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Basics & Measurement Fundamentals

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51-75 of 288

8 Hints for Making Better Measurements Using Analog RF Signal Generators - Application Note 
This guide helps you improve the accuracy of your measurements that involve using RF analog signal sources.

Application Note 2014-07-31

Calibration and Specification Considerations When Using Modular Instrumentation - Application Note 
Modular instruments such as PXI and AXIe offer significant configuration flexibility, interchangeability, speed, and size advantages but also present unique calibration challenges. This paper examines these issues in detail and considers both in situ calibration and calibration performed outside the use environment.

Application Note 2013-11-01

Problem with Subtype Learning When Used with the Connector Algorithm in R7.0 
5DX Technical Paper - Problem with Subtype Learning When Used with the Connector Algorithm in R7.0

Application Note 2013-10-29

How Senior Managers Perceive the Importance of Calibration - White Paper 
This paper, presented at the National Conference of Standards Laboratories International July 2013, discusses the importance of measurement accuracy and the financial impact it can have on the bottom line.

Application Note 2013-07-01

8 Hints for Making Better Measurements Using RF Signal Generators Application Note 
This application provides 8 hints for improving the accuracy of your measurements using RF signal generators.

Application Note 2012-06-27

Calibration of Precision Step Attenuators - White Paper 
Automated parallel IF substitution system for precision attenuator calibration which has been in use for over 15 years and presents results of tests made on some very accurate attenuators.

Application Note 2012-05-07

Making Accurate Intermodulation Distortion Measurements with the PNA-X (1408-17) – Application Note 
This application note describes accuracy considerations when using the Keysight PNA-X microwave network analyzer for two-tone intermodulation distortion measurements.

Application Note 2012-03-05

Optimizing Dynamic Range for Distortion Measurements 
This Product Note covers high dynamic range measurement techniques for the new PSA Performance Spectrum Analyzer Series. The Note describes the best way to use the PSA series to make distortion measurements such as ACP, intermodulation, and harmonic distortion.

Application Note 2011-10-27

Specifying Calibration Standards and Kits for Keysight Vector Network Analyzers (AN 1287-11) 
This paper discusses calibration standard definitions, calibration kit content, and its structure requirements for Keysight's vector network analyzers. Also provided are set up examples and how to modify an existing calibration kit definition file.

Application Note 2011-03-28

Setting and Using Specifications – An Overview, by Michael Dobbert 
This white paper presents techniques to set specifications and describes how metrologists use specifications in calibration.

Application Note 2010-09-01

Fundamentals of RF and Microwave Noise Figure Measurements - Application Note 
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.

Application Note 2010-08-05

Improved Throughput in Network Analyzer Applications (AN 1287-5) 
This Application Note explores a variety of throughput issues and how they might affect different applications. It suggests ways to improve network analyzer performance for better throughput in specific situations, and how to get an accurate picture of how an analyzer's performance might impact...

Application Note 2010-03-15

Pragmatic Method for Pass/Fail Conformance Reporting that Complies by Michael Dobbert & Robert Stern 
Innovative approach to simultaneously meet (ISO 17025, ILAC-G8, Z540.3)

Application Note 2010-03-01

PNA - Banded Millimeter-Wave Measurements (AN 1408-15) 
Contains banded millimeter-wave system configurations, system operation, system calibration, and typical measurement examples.

Application Note 2009-11-24

Fundamentals of RF and Microwave Power Measurements (AN 1449) - Application Note 
Keysight's Fundamentals of RF and Microwave Power Measurements, application note (AN 1449-1/2/3/4).

Application Note 2009-06-05

Test and Measurement Instrument Security - Application Note 
This document describes security features and the steps to perform a security erase for select Keysight test and measurement instruments.

Application Note 2009-04-14

Enhanced Log Records for the Keysight Medalist In-Circuit Test System 
Track changes made to your i3070 test programs to improve success.

Application Note 2009-03-04

Diagnostic Testing and the Medalist 5DX Automated X-ray Inspection System 
Users of the Medalist 5DX automated x-ray inspection system can benefit from running diagnostic tests on a regular basis. This application note provides some guidelines.

Application Note 2009-01-14

IEEE 1149.6 Standard Boundary Scan Testing on Keysight Medalist i3070 ICT Systems 
This paper introduces the latest advancements in Boundary Scan test capabilities on the Keysight Medalist i3070 In-Circuit Test platform that supports the testing of IEEE 1149.6-compliant devices.

Application Note 2008-11-24

Medalist i3070 Test Throughput Optimization 
This application note explores some factors which cause test time to increase on the Medalist i3070 In-Circuit Test system, and methods which users can employ to reduce the test time and increase throughput on the Medalist i3070 ICT system.

Application Note 2008-11-24

Boosting PLL Design Efficiency From free-running VCO characterizations to closed-loop PLL evaluation 
This application note describes introduces practical solutions for VCO/PLL performance evaluation and gives actual examples of parameter measurements using the E5052B.

Application Note 2008-11-21

Exposed Pad Algorithm for the Medalist x6000 AXI System 
This application note describes how to use the exposed pad algorithm in the Medalist x6000 AXI software to test all varieties of QFN and FET package types for defects such as Open and Voiding.

Application Note 2008-10-21

Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not 
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Application Note 2008-10-15

Measurement Wizard Assistant software for ENA 
This application note explains how using MWA software on the ENA simplifies measurements and reduces the setup time of complicated measurements. It provides you with a step-by-step guide to the MWA and useful measurement tips for using the ENA and E5092A configurable multiport test set.

Application Note 2008-09-30

First pass Yield (FPY) and Alarm Triggers on the Keysight Medalist i3070 In-circuit Test System 
This application note will explain some customizations and how to create alarm triggers.

Application Note 2008-09-26


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