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Education Corner - For Researchers and Educators

When classmates or colleagues work together, they can change the world. That’s our legacy, and it drives our vision: Keysight is dedicated to meaningful collaboration with researchers and educators. In the research lab, our history of innovation continues to enable new breakthroughs in science and technology. In classrooms and teaching labs, our instruments and software offer students experience with the same tools used by our customers in government and industry. When you connect with Keysight, we can help you shine in the lab and the classroom.

Faculty Spotlight highlights innovative university faculty programs’ collaboration with Keysight in their classroom and research. See the latest from the University of Notre Dame where faculty members and researchers are leading the way for future breakthroughs in the areas of communications, high speed applications, and security.

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E Pluribus Unum: An Integrated Design Flow for Phased Arrays 
This article shows how a connected suite of standard tools can streamline the design process while enabling trade-offs in RF and digital beam forming performance.

Feature Story 2016-07-20

 
Follow Keysight EEsof EDA on Twitter! 
Twitter enables you to keep current on news and updates with Keysight EEsof through the exchange of quick, frequent answers to one simple question: What are you doing?

Newsletter 2016-07-14

 
ESL Design Notebook Blog 
The blog home of Electronic System-Level Design at Keysight Technologies highlighting applications, news, and opinions from a cross-discipline, system-level approach to design and verification in communications and defense.

Journal 2016-07-14

 
Integrated, Turnkey Modeling and Measurement Systems - Article Reprint 
This article first appeared in the March 2016 edition of Microwave Journal.

Article 2016-07-12

PDF PDF 4.70 MB
Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Newsletter 2016-07-01

 
What is jitter? 
Understand jitter basics and how to measure and then eliminate jitter from your designs.

Article 2016-06-19

 
Jitter Glossary 
Key terms that will help you understand and tackle jitter in your designs.

Article 2016-06-15

 
Solving Mobile Radar Measurement Challenges 
This Microwave Journal article examines an alternative simulation method that allows for better cross-domain modeling in a single framework, to capture the complete effects of modern radar system performance.

Article 2016-06-13

 
Phased array beamforming software design, test, and measurement kit introduced by Keysight 
Military & Aerospace Electronics article introduces the W1720EP phased array radar beamforming kit add-on software simulation personality for the SystemVue 2016.08 design and test and measurement environment.

Article 2016-06-13

 
MWJ Article: Eye on 802.11ax: What It Is and How to Overcome the Design & Test Challenges It Creates 
Wireless access to data has become an everyday necessity for both consumers and enterprises. In the last 30 years alone, unfettered access to information has transformed entire industries, fueling growth, productivity and profits.

Article 2016-05-20

 
University of Notre Dame Strikes a Balance Between Research and Teaching 

Article 2016-05-15

 
Paving The Way For 5G Realization and mmWave Communication Systems – Article Reprint 
This article Paving The Way For 5G Realization and mmWave Communication Systems first appeared in the April 2016 edition of Microwave Journal. Reprinted with kind permission from Microwave Journal.

Article 2016-05-03

PDF PDF 2.90 MB
Signal Integrity Tips and Techniques Using TDR, VNA and Modeling - Article Reprint  
Time and frequency domain analyses for simulation and measurements provide quick solutions for characterizing signal losses and identifying elements that control performance.

Article 2016-03-31

PDF PDF 644 KB
The PDN Bandini Mountain and Other Things I Didn’t Know I Didn’t Know 
"In engineering, it's what you don't know you don't know that can ruin your day and keep you awake at nights." From Bert Simonovich's practical design notes.

Journal 2016-03-30

 
Solving Electronics Design Challenges of an Aerospace System with EDA Tools  
Microwave Product Digest featured article on solving electronics design challenges of an aerospace system using EDA tools.

Article 2016-03-22

 
Practical, Efficient and Safe Power Device Thermal Characterization with B1506A - Article Reprint  
The B1506A has standard solution for power device thermal test and offers fast and safe solution to customers. This white paper reports the actual implementation of thermal test with B1506A.

Article 2016-03-18

PDF PDF 616 KB
Stay ALERT – Don’t Get Hurt 

Article 2016-03-03

 
Benefits of Keysight Bead Probe Technology 
Keysight Bead Probe Technology is a test methodology to help electronics manufacturers regain ICT access on today’s increasingly dense PCBs as well as designs with high-speed circuits.Keysight Bead Probe Technology is a test methodology to help electronics manufacturers regain ICT access on today’s increasingly dense PCBs as well as designs with high-speed circuits.

Article 2016-03-03

 
Phase Locked Loop Noise Transfer Functions - By Peter Delos 
High Frequency Electronics article that describes the derivation of noise transfer functions and some key points for phase locked loop noise analysis is provided along with a simulation and measured example.

Article 2016-02-18

 
Testing a Network Communication PCBA from Prototype to Manufacturing - Article Reprint 
Early implementation of BST can cut test costs and time.

Article 2016-02-17

PDF PDF 178 KB
New IEEE Standards for Board and System Tests - Article Reprint 
This article highlights of changes to IEEE Std 1149.1, IEEE Std 1149.6, IEEE P1149.10 and IEEE P1838.

Article 2016-02-16

PDF PDF 190 KB
The Boundary Scan Toolbox - Article Reprint 
Find out how boundary scan can enable embedded and other value-added test in your toolbox.

Article 2016-02-16

PDF PDF 409 KB
I'm a Board Test Engineer and I'm Loving It! - Article Reprint 
Life on the road can be relentless, but it’s never boring. Find out why from this personal story of a test engineer.

Article 2016-02-12

PDF PDF 178 KB
ABCs of Writing a Custom Boundary Scan Test - Article Reprint 
This article provides sample vectors and code for expanding test coverage with boundary scan.

Article 2016-02-12

PDF PDF 472 KB
Emulating Analog Input Sensors in Automotive Electronics Functional Test - Article Reprint 
This article discusses guidelines for evaluating the digital-analog converters for your automotive electronics functional test needs.

Article 2016-02-09

PDF PDF 318 KB

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