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Education Corner - For Researchers and Educators

When classmates or colleagues work together, they can change the world. That’s our legacy, and it drives our vision: Keysight is dedicated to meaningful collaboration with researchers and educators. In the research lab, our history of innovation continues to enable new breakthroughs in science and technology. In classrooms and teaching labs, our instruments and software offer students experience with the same tools used by our customers in government and industry. When you connect with Keysight, we can help you shine in the lab and the classroom.

Faculty Spotlight highlights innovative university faculty programs’ collaboration with Keysight in their classroom and research. See the latest from the University of Notre Dame where faculty members and researchers are leading the way for future breakthroughs in the areas of communications, high speed applications, and security.

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Evolution of the Radio Access Network: Fronthaul Test and Monitoring - Application Brief 
Overview of fronthaul test and monitoring solutions from Keysight Technologies for Radio Access Networks (RAN).

Application Note 2017-02-23

PDF PDF 386 KB
Evolution to 5G Massive MIMO: Beamforming Simulation and Measurement - Application Brief 
Overview of new requirements for the development and implementation of massive MIMO technology within the 5G ecosystem, including tools required to simulate, design and test highly complex systems.

Application Note 2017-02-23

PDF PDF 1.06 MB
The Real “Total Cost of Ownership” of Your Test Equipment 
This paper covers a TCO model for electronic T&M equipment and shows how operating costs can be critical drivers in reducing total cost of ownership beyond simply lowering acquisition (capital) costs.

Application Note 2017-02-22

KFM & CSAFM, Environmental Control in Fuel Cell Research for the Automotive Industry - App Note 
Explanation of two AFM modes used in automotive research for fuel cells

Application Note 2017-02-21

PDF PDF 1.75 MB
Fundamentals of PXI Integration  
Easily integrate PXI instruments into your test system

Application Note 2017-02-20

 
Accelerate Your PXI Test Development and Test System Speed - Application Note 
Accelerate Your PXI Test Development and Test System Speed - Application Note

Application Note 2017-02-14

PDF PDF 1.62 MB
Signal Analysis Measurement Fundamentals, Optimize Noise Floor, Resolution Bandwidth, and More 
Learn measurement fundamentals to optimize your signal analysis for greater insights

Application Note 2017-02-13

Electrochemistry 3-Electrode Measurement Workflows for Li-ion Cells and Sensors Using the B2900 SMU 
This application note shows the B2900A is well suited for electrochemical measurements with its capability to source and measure both voltage and current very accurately at 10 fA and 100 nV resolution.

Application Note 2017-02-08

PDF PDF 5.38 MB
IBIS-AMI Modeling and Simulation of Link Systems using Duobinary Signaling 
DesignCon 2017 - In this paper, an extension to the IBIS AMI standard to include duobinary signal modeling and simulation is proposed.

Application Note 2017-01-31

PDF PDF 1.67 MB
IBIS-AMI Modeling of Asynchronous High Speed Link Systems 
DesignCon 2017 - This paper proposes a modified IBIS-AMI model simulation flow for asynchronous link systems.

Application Note 2017-01-31

PDF PDF 1.38 MB
Non-Destructive Analysis and EM Model Tuning of PCB Signal Traces using the Beatty Standard 
DesignCon 2017 - This paper shows how, using a simple resonant test structure like the Beatty standard on a PCB, it is possible to verify the as-manufactured parameters and tune the PCB simulation model.

Application Note 2017-01-31

PDF PDF 6.02 MB
Signal Integrity Analysis and Compliance Test of PCIe Gen3 Serial Channel with IBIS-AMI 
DesignCon 2017 - In this paper, signal integrity analysis and compliance testing of a complete PCIe Gen3 channel with IBIS-AMI models is presented.

Application Note 2017-01-31

PDF PDF 1.52 MB
Accurate Statistical-Based DDR4 Margin Estimation using SSN Induced Jitter Model 
DesignCon 2017 - This paper proposes a methodology, that improves the accuracy of DDR4 statistical simulation, by using a mask correction factor.

Application Note 2017-01-31

PDF PDF 2.10 MB
End-to-End System-Level Simulations with Repeaters for PCIe Gen4: A How-To Guide 
DesignCon 2017 - The paper describes how to quickly and effectively evaluate the end-to-end link performance of a PCI-Express Gen-4 link involving a Root Complex, a Repeater, and an End Point.

Application Note 2017-01-31

PDF PDF 1.51 MB
Characterization of DDR4 Receiver Sensitivity Impact on Post-equalization Eye 
DesignCon 2017 - This paper explores a new approach to analyze channel jitter beyond the traditional eye mask approach.

Application Note 2017-01-31

PDF PDF 1.75 MB
Oscilloscopes in Aerospace/Defense Debugging ARINC 429 Serial Buses - Flyer 
Keysight’s InfiniiVision 3000 X-Series oscilloscopes provide ARINC 429 triggering and decoding, as well as eye-diagram mask test capability to help you debug your ARINC 429 buses faster.

Application Note 2017-01-26

Test and Measurement Instrument Security - Application Note 
This document describes security features and the steps to perform a security erase for select Keysight test and measurement instruments.

Application Note 2017-01-25

PDF PDF 738 KB
Measuring Intermodulation Distortion and RF Interference - App Brief 
Learn about the essential steps for measuring intermodulation distortion and RF interference to ensure you meet spectrum emission standards

Application Note 2017-01-24

Solutions for automotive test 
In-vehicle bus, Power train circuit design, Nano-scale material analysis, etc.

Application Note 2017-01-24

 
Accelerating Spurious Emission Measurements Using Fast-Sweep Techniques - Application Note 
Searching for spurious emissions can be especially difficult and time-consuming. Learn about techniques you can use to optimize and speed your measurements.

Application Note 2017-01-20

Using real-time spectrum analysis to efficiently troubleshoot interference issues -Application Note  
This article describes real-time spectrum analysis (RTSA) as an optional capability for FieldFox handheld RF/uW analyzers, making them especially effective for interference and signal monitoring.

Application Note 2017-01-16

PDF PDF 7.51 MB
Surveying the Best Ways to Test Antennas and Antenna Arrays - Application Note 
This application note provides insights into testing antenna and antenna arrays, and is part 6 in a series of radar application notes.

Application Note 2017-01-09

PDF PDF 2.17 MB
NFC Device Turn-on and Debug - Application Note 
This app note shows how to use an InfiniiVision scope to trigger on NFC communication, demodulate the captured RF waveform, and perform various parametric measurements on the demodulated waveform.

Application Note 2017-01-09

PDF PDF 1.88 MB
NFC-A and -B Sideband Measurements - Application Note 
This app note shows how to use FFT peak search on an InfiniiVision X-Series scope to measure the amplitude (power levels) and frequency of NFC sidebands, subcarrier and carrier.

Application Note 2017-01-09

PDF PDF 2.12 MB
FPGA Implementation of a LUT-Based Digital Pre-Distortion Using M3602A FPGA Design Environment 
This application note demonstrates the implementation of a signal transformation using a lookup table (LUT). This program transforms a sawtooth signal into a sinusoidal.

Application Note 2017-01-05

PDF PDF 3.52 MB

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