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Research & University

As the world’s premier measurement company, Keysight works in close collaboration with scientists, researchers and engineers around the globe to meet the communications, electronics, life sciences, and chemical analysis challenges of today and tomorrow.

Keysight supports the scientific process of investigation, discovery, and analysis by providing reliable measurement solutions. We are committed to making an ongoing contribution to academia by

  • stimulating education and research in areas of importance to the next generation of engineers’ future
  • contributing time and expertise to research programs and teaching tools.

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Best practices in implementing boundary scan on limited access boards 
Live broadcast December 18, 2014; 9am PT / 12pm ET

Webcast

 
Boundary Scan for Testing On-Board DDRs Webcast 
Original broadcast October 22, 2013

Webcast - recorded

 
Boundary Scan Webcast Series 
Live and on-demand webcasts

Webcast

 
Common DFT guidelines for implementing boundary scan on limited access boards webcast 
Original broadcast September 11, 2014

Webcast - recorded

 
DesignCon 2014 
Jan 28-31, 2014; Santa Clara Convention Center Download papers presented, order the AEF DVD

Tradeshow

 
Electronic Measurement Events in Europe, Middle East & Africa 
Electronic Measurement events in Europe, the Middle East, and Africa - seminars, trade shows, user group meetings, webcasts, tutorials and conferences.

Seminar

 
Embedded testing of Intel Haswell and Broadwell chipsets on limited access client boards webcast 
Live broadcast November 13, 2014; 9am PT / 12pm ET

Webcast

 
Extending boundary scan tests to improve test coverage of limited access boards webcast 
Live broadcast September 25, 2014; 9am PT / 12pm ET

Webcast

 
Introduction to the Keysight x1149 Boundary Scan Analyzer Webcast 
Original broadcast August 26, 2014; 9am PT / 12pm ET

Webcast - recorded

 
Maximizing test coverage of multiple limited access boards by linking multiple boundary scan chains 
Live broadcast October 9, 2014; 9am PT / 12pm ET

Webcast

 
Testing DDR on limited access boards using boundary scan silicon nails 
Live broadcast October 30, 2014; 9am PT / 12pm ET

Webcast

 
Testing limited access SSD boards with boundary scan and external instruments webcast 
Live broadcast December 4, 2014; 9am PT / 12pm ET

Webcast