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Education Corner - For Researchers and Educators

When classmates or colleagues work together, they can change the world. That’s our legacy, and it drives our vision: Keysight is dedicated to meaningful collaboration with researchers and educators. In the research lab, our history of innovation continues to enable new breakthroughs in science and technology. In classrooms and teaching labs, our instruments and software offer students experience with the same tools used by our customers in government and industry. When you connect with Keysight, we can help you shine in the lab and the classroom.

Faculty Spotlight highlights innovative university faculty programs’ collaboration with Keysight in their classroom and research. See the latest from Villanova University where Dr. Gang Feng and his students are studying how nanomaterials and their composites can help detect concussions.

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Make Better AC RMS Measurements with Your Digital Multimeter - Application Note  
learn about the complexity of ac rms measurements and how to deal with them

Application Note 2017-06-12

Resistance Measurements Using the B2900A Series of SMUs - Application Note 
The Keysight B2900A Series Precision SMU enables you to accurately and easily measure the resistance with a variety of features to address the issues on resistance measurements.

Application Note 2017-06-05

U2000 and U8480 Series USB sensor measurement uncertainty calculator 
Measurement Uncertainty Calculator for the U2000 series USB sensors (U2000A, U2001A, U2002A, U2004A, U2000B, U2000H, U2001B, U2001H, U2002H) and U8480 series USB sensors (U8481A, U8485A, U8487A, U8488A)

Application Note 2017-05-25

XLS XLS 100 KB
Three Hints for Better Noise Figure Measurements - Application Brief 
This brief provides 3 hints that will help you improve measurement uncertainty, increase yield, and lower your costs when measuring noise figure performance on your device.

Application Note 2017-05-16

Noise and Noise Figure: Improving and Simplifying Measurements - Application Brief 
Noise is present in every electronic circuit. Noise disturbances can limit the overall performance of a wireless system, making noise measurements fundamental for all transmitter/receiver components.

Application Note 2017-05-16

PDF PDF 1021 KB
Achieving Metrology-grade Results in Vector Network Analysis at Millimeter-wave Frequencies  
Millimeter-wave expertise and new solution for design, simulation, test and analysis in millimeter wave frequencies.

Application Note 2017-05-12

Easily Test DC-DC Converters Using the Keysight DC Power Analyzer - Application Note 
This application note explains how to easily carry out DC-DC converter testing using the N6705C DC Power Analyzer and MSOX2/3/4000 Series Oscilloscope and BenchVue software.

Application Note 2017-05-02

PDF PDF 1.03 MB
Basic Oscilloscope Fundamentals - Application Note 
This application note provides an overview of basic oscilloscope fundamentals. You will learn what an oscilloscope is and how to use oscilloscopes.

Application Note 2017-04-25

N9041B UXA X-Series Signal Analyzer, Multi-Touch - Application Brief 
This application brief explains the complexity of testing in millimeter wave and how the UXA meets those challenges.

Application Note 2017-04-17

PDF PDF 1.72 MB
Making Conducted and Radiated Emissions Measurements - Application Note 
This application note provides an overview of radiated and conducted emissions measurements as well as a methodology for EMI precompliance testing.

Application Note 2017-04-10

EMI Troubleshooting: The Need for Close Field Probes - Application Note 
This application note introduces close field probes and explains how specific probes offer distinct advantages in electromagnetic compatibility (EMC) radiated emission pre-compliance test.

Application Note 2017-04-03

Understanding the Differences Between Oscilloscopes and Digitizers for Wideband Signal Acquisitions  
This white paper compares the use of oscilloscopes and wideband digitizers for wideband signal applications.

Application Note 2017-03-30

PDF PDF 6.16 MB
System Cabling Errors and DC Voltage Measurement Errors in Digital Multimeters (AN 1389-1) 
This application note is one in a series of three, that will help you eliminate potential measurement errors and achieve the greatest accuracy with a DMM. This application note covers system cabling errors and dc voltage measurement errors and more.

Application Note 2017-03-14

Photodiode Test Using the Keysight B2980A Series - Application Note 
This application note explains how easy and accurately it is to make a photodiode test using the B2980A Series.

Application Note 2017-03-09

Resistance; DC Current; AC Current; and Frequency and Period Measurement Errors in DMMs 
This application note is the second in a series of three, that will help you eliminate potential measurement errors and achieve the greatest accuracy with a DMM. This application note covers resistance, dc current, ac current, and frequency and period measurement errors. . For an overview of system cabling errors and dc voltage measurement errors, see Application Note 1389-1. For a discussion of ac voltage measurement errors, see Application Note 1389-3.

Application Note 2017-03-09

Basics of Measuring the Dielectric Properties of Materials - Application Note 
The dielectric properties that will be discussed here are permittivity and permeability. Resistivity is another material property which will not be discussed here.

Application Note 2017-03-07

Precise Current Measurements of MCU Power-Saving Mode Transition using the CX3300 
The CX3300 enables you to easily and accurately visualize wide-band and low-level current waveforms of the MCU power-saving mode transition.

Application Note 2017-03-03

Accurate Current Waveform Measurements of Non Volatile Memory Devices using the CX3300 
This application describes CX3300 enabling you to easily and accurately visualize never before seen true transient current waveform of NVM materials and devices.

Application Note 2017-03-03

The CX3300 Unveils Current Waveform Never Seen by Conventional Current Probes - Application Brief 
This application describes that the CX3300A can more clearly and precisely visualize current waveform measurements in comparison with a current probe.

Application Note 2017-03-03

Precise Current Profile Measurements of Bluetooth® Low Energy Devices using the CX3300  
The CX3300 enables you to precisely visualize wide-band and low-level current waveforms and make quantitative evaluations of current waveforms, while reducing the power consumption of BLE devices.

Application Note 2017-03-03

Method of Implementation (MOI) for USB Type-C Cable/Adapter Assembly High Speed Compliance Test 
Keysight Method of Implementation (MOI) for USB Type-C to Type-C Cable, Type-C to Legacy Cable, Type-C to Legacy Adapter Assembly High Speed Compliance Test Using Keysight M937xA PXIe Multiport VNA

Application Note 2017-02-24

PDF PDF 4.66 MB
Method of Implementation (MOI) for USB Type-C Cable Assembly Low Speed Compliance Test 
Keysight Method of Implementation (MOI) for USB Type-C to Type-C Cable Assembly Low Speed Compliance Test Using Keysight M937xA PXIe Multiport VNA

Application Note 2017-02-24

PDF PDF 2.91 MB
7 Hints for Precise Current Measurements with the CX3300 Series Device Current Waveform Analyzer 
This application note explains 7 hints that can be undertaken in order to obtain more favorable current measurement with the CX3300.

Application Note 2017-02-21

Signal Analysis Measurement Fundamentals, Optimize Noise Floor, Resolution Bandwidth, and More 
Learn measurement fundamentals to optimize your signal analysis for greater insights

Application Note 2017-02-13

Electrochemistry 3-Electrode Measurement Workflows for Li-ion Cells and Sensors Using the B2900 SMU 
This application note shows the B2900A is well suited for electrochemical measurements with its capability to source and measure both voltage and current very accurately at 10 fA and 100 nV resolution.

Application Note 2017-02-08

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