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Fundamentals of RF and Microwave Noise Figure Measurements - Application Note 
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.

應用手冊 2017-09-06

信號分析量測基礎原理、雜訊底線、解析頻寬等最佳化 
對射頻工程師來說,頻譜分析儀或信號分析儀是一種基本又不可或缺的量測工具,使用於產品生命週期的所有階段。效能、 準確度和速度等主要特性,可協助研發工程師提升設計品質,並有助於製造工程師提高測試效率和產品品質。本說明提供了各種技術,可幫助您輕鬆駕馭應用程式的主信號分析。

應用手冊 2017-02-13

Spectrum Analysis Basics - Application Note 
This application note (also known as AN 150) explains the fundamentals of swept-tuned, superheterodyne spectrum analyzers and discusses the latest advances in spectrum analyzer capabilities.

應用手冊 2016-11-02

認識向量網路分析的基本原理 - 應用說明 
本應用說明將回顧向量網路分析的基本原理,討論的內容包括可量測的通用參數,並解釋散射參數(S 參數)的概念。本文並探討一些射頻基本知識,如傳輸線和史密斯圖(Smith Chart)。

應用手冊 2015-06-09

Making Accurate Intermodulation Distortion Measurements with the PNA-X (1408-17) – Application Note 
This application note describes accuracy considerations when using the Keysight PNA-X microwave network analyzer for two-tone intermodulation distortion measurements.

應用手冊 2012-03-05

Optimizing Dynamic Range for Distortion Measurements 
This Product Note covers high dynamic range measurement techniques for the new PSA Performance Spectrum Analyzer Series. The Note describes the best way to use the PSA series to make distortion measurements such as ACP, intermodulation, and harmonic distortion.

應用手冊 2011-10-27

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Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not 
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

應用手冊 2008-10-15

Best of 8 Hints for Making Better Oscilloscopes Measurements  
Keysight engineers sharing ideas of how to use the equipment they design

應用手冊 2008-03-17

PDF PDF 320 KB
PNA - Pulsed-RF S-Parameter Measurements Using Wideband and Narrowband Detection (AN 1408-12) 

應用手冊 2007-11-28

Measuring Power-Added Efficiency (PAE) with PNA Network Analyzers (1408-16) – Application Note 

應用手冊 2007-10-09

Using the VISA COM I/O API in .NET - Application Note 
The Microsoft .NET architecture has many features that make it an excellent environment for Test & Measurement programmers. VISA COM I/O is an update of the older VISA C API to work in and with COM technology.

應用手冊 2007-03-16

PDF PDF 345 KB
Bluetooth® RF Measurement Fundamentals - Application Note 
Bluetooth® is an open specification for a wireless personal area network. It provides limited range RF connectivity for voice and data transmissions between information appliances.

應用手冊 2006-10-12

Comparison of Different Jitter Analysis Techniques With a Precision Transmitter - Application Note 
This white paper describes how various jitter analysis techniques give dissimilar results. Which is right? We built a precision jitter transmitter to compare results of different techniques where test sets were exposed to known levels of jitter.

應用手冊 2006-04-06

PDF PDF 169 KB
PNA - Amplifier - High-Power Testing (1408-10) 

應用手冊 2005-09-28

Validating Transceiver FPGAs Using Advanced Calibration Techniques 

應用手冊 2005-04-27

Using LAN in Test Systems: Applications (1465-14) - Application Note and Example Programs 
Topics include balancing cost, convenience and security in three common LAN scenarios: sharing instruments, remote monitoring and data acquisition, and functional test systems. Includes downloadable example programs.

應用手冊 2005-04-01

 
Using LAN in Test Systems: Setting up System I/O (AN 1465-15) - Application Note 
This set of application notes shows you how to simplify test system integration by utilizing open connectivity standards such as local area networking (LAN). The collective goal of these notes is to help you produce reliable results, meet your throughput requirements and stay within your budget.

應用手冊 2005-03-29

PDF PDF 263 KB
Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note 
This application note answers common questions about the use of drivers and direct I/O to send commands from a PC application to the test instrument.

應用手冊 2004-12-21

PDF PDF 374 KB
Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note 
Using SCPI and Direct I/O vs. Drivers, the fifth note in the series, outlines the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems

應用手冊 2004-12-13

PDF PDF 408 KB
Test-System Computer I/O Considerations (AN 1465-2) - Application Note 
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing

應用手冊 2004-12-09

PDF PDF 189 KB
Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note 
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today for connecting modern instrumentation to computers are GPIB, LAN, and USB.

應用手冊 2004-11-19

PDF PDF 194 KB
System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note 
Using LAN in Test Systems: PC Configuration,the third note in the series, describes the additional capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.

應用手冊 2004-10-19

PDF PDF 204 KB
Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note 
The decision to use LAN in a test system delivers important benefits to your company and your team. From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking

應用手冊 2004-09-14

Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note 
The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.

應用手冊 2004-07-29

PDF PDF 270 KB
測試系統開發指南:選擇您的測試系統軟體結構 

應用手冊 2004-05-07

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