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Using the Auto Optimizer on the Keysight Medalist In-Circuit Test Systems  
Learn how to optimize throughput by using the auto optimizer tool.

Application Note 2008-05-03

PDF PDF 237 KB
Using the Graphical Pin Locator on Keysight Medalist In-Circuit Test Systems 
Enhancing productivity is the end result when the graphical version of "find pins" is utilized. This tool is called pin locator and is part of the Operator GUI Browser in version 7.0.

Application Note 2008-05-03

PDF PDF 203 KB
The Future of In-Circuit Testing in the High-speed, Complex Electronics Environment 
As board complexity and node counts continue to rise and high speed differential signaling continues to grow in popularity, In-Circuit Test needs to move quickly beyond the traditional realms. This article explores this in detail.

Application Note 2007-10-31