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Education Corner - For Researchers and Educators

When classmates or colleagues work together, they can change the world. That’s our legacy, and it drives our vision: Keysight is dedicated to meaningful collaboration with researchers and educators. In the research lab, our history of innovation continues to enable new breakthroughs in science and technology. In classrooms and teaching labs, our instruments and software offer students experience with the same tools used by our customers in government and industry. When you connect with Keysight, we can help you shine in the lab and the classroom.

Faculty Spotlight highlights innovative university faculty programs’ collaboration with Keysight in their classroom and research. See the latest from Villanova University where Dr. Gang Feng and his students are studying how nanomaterials and their composites can help detect concussions.

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STMicroelectronics & ESEO Use ADS To Design a 2.45 GHz Wireless Power Scavenging Circuit 
Learn how STMicroelectronics and ESEO designed a 2.45 GHz wireless scavenging circuit using Advanced Design System (ADS).

Case Study 2017-06-07

PDF PDF 539 KB
Applying a Very Wide-Bandwidth Millimeter-Wave Testbed to Power Amplifier DPD 
5G designs that use wide-bandwidth digital modulation require new test technologies. Our latest 5G whitepaper presents a testbed for generating and analyzing millimeter-wave signals with 8 GHz bandwidth.

Article 2017-06-06

 
Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Newsletter 2017-06-02

 
Extending the Power of IC-CAP Software with Python—PyVISA Instrument Control 
Learn how to access the full capabilities of PyVISA from IC-CAP 2016 and create transforms for instrument control and data acquisition over any supported interface.

Article 2017-05-31

 
S-parameters: Signal Integrity Analysis in the Blink of an Eye 
This article discusses new concepts for serial link design and analysis as applied to physical layer test and measurement techniques. Novel test fixtures and signal integrity software tools will be discussed in real world applications in the form of design case studies.

Article 2017-05-30

 
Solution Partner Newsletter Q2 2017 
Solution Partner Newsletter Q2 2017

Newsletter 2017-05-26

PDF PDF 969 KB
The Melting Trace Paradox 
Unlike other famous paradoxes such as the Zeno’s paradox, where Achilles and the Tortoise are involved, the melting trace paradox is one with a segment of copper trace and a current source.

Article 2017-05-24

 
Early Design Review or Boundary Scan in Enhancing Testability and Optimazation of Test Strategy 
With complexities of PCB design scaling and manufacturing processes adopting to environmentally friendly practices raise challenges in ensuring structural quality of PCBs.

Article 2017-05-08

PDF PDF 624 KB
SRAM Cell Model Generation and Modeling Efficiency Take Center Stage in New Software Releases 
Accurate and efficient modeling is critical to successful design, especially when it comes to the Static Random Access Memory (SRAM) cell, the minimum geometry devices in integrated circuit technology.

Article 2017-05-04

 
Villanova Professor and Students “Bang Heads” for Nanotechnology Research 
Dr. Gang Feng, Associate Professor in the Department of Mechanical Engineering at Villanova University, is using advanced materials measurement technology to understand concussions, energy storage, and more.

Article 2017-04-21

 
Expanding IEEE Std 1149.1 Boundary-Scan Architecture Beyond Manufacturing Test of PCBA 
This paper will discuss the expanded use of boundary-scan testing beyond the typical manufacturing test to capture structural defects on a components/devices in a Printed Circuit Board Assembly (PCBA)

Article 2017-04-01

PDF PDF 860 KB
STMicroelectronics and University of Lyon Predict EMI Using ADS - Case Study 
Learn how STMicroelectronics and University of Lyon designers used ADS to develop a network parameter block technique to satisfy their need for accurate and general EMI modeling.

Case Study 2017-03-17

PDF PDF 509 KB
Python Programming integration with IC-CAP 
Learn what versions of IC-CAP are supported and see an example of how to get the MOSFET threshold voltage using Python in this blog post.

Article 2017-03-16

 
Internet of Things (IoT) Teaching Solution – IoT Fundamentals 

Article 2017-03-14

 
Internet of Things (IoT) Teaching Solution – IoT Systems Design 

Article 2017-03-14

 
Ensuring High Signal Quality in PCIe Gen3 Channels 
This Signal Integrity Journal article written by Keysight engineer, Anil Kumar Pandey includes the challenges of maintaining transmission channel signal quality in today's PCIe Gen3 Channels.

Article 2017-03-14

 
Keysight Translator for QDART Test 
Keysight Translator software for QDART

Article 2017-03-09

 
Accurate Statistical-Based DDR4 Margin Estimation Using SSN Induced Jitter Model 
This paper proposes a methodology, that improves the accuracy of DDR4 statistical simulation, by using the mask correction factor.

Journal 2017-03-04

 
Heidi Barnes: DesignCon 2017 Engineer of the Year 
EDN Network's Martin Rowe interviews Heidi Barnes, DesignCon 2017 Engineer of the Year.

Article 2017-02-23

 
Why Device Modeling Services? 
IC design stands on the shoulders of device modeling and characterization.

Article 2017-02-03

 
IEEE 802.11™: Wireless LANs 
Through the IEEE-SA, industry, and government support, select IEEE standards are available for download at no charge.

Case Study 2017-02-01

 
Addressing The Challenges Facing IoT Adoption - Article Reprint 
Addressing The Challenges Facing IoT Adoption - Article Reprint

Article 2017-01-23

PDF PDF 2.25 MB
Transconductance Modeling for Low-Power Design 
Raj Sodhi explains how to extract Gm near Vth using Keysight’s Model Builder Program (MBP) in 3 simple steps.

Journal 2017-01-18

 
Device Modeling 101 - What are Ft and Fmax? 
Ft and Fmax are figures of merit used to benchmark the high frequency performance of RF transistors. This blog post describes the equations for these 2 parameters and how to improve the performance of RF transistors.

Journal 2016-12-18

 
Keysight One-Stop Calibration Capabilities – Americas 
View our capabilities for dimensional / optical; electrical – DC, low frequency; electrical – optical; electrical – RF, microwave, millimeter wave; physical / mechanical

Article 2016-12-15

 

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