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基本入門與量測基礎

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E4416A/E4417A EPM-P Series Power Meters and E-Series E9320 Peak and Average Power Sensors 
This data sheet covers the specifications for the E4416A/E4417A EPM-P series power meters and the E-series E9320 peak and average power sensors.

產品型錄 2014-11-25

Peak Power Solutions Brochure for Radar and Wireless Applications - Brochure  
This peak power solutions brochure cover various radar & wireless applications. Get a summary of applications in this brochure and learn where to download the application note and videos accordingly.

型錄 2014-10-30

PDF PDF 3.92 MB
Evaluation of the Performance of a State-of-the-Art Digital Multimeter - White Paper 
Describes several methods used to verify the performance of a very accurate automatically calibrated DMM, the HP 3458A.

應用手冊 2014-10-02

PDF PDF 963 KB
Uncertainty Propagation for Measurements with Multiple Output Quantities 
Measurements with multiple output quantities exist in many disciplines. This paper discusses using matrix notation, which can be applied to a practical measurement uncertainty example involving complex quantities.

分析工具 2014-08-20

Understanding Measurement Risk - White Paper 
An intuitive explanation of probability density functions drawing on Monte Carlo simulation to demonstrate the relationship between a device's true values and corresponding measured value.

應用手冊 2014-08-12

PDF PDF 735 KB
Language of Specifications - White Paper 
This paper explains some of the arcane language used in describing a product's characteristics.

應用手冊 2014-08-03

PDF PDF 1.08 MB
Paperless Calibration - White Paper 
Discusses the benefits of storing calibration records electronically rather than on paper in filing cabinets and explains why having a hard copy of these files is not necessary.

應用手冊 2014-08-02

PDF PDF 215 KB
Specifications Guidelines - White Paper 
Keysight Technologies has definitions for its Test & Measurement product specifications and how they are presented. The following material is extracted from these manufacturing recommendations.

應用手冊 2014-08-02

PDF PDF 366 KB
Fundamentals of RF and Microwave Power Measurements (Part 3) (AN 1449-3) 
Power Measurement Uncertainty per International Guides AN 1449-3, literature number 5988-9215EN

應用手冊 2014-08-01

Uncertainty Analysis for Uncorrelated Input Quantities - White Paper 
The Guide to the Expression of Uncertainty in Measurement (GUM) has been widely adopted in the different fields of the industry and science. Learn how to use for uncorrelated input quantities.

應用手冊 2014-08-01

PDF PDF 1.64 MB
8 Hints for Making Better Measurements Using Analog RF Signal Generators - Application Note 
This guide helps you improve the accuracy of your measurements that involve using RF analog signal sources.

應用手冊 2014-07-31

談校正的六個構面 - 白皮書 
為了說明這些差異,並協助非技術專精的採購人員瞭解箇中的重要性,我特別將這些差異分為六個構面來解說,每一項對校正的有效性或對購買校正服務之企業的直接或間接成本都有影響。

應用手冊 2014-03-07

Spectrum Analysis Basics - Application Note 
This application note (also known as AN 150) explains the fundamentals of swept-tuned, superheterodyne spectrum analyzers and discusses the latest advances in spectrum analyzer capabilities.

應用手冊 2014-02-25

Calibration and Specification Considerations When Using Modular Instrumentation - Application Note 
Modular instruments such as PXI and AXIe offer significant configuration flexibility, interchangeability, speed, and size advantages but also present unique calibration challenges. This paper examines these issues in detail and considers both in situ calibration and calibration performed outside the use environment.

應用手冊 2013-11-01

PDF PDF 312 KB
Problem with Subtype Learning When Used with the Connector Algorithm in R7.0 
5DX Technical Paper - Problem with Subtype Learning When Used with the Connector Algorithm in R7.0

應用手冊 2013-10-29

PDF PDF 16 KB
How Senior Managers Perceive the Importance of Calibration - White Paper 
This paper, presented at the National Conference of Standards Laboratories International July 2013, discusses the importance of measurement accuracy and the financial impact it can have on the bottom line.

應用手冊 2013-07-01

PDF PDF 1.78 MB
Setting and Adjusting Instrument Calibration Intervals - Application Note 
This document explains how Keysight determines the recommended calibration interval, and why and how this can be extended or reduced.

應用手冊 2013-06-11

經認可的 ISO 17025 校驗據點 
是德在執行校驗時所進行的所有量測,都是在相關認證機構核可的範圍內執行。

型錄 2013-01-21

 
Calibration of Time Base Oscillators - White Paper  
As more accurate clocks were produced, new uses of time measurement were explored. As new uses were discovered, the need for even more accurate clocks became apparent.

應用手冊 2012-12-21

PDF PDF 438 KB
Crystal Oscillator Testing - White Paper 
A policy concerning the testing of the reference oscillators contained within many instruments has been defined and adopted in Keysight's service centers worldwide.

應用手冊 2012-12-21

PDF PDF 1.41 MB
Selecting a Calibration Vendor - White Paper 
Cost is important but are there any other questions that need to be asked in selecting a calibration supplier?

應用手冊 2012-12-11

PDF PDF 1.38 MB
Using a Manufacturer's Specification as a Type B Error Contribution - White Paper 
Examines the implications of using a manufacturer's specification in an uncertainty analysis; and how calibration laboratories use uncertainty data in their quality systems and customer-facing documents.

應用手冊 2012-12-10

PDF PDF 1.13 MB
Understanding the Fundamental Principles of Vector Network Analysis - Application Note 1287-1 
This application note explores the fundamental principles of vector network analysis. The discussion includes the common parameters (S-parameters). RF fundamentals such as transmission lines and the Smith chart will also be reviewed.

應用手冊 2012-12-07

Spectrum Analyzer CW Power Measurements and the Effects of Noise - Article 
This paper examines how to configure a spectrum analyzer to measure a low-power continuous wave (CW) signal so that the trade-off between measurement time and accuracy is optimized.

專文 2012-12-01

PDF PDF 386 KB
Instrument Design Validation and Recommended Calibration Policy - White Paper 
Provides background information on the test philosophies and methods used when developing instrument verification and adjustment procedures.

應用手冊 2012-11-08

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