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Basics & Measurement Fundamentals

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Spectrum Analysis Basics - Application Note 
This application note (also known as AN 150) explains the fundamentals of swept-tuned, superheterodyne spectrum analyzers and discusses the latest advances in spectrum analyzer capabilities.

Application Note 2016-04-15

Understanding the Fundamental Principles of Vector Network Analysis - Application Note 1287-1 
This application note explores the fundamental principles of vector network analysis. The discussion includes the common parameters (S-parameters). RF fundamentals such as transmission lines and the Smith chart will also be reviewed.

Application Note 2015-05-15

Choosing the Test System Software Architecture - Application Note 
This application note is designed to help you quickly design a test system that produces reliable results and meets throughput requirements within budget. It explores the entire software development process, from gathering and documenting software requirements through design reuse considerations.

Application Note 2014-07-31

Making Accurate Intermodulation Distortion Measurements with the PNA-X (1408-17) – Application Note 
This application note describes accuracy considerations when using the Keysight PNA-X microwave network analyzer for two-tone intermodulation distortion measurements.

Application Note 2012-03-05

Optimizing Dynamic Range for Distortion Measurements 
This Product Note covers high dynamic range measurement techniques for the new PSA Performance Spectrum Analyzer Series. The Note describes the best way to use the PSA series to make distortion measurements such as ACP, intermodulation, and harmonic distortion.

Application Note 2011-10-27

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Fundamentals of RF and Microwave Noise Figure Measurements - Application Note 
This 32-page, black-and-white application note providesinformation on RF and Microwave noise figure measurementts. Topics include noise figure and temperature, noise characteristics of two-port networks, and the measurement of noise figure.

Application Note 2010-08-05

8 Hints for Making Better Spectrum Analyzer Measurements (AN 1286-1) - Application Note 
This application note provides eight pertinent hints for making better spectrum analyzer measurements such as measuring low level signals and indentifying internal distortion products.

Application Note 2009-09-07

Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not 
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Application Note 2008-10-15

Best of 8 Hints for Making Better Oscilloscopes Measurements  
Keysight engineers sharing ideas of how to use the equipment they design

Application Note 2008-03-17

PDF PDF 320 KB
PNA - Pulsed-RF S-Parameter Measurements Using Wideband and Narrowband Detection (AN 1408-12) 

Application Note 2007-11-28

Measuring Power-Added Efficiency (PAE) with PNA Network Analyzers (1408-16) – Application Note 

Application Note 2007-10-09

8 Hints for Solving Common Debugging Problems with Your Logic Analyzer (AN 1326) 

Application Note 2007-04-19

Using the VISA COM I/O API in .NET - Application Note 
The Microsoft .NET architecture has many features that make it an excellent environment for Test & Measurement programmers. VISA COM I/O is an update of the older VISA C API to work in and with COM technology.

Application Note 2007-03-16

PDF PDF 345 KB
Bluetooth® RF Measurement Fundamentals - Application Note 
Bluetooth® is an open specification for a wireless personal area network. It provides limited range RF connectivity for voice and data transmissions between information appliances.

Application Note 2006-10-12

Comparison of Different Jitter Analysis Techniques With a Precision Transmitter - Application Note 
This white paper describes how various jitter analysis techniques give dissimilar results. Which is right? We built a precision jitter transmitter to compare results of different techniques where test sets were exposed to known levels of jitter.

Application Note 2006-04-06

PDF PDF 169 KB
PNA - Amplifier - High-Power Testing (1408-10) 

Application Note 2005-09-28

Validating Transceiver FPGAs Using Advanced Calibration Techniques 

Application Note 2005-04-27

Using LAN in Test Systems: Applications (1465-14) - Application Note and Example Programs 
Topics include balancing cost, convenience and security in three common LAN scenarios: sharing instruments, remote monitoring and data acquisition, and functional test systems. Includes downloadable example programs.

Application Note 2005-04-01

 
Using LAN in Test Systems: Setting up System I/O (AN 1465-15) - Application Note 
This set of application notes shows you how to simplify test system integration by utilizing open connectivity standards such as local area networking (LAN). The collective goal of these notes is to help you produce reliable results, meet your throughput requirements and stay within your budget.

Application Note 2005-03-29

PDF PDF 263 KB
Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note 
This application note answers common questions about the use of drivers and direct I/O to send commands from a PC application to the test instrument.

Application Note 2004-12-21

PDF PDF 374 KB
Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note 
Using SCPI and Direct I/O vs. Drivers, the fifth note in the series, outlines the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems

Application Note 2004-12-13

PDF PDF 408 KB
Test-System Computer I/O Considerations (AN 1465-2) - Application Note 
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing

Application Note 2004-12-09

PDF PDF 189 KB
Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note 
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today for connecting modern instrumentation to computers are GPIB, LAN, and USB.

Application Note 2004-11-19

PDF PDF 194 KB
System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note 
Using LAN in Test Systems: PC Configuration,the third note in the series, describes the additional capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.

Application Note 2004-10-19

PDF PDF 204 KB
Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note 
The decision to use LAN in a test system delivers important benefits to your company and your team. From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking

Application Note 2004-09-14

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