Here’s the page we think you wanted. See search results instead:

 

Contact an Expert

Basics & Measurement Fundamentals

Refine the List

remove all refinements

By Industry/Technology

By Type of Content

By Product Category

26-50 of 269

Sort:
Business Considerations of Equipment Refresh in a Calibration Laboratory - White Paper 
Calibration laboratories operate in a world of constant change, and this is never more evident than in the products that are requested to be calibrated.

Application Note 2015-04-21

Calibration of Time Base Oscillators - White Paper  
As more accurate clocks were produced, new uses of time measurement were explored. As new uses were discovered, the need for even more accurate clocks became apparent.

Application Note 2015-04-13

PDF PDF 250 KB
Assurance of Calibration Results: Applying the Power of Visual Information to Improve Quality 
White paper on how Keysight maintains the ongoing reliability and validity of our calibration processes to help you mitigate the risks inherent in your measurements by using control charts.

Application Note 2014-12-15

PDF PDF 267 KB
Understanding Measurement Risk - White Paper 
An intuitive explanation of probability density functions drawing on Monte Carlo simulation to demonstrate the relationship between a device's true values and corresponding measured value.

Application Note 2014-08-12

PDF PDF 735 KB
Fundamentals of RF and Microwave Power Measurements (Part 3) (AN 1449-3) 
Power Measurement Uncertainty per International Guides AN 1449-3, literature number 5988-9215EN

Application Note 2014-08-01

Choosing the Test System Software Architecture - Application Note 
This application note is designed to help you quickly design a test system that produces reliable results and meets throughput requirements within budget. It explores the entire software development process, from gathering and documenting software requirements through design reuse considerations.

Application Note 2014-07-31

8 Hints for Making Better Measurements Using Analog RF Signal Generators - Application Note 
This guide helps you improve the accuracy of your measurements that involve using RF analog signal sources.

Application Note 2014-07-31

Calibration and Specification Considerations When Using Modular Instrumentation - Application Note 
Modular instruments such as PXI and AXIe offer significant configuration flexibility, interchangeability, speed, and size advantages but also present unique calibration challenges. This paper examines these issues in detail and considers both in situ calibration and calibration performed outside the use environment.

Application Note 2013-11-01

PDF PDF 312 KB
Problem with Subtype Learning When Used with the Connector Algorithm in R7.0 
5DX Technical Paper - Problem with Subtype Learning When Used with the Connector Algorithm in R7.0

Application Note 2013-10-29

PDF PDF 16 KB
How Senior Managers Perceive the Importance of Calibration - White Paper 
This paper, presented at the National Conference of Standards Laboratories International July 2013, discusses the importance of measurement accuracy and the financial impact it can have on the bottom line.

Application Note 2013-07-01

PDF PDF 1.78 MB
8 Hints for Making Better Measurements Using RF Signal Generators Application Note 
This application provides 8 hints for improving the accuracy of your measurements using RF signal generators.

Application Note 2012-06-27

PDF PDF 1.35 MB
Calibration of Precision Step Attenuators - White Paper 
Automated parallel IF substitution system for precision attenuator calibration which has been in use for over 15 years and presents results of tests made on some very accurate attenuators.

Application Note 2012-05-07

PDF PDF 760 KB
Making Accurate Intermodulation Distortion Measurements with the PNA-X (1408-17) – Application Note 
This application note describes accuracy considerations when using the Keysight PNA-X microwave network analyzer for two-tone intermodulation distortion measurements.

Application Note 2012-03-05

Optimizing Dynamic Range for Distortion Measurements 
This Product Note covers high dynamic range measurement techniques for the new PSA Performance Spectrum Analyzer Series. The Note describes the best way to use the PSA series to make distortion measurements such as ACP, intermodulation, and harmonic distortion.

Application Note 2011-10-27

PDF PDF
Specifying Calibration Standards and Kits for Keysight Vector Network Analyzers (AN 1287-11) 
This paper discusses calibration standard definitions, calibration kit content, and its structure requirements for Keysight's vector network analyzers. Also provided are set up examples and how to modify an existing calibration kit definition file.

Application Note 2011-03-28

Setting and Using Specifications – An Overview, by Michael Dobbert 
This white paper presents techniques to set specifications and describes how metrologists use specifications in calibration.

Application Note 2010-09-01

Fundamentals of RF and Microwave Noise Figure Measurements - Application Note 
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.

Application Note 2010-08-05

Improved Throughput in Network Analyzer Applications (AN 1287-5) 
This Application Note explores a variety of throughput issues and how they might affect different applications. It suggests ways to improve network analyzer performance for better throughput in specific situations, and how to get an accurate picture of how an analyzer's performance might impact...

Application Note 2010-03-15

Pragmatic Method for Pass/Fail Conformance Reporting that Complies by Michael Dobbert & Robert Stern 
Innovative approach to simultaneously meet (ISO 17025, ILAC-G8, Z540.3)

Application Note 2010-03-01

PDF PDF 350 KB
PNA - Banded Millimeter-Wave Measurements (AN 1408-15) 
Contains banded millimeter-wave system configurations, system operation, system calibration, and typical measurement examples.

Application Note 2009-11-24

8 Hints for Making Better Spectrum Analyzer Measurements (AN 1286-1) - Application Note 
This application note provides eight pertinent hints for making better spectrum analyzer measurements such as measuring low level signals and indentifying internal distortion products.

Application Note 2009-09-07

Fundamentals of RF and Microwave Power Measurements (AN 1449) - Application Note 
Keysight's Fundamentals of RF and Microwave Power Measurements, application note (AN 1449-1/2/3/4).

Application Note 2009-06-05

 
Test and Measurement Instrument Security - Application Note 
This document describes security features and the steps to perform a security erase for select Keysight test and measurement instruments.

Application Note 2009-04-14

PDF PDF 290 KB
Enhanced Log Records for the Keysight Medalist In-Circuit Test System 
Track changes made to your i3070 test programs to improve success.

Application Note 2009-03-04

PDF PDF 801 KB
Diagnostic Testing and the Medalist 5DX Automated X-ray Inspection System 
Users of the Medalist 5DX automated x-ray inspection system can benefit from running diagnostic tests on a regular basis. This application note provides some guidelines.

Application Note 2009-01-14

PDF PDF 188 KB

Previous 1 2 3 4 5 6 7 8 9 10 ... Next