, our history of innovation continues to enable new breakthroughs in science and technology. In classrooms and teaching labs, our instruments and software offer students experience with the same tools used by our customers in government and industry. When you connect with Keysight, we can help you shine in the lab and the classroom.

Faculty Spotlight highlights innovative university faculty programs’ collaboration with Keysight in their classroom and research. See the latest from the University of Notre Dame where faculty members and researchers are leading the way for future breakthroughs in the areas of communications, high speed applications, and security.

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Test at Breakneck Speeds with System Power Supplies Webcast 
Live broadcast March 30, 2017; 10am PT / 1pm ET

Webcast

 
Educate Tomorrow’s IoT Engineers Webcast 
Original broadcast March 14, 2017

Webcast - recorded

 
The Applied Power Electronics Conference and Exposition (APEC) 2017 
Tampa, FL; March 27-29, 2017

Tradeshow

 
Fundamentals of IV Measurements Webcast 
Original broadcast February 8, 2017

Webcast - recorded

 
Making Sense of Wireless Sensor Power Consumption Webcast 
Original broadcast January 31, 2017

Webcast - recorded

 
High Sensitivity Current Measurements and Probing Solutions 
Original broadcast January 11, 2017

Webcast - recorded

 
Solving Design and Test Challenges for Medical Devices 
Webcast series

Webcast

 
Using WaferPro Express with B2200A Switch Matrix 
We demonstrate sequencing measurements on packaged devices using a B2200A switch matrix, E5270B source measurement unit and socket test fixture. In this paper, we successfully automated the measurement of 8 BJT devices in a single 24 pin package.

Seminar Materials 2016-12-21

PDF PDF 2.35 MB
DC Power supply fundamentals to get the most out of your applications 
With modern performance and safety features in power supplies, the flexibility exists to create test setups that are simpler and more effective. This web seminar covers 10 fundamentals about your power supply to take advantage of these features.

Webcast - recorded

 
Advanced Material and Device Parametric Characterization Workshop 
Various dates and locations

Seminar

 
Impossible Low-Power Measurements...Made Possible 
Original broadcast October 11, 2016

Webcast - recorded

 
Preserve the Lifeblood of Medical Devices – You've Got the Power! 
Original broadcast September 28, 2016

Webcast - recorded

 
Create a Curve Tracer with BenchVue Webcast 
Original broadcast August 18, 2016

Webcast - recorded

 
Temperature-Dependent Characterization for Device R&D Webcast 
Recorded broadcast April 22, 2016

Webcast - recorded

 
Optimize Wireless Device Battery Run-time: Two Part Webcast Series 
Original roadcasts Aug 22 & Sept 19, 2012

Webcast - recorded

 
Innovations in EDA Webcast: Measurement-based FET modeling using Artificial Neural Networks (ANNs) 
Original broadcast Feb 2, 2012

Webcast - recorded

 
Optimize UE Design for Greater Battery Run-Time 
Original broadcast April 26, 2012

Webcast - recorded

 
Setting Up IC-CAP WaferPro For On-Wafer Measurements 
Original broadcast June 22, 2011

Webcast - recorded

 
Modern Remote and Wireless Test Setup and Considerations 
This seminar describes remote/wireless test setups and configurations with LXI compliant instruments with low cost, off the shelf network products. We review local and long distance wireless test, security hurdles and using smart devices and clouds.

Webcast - recorded

 
Optimise UE design for greater battery run-time 
This web seminar will discuss the challenges of verifying battery consumption during different UE operating modes and the tools available to measure the effects in power consumption.

Webcast - recorded

 
Small signal, low level, DC Parametric measurements: Back to Basics Part 1 
The "Back to Basics Part 1" seminar provides practical tips and techniques on making low level DC Parametric measurements.

Webcast - recorded

 
Semiconductor Parametric Test: Back to Basics Part 2 
The "Back to Basics Part 2" seminar provides practical tips and techniques on making fast pulse IV measurements and practical capacitance measurement considerations.

Webcast - recorded

 
Simulating Power Transients and Noise 
Original broadcast Jun 21, 2012

Webcast - recorded