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Education Corner - For Researchers and Educators

When classmates or colleagues work together, they can change the world. That’s our legacy, and it drives our vision: Keysight is dedicated to meaningful collaboration with researchers and educators. In the research lab, our history of innovation continues to enable new breakthroughs in science and technology. In classrooms and teaching labs, our instruments and software offer students experience with the same tools used by our customers in government and industry. When you connect with Keysight, we can help you shine in the lab and the classroom.

Faculty Spotlight highlights innovative university faculty programs’ collaboration with Keysight in their classroom and research. See the latest from Villanova University where Dr. Gang Feng and his students are studying how nanomaterials and their composites can help detect concussions.

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Piezoresponse Force Microscopy using Keysight 9500 AFM - Application Note 
PFM has become recognized as a key tool in advancing the research and development of applications based on piezoelectric materials in general. This note shows the capabilities of the 9500 AFM

Application Note 2017-04-18

PDF PDF 1.80 MB
N9041B UXA X-Series Signal Analyzer, Multi-Touch - Application Brief 
This application brief explains the complexity of testing in millimeter wave and how the UXA meets those challenges.

Application Note 2017-04-17

PDF PDF 1.72 MB
eCall/ERA-GLONASS Conformance Testing with Keysight E6950A - Application Note 
This application note discusses how designers can use the Keysight eCall test setup to emulate the various elements of a real eCall environment comprising GPS, automobile, cellular network and PSAP.

Application Note 2017-04-12

PDF PDF 2.89 MB
Fundamentals of PXI Integration - Application Notes 
Easily integrate PXI instruments into your test system

Application Note 2017-04-11

 
Making Conducted and Radiated Emissions Measurements - Application Note 
This application note provides an overview of radiated and conducted emissions measurements as well as a methodology for EMI precompliance testing.

Application Note 2017-04-10

EMI Troubleshooting: The Need for Close Field Probes - Application Note 
This application note introduces close field probes and explains how specific probes offer distinct advantages in electromagnetic compatibility (EMC) radiated emission pre-compliance test.

Application Note 2017-04-03

Understanding the Differences Between Oscilloscopes and Digitizers for Wideband Signal Acquisitions  
This white paper compares the use of oscilloscopes and wideband digitizers for wideband signal applications.

Application Note 2017-03-30

PDF PDF 6.16 MB
Automotive FMCW Radar System Design using 3D Framework for Scenario Modeling 
Automotive Radar Architects can take advantage of Keysight SystemVue’s 3D simulation framework, radar reference designs, and links to MATLAB and T&M equipment to model FMCW radar system scenarios.

Application Note 2017-03-28

M901x PXIe Chassis Power Calculator 
Allows you to enter ambient air temperature, altitude, AC supply voltage, etc. and calculates the total power available to the chassis modules

Analysis Tool 2017-03-27

Simplifying the Economics of Test and Repair in Both the Factory and Depot - White Paper 
This paper explores how to calculate the cost-of-test.

Application Note 2017-03-24

PDF PDF 606 KB
ATE System Level Calibration and Its Impact on Cost, Quality and Schedule - White Paper 
This paper proposes an alternative method to provide system level specification and system measurement calibration which will extend the system’s ability to be used for multiple products.

Application Note 2017-03-20

PDF PDF 651 KB
System Cabling Errors and DC Voltage Measurement Errors in Digital Multimeters (AN 1389-1) 
This application note is one in a series of three, that will help you eliminate potential measurement errors and achieve the greatest accuracy with a DMM. This application note covers system cabling errors and dc voltage measurement errors and more.

Application Note 2017-03-14

Declassification of the M924XA Modular Oscilloscopes - White Paper 
Product declassification and security for M9241A, M9242A, M9243A.

Application Note 2017-03-14

PDF PDF 630 KB
Comprehensive Atomic Force Microscopy with Keysight 9500 Scanning Probe Microscope - App Note 
An AFM study of polymers under various environments using AM & Quick Sense Modes. Optimizing the tip torce for characterization of top layer and sub-surface layers.

Application Note 2017-03-09

PDF PDF 6.24 MB
Atomic Force Microscopy of Heterogeneous Materials in Different Environments - Application Note 
A study of polymers under different environments using the 9500

Application Note 2017-03-09

PDF PDF 5.29 MB
Nanomechanical Studies in Atomic Force Microscopy - Application Note 
Study of the 9500 AFM using Quick Sense to achieve nanomechanical properties of various materials

Application Note 2017-03-09

PDF PDF 4.15 MB
Photodiode Test Using the Keysight B2980A Series - Application Note 
This application note explains how easy and accurately it is to make a photodiode test using the B2980A Series.

Application Note 2017-03-09

Resistance; DC Current; AC Current; and Frequency and Period Measurement Errors in DMMs 
This application note is the second in a series of three, that will help you eliminate potential measurement errors and achieve the greatest accuracy with a DMM. This application note covers resistance, dc current, ac current, and frequency and period measurement errors. . For an overview of system cabling errors and dc voltage measurement errors, see Application Note 1389-1. For a discussion of ac voltage measurement errors, see Application Note 1389-3.

Application Note 2017-03-09

Basics of Measuring the Dielectric Properties of Materials - Application Note 
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.

Application Note 2017-03-07

Service Locations 
Find service centers around the world.

Application Note 2017-03-06

 
Precise Current Measurements of MCU Power-Saving Mode Transition using the CX3300 
The CX3300 enables you to easily and accurately visualize wide-band and low-level current waveforms of the MCU power-saving mode transition.

Application Note 2017-03-03

Accurate Current Waveform Measurements of Non Volatile Memory Devices using the CX3300 
This application describes CX3300 enabling you to easily and accurately visualize never before seen true transient current waveform of NVM materials and devices.

Application Note 2017-03-03

Precise Current Profile Measurements of Bluetooth® Low Energy Devices using the CX3300  
The CX3300 enables you to precisely visualize wide-band and low-level current waveforms and make quantitative evaluations of current waveforms, while reducing the power consumption of BLE devices.

Application Note 2017-03-03

The CX3300 Unveils Current Waveform Never Seen by Conventional Current Probes - Application Brief 
This application describes that the CX3300A can more clearly and precisely visualize current waveform measurements in comparison with a current probe.

Application Note 2017-03-03

x1149 Boundary Scan Solution for Blade Server Board - Application Note 
This application note describes in detail what the Keysight x1149 Boundary Scan Analyzer performs during the Integrity test.

Application Note 2017-03-02

PDF PDF 6.17 MB

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