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Education Corner - For Researchers and Educators

When classmates or colleagues work together, they can change the world. That’s our legacy, and it drives our vision: Keysight is dedicated to meaningful collaboration with researchers and educators. In the research lab, our history of innovation continues to enable new breakthroughs in science and technology. In classrooms and teaching labs, our instruments and software offer students experience with the same tools used by our customers in government and industry. When you connect with Keysight, we can help you shine in the lab and the classroom.

Faculty Spotlight highlights innovative university faculty programs’ collaboration with Keysight in their classroom and research. See the latest from the University of Notre Dame where faculty members and researchers are leading the way for future breakthroughs in the areas of communications, high speed applications, and security.

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Understanding LTE-Advanced Base Station Transmitter RF Conformance Testing - Application Note 
This application note focuses on LTE-A basestation transmitter testing using the 3GPP RF conformance tests. Examples provided with MXA Signal Analyzer, multi-touch and the LTE-A measurement app.

Application Note 2016-07-19

PDF PDF 4.51 MB
Power Supply Control Loop Response (Bode Plot) Measurements - Application Note 
Unique to Keysight’s portfolio of measurements are frequency response measurements including Control Loop Response (Bode) and can be performed using InfiniiVision X-Series oscilloscopes.

Application Note 2016-07-15

Scanning Microwave Microscopy Solutions for Quantitative Semiconductor Device Characterization 
Discussion of Scanning Microwave combined with Atomic Force Microscopy for calibrated measurements for Semiconductor devices

Application Note 2016-07-15

PDF PDF 3.31 MB
Power Supply Rejection Ratio (PSRR) Measurements - Application Note 
Power Supply Rejection Ratio (PSRR) measurements for power supply characterization, unique to Keysight’s portfolio of measurements, can be performed using InfiniiVision X-Series oscilloscopes.

Application Note 2016-07-15

Maximizing Battery Life of IoT Smart Devices with Keysight Solutions - Application Brief 
This application brief details the design and test challenges involved with maximizing the battery life of Internet of Things (IoT) smart devices, and recommends Keysight solutions to address them.

Application Note 2016-07-14

PDF PDF 732 KB
A Simple Software Solution for Porosity Analysis of Shale Specimens - Application Note 
High throughput shale analysis procedure including high resolution imaging of ion milled shale samples using a compact field emission SEM and a quick software analysis for 2D porosity measurement.

Application Note 2016-07-13

PDF PDF 1.64 MB
Solving Test Challenges for Internet of Things-Enabled Consumer Electronics Devices 
The Internet of Things is a key enabler of the smart home, and brings with it unique challenges for designers and manufacturers. Keysight has a complete portfolio to address the test challenges.

Application Note 2016-06-30

PDF PDF 2.34 MB
Tips for Preventing Damage to Communication Test Set - Application Brief 
Popular Keysight models: E5515A/B/C/T

Application Note 2016-06-29

Simulating FPGA Power Integrity Using S-Parameter Models 
This application note describes how self-impedance (frequency) can easily be determined by simulating the frequency domain self-impedance profile of a Power Distribution Network (PDN).

Application Note 2016-06-28

Jitter: Measurements and Instrument Solutions - Application Note 
This application note discusses jitter measurements at high data rates, issues impacting measurement accuracy, and looks at the instrument choices available for observing and analyzing jitter.

Application Note 2016-06-27

PDF PDF 1.17 MB
CX3300 Series Device Current Waveform Analyzer - Application Note 
This application describes CX3300 enabling you to easily and accurately visualize never before seen true transient current waveform of NVM materials and devices.

Application Note 2016-06-24

Separating and Time-Correlating Deterministic Jitter Components - Application Note 
Contains “tips and tricks” on how to employ real-time oscilloscopes with jitter analysis and high-speed pulse/pattern generators to separate and time-correlate specific deterministic jitter components

Application Note 2016-06-23

PDF PDF 582 KB
Jitter Fundamentals: Sources, Types, and Characteristics - Application Note 
Effectively diminish its effects jitter by understanding the types, causes, component characteristics, and measurement vantage points.

Application Note 2016-06-22

PDF PDF 784 KB
Making Your Best Switch Mode Power Supply Measurements - Application Note 
Oscilloscope power measurement options provide a quick and easy way to analyze the reliability and efficiency of switching power supplies.

Application Note 2016-06-14

Implementing a Flexible Testbed for 5G Waveform Generation and Analysis - Application Note 
This application describes a flexible 5G testbed that includes proven, off-the-shelf software and hardware; and also examines the challenges in design and test of 5G technology.

Application Note 2016-06-14

Solutions for Measuring Permittivity and Permeability w/LCR Meters & Impedance Analyzers 
This application note presents the technologies and methods for measuring permittivity and permeability. The document focuses on impedance measurement technology with the following advantages: Wide frequency range from 20Hz to 1GHz High measurement accuracy Simple preparations (fabrication of material, measurement setup) for measurement.

Application Note 2016-06-12

Discover How the Intuitive Multi-touch UI Streamlines Complex Measurements 
Six application briefs demonstrate the latest techniques using X-Series signal analyzers with multi-touch

Application Note 2016-06-08

 
Kelvin Force Microscopy Using the 9500 AFM - Application Brief 
Discussion on KFM mode using the 9500AFM and QuickScan

Application Note 2016-06-07

PDF PDF 1.75 MB
Understanding RF/Microwave Solid State Switches and their Applications 
This note explains FET, PIN diode and hybrid solid state switches. It discusses benefits/disadvantages of each type of switch, which specifications to consider and why, and gives application examples.

Application Note 2016-06-03

PDF PDF 2.56 MB
Physical Layer Testing of the USB 2.0 Serial Bus - Application Note 
This application note discussed measurement requirements for the USB 2.0 serial bus and how both Keysight’s 6000 X-Series and Infiniium Series oscilloscopes address those challenges.

Application Note 2016-05-27

New Pulse Analysis Techniques for Radar and EW - Application Note 
This app note discusses the best tools for different types of pulse analysis, along with display and analysis techniques for various signals and measurement goals.

Application Note 2016-05-26

Wavelength and Polarization Dependence of 100G-LR4 Components - Application Note 
This application note describes our solution based on the new 81606A or 81608A tunable lasers, for measuring the wavelength and polarization dependence of components for 100G optical links that multiplex multiple wavelengths. Both passive fiber optic components and receiver optical subassemblies are addressed.

Application Note 2016-05-24

PDF PDF 854 KB
Examining the Challenges in Implementing and Testing Massive MIMO for 5G - Application Note 
Get a quick review of the MIMO process, noteworthy challenges in the implementation of MIMO, a summary of challenges & current solutions in the simulation, design, and testing of massive MIMO systems.

Application Note 2016-05-24

PDF PDF 4.22 MB
9500 AFM Applications in Polymer Materials - Application Note 
Application note describing the use of the 9500 AFM in Polymer research

Application Note 2016-05-23

PDF PDF 2.16 MB
Maximizing Dynamic Range on the U8903B Audio Analyzer - Application Note 
Presents a method of maximizing the dynamic range of the U8903B Audio Analyzer for any particular measurement using an external attenuator and the U8903-109 BNC kit.

Application Note 2016-05-20

PDF PDF 1.20 MB

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