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Basics & Measurement Fundamentals

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Network Analysis - Balanced Measurement Example: SAW Filters (1373-5) 
SAW filters are commonly used in wireless communication products because of their very sharp response characteristics, relatively low insertion loss, and low cost.

Application Note 2001-09-17

3070 Series 3 Flash70 Programming Guide 
This guide contains information about the procedures, tasks, and syntax required to perform flash programming with HP 3070 test systems.

Application Note 2001-09-12

PDF PDF 1.85 MB
Network Analysis - Balanced Measurement Example: Differential Amplifiers (1373-7) 
This Application Note describes Keysight balanced-measurement solutions they have developed that offer the most accurate method available for measuring differential RF circuits.

Application Note 2001-09-10

3070 Board Tests are Reliable, Repeatable and Transportable. Here's Why. 
It would take a very long paper to discuss all of the factors that make Keysight 3070 tests so reliable, repeatable, and transportable. This paper selects a few of the important ones.

Application Note 2001-08-15

PDF PDF 223 KB
Advanced impedance measurement capability of the RF I-V method (AN 1369-2) 
This application note describes the difference between the network analyzer and impedance analyzer for the measurement principle and actual measurement performance.

Application Note 2001-07-26

Version 7.x ASAP Best Practices  
In an effort to standardize programming practices for the Keysight 5DX, Keysight has created a set of procedures representing 5DX "best practices" that address various aspects of the programming process.

Application Note 2001-07-25

 
Comparing AOI and AXI 
Choosing the right technology requires looking at board mix, capital budget and other business considerations. But most of all, you need to understand the typical characteristics of each technology.

Application Note 2001-07-25

PDF PDF 42 KB
Digital Basics for Cable Television Systems 
If you install, upgrade, or maintain digital or mixed digital/analog systems, this book is your complete guide to this new world.

Application Note 2001-07-19

 
In-System Programming on the Keysight 3070 
In-System Programmable devices are more widely used on today's boards to provide flexibility to design engineers and to reduce the cost of a product.

Application Note 2001-07-02

PDF PDF 205 KB
Tying a Power Supply to Multiple Boards in a Panel 
If you have a situation with multiple boards on a panel, and you need to wire one or more power supplies to each board, you often can wind up with problems wiring power and ground. Usually, you'll see warnings of the type FXT66.

Application Note 2001-06-12

PDF PDF 16 KB
Writing Flash Memory with Keysight 3070 Systems 
Flash memory is traditionally programmed on PROM programmers, but some manufacturers report a one percent damage rate due to the extra handling steps required!

Application Note 2001-05-18

PDF PDF 31 KB
Running Rocky Mountain Basic from Board Test Basic 
Many of you have existing programs written in Rocky Mountain Basic (RM-Basic), or have found the RM-Basic program examples given in Keysight manuals, and wish to use them to do external instrumentation control using the Keysight 3070 Board Test Family.

Application Note 2001-05-17

PDF PDF 23 KB
Rotating Boards on a Panel 
Rotating Boards on a Panel if often necessary. In addition to the software revisions named within, the explained technique in the document is utilized for for 4.x, 5.x, 6.x and 7.x. For 8.x Test Link deals with this automatically.

Application Note 2001-05-17

PDF PDF 40 KB
Up-and-Down Programming DUT Power Supplies 
There seems to be some confusion on what the current limits are when using the DUT supplies in the Keysight 3070 system. While this article is not meant to be an exhaustive treatise on the subject, a little clarification might help.

Application Note 2001-05-17

PDF PDF 23 KB
Reducing Process Defect Escapes with Vectorless Test 
Process defects that escape in-circuit test lead at best to increased repair costs, and at worst to a "bone pile1" problem.

Application Note 2001-05-17

PDF PDF 512 KB
Dealing with Board Thickness Variations 
The Keysight 5DX has the capability to be implemented such that it can accommodate thickness variations on a board-by-board basis. NOTE: Content described is in the 5DX Reference Guide but is no longer in Chapter 7 as mentioned herein.

Application Note 2001-05-16

PDF PDF 31 KB
Fundamentals of RF and Microwave Power Measurements (AN 64-1C) 
This Application Note is for information only. Keysight no longer sells or supports these products.

Application Note 2001-04-16

PDF PDF 2.21 MB
8 Hints for Making Better RF Counter Measurements 
This Brochure focuses on making better RF counter measurements by understanding the effects of counter architecture; recognizing the difference between resolution and accuracy, and scheduling calibration to match performance needs. In addition, the impact of timebase options is discussed along...

Application Note 2001-04-10

LCR/Impedance Measurement Basics 
presents impedance, component value definitions, typical measurement problemsand their solutions, and error correction and compensation techniques.

Application Note 2001-03-28

 
Improved Fault Coverage in a Combined X-ray and In-Circuit Test Environment 
Cutting functional test failures in half and doubling the faults detected at process test! These are some of the case study results observed in combined X-ray and in-circuit test environments.

Application Note 2001-02-27

PDF PDF 575 KB
Electrical In-circuit Test Methods for Limited-access Boards 
This paper surveys the various electrical test methods and tools available to address testing boards that lack full electrical access.

Application Note 2001-02-27

PDF PDF 47 KB
Use of Wrong Thickness Technique Gives Bad Test Results 
Beginning with release 6.0, there are two techniques for measurement of solder thickness on the Keysight 5DX, each based on use of a different Confirmation & Adjustment panel.

Application Note 2000-12-31

 
Exploring the Architectures of Network Analyzers (1287-2) – Application Note 
This Application Note explains that Network analyzers have become one of the most important tools for characterizing the performance of high-frequency components and devices.

Application Note 2000-12-06

The Why, Where, What, How, and When of X-ray Test 
How do the different AXI technologies work? What are the appropriate uses of 2D vs 3D X-ray? Where in the mfg process should AXI be placed? How can AXI be used to improve the mfg process?

Application Note 2000-11-01

PDF PDF 1.30 MB
Hybrid32 Migration 
This document is provided to help users of HybridPlus Pin Cards more easily incorporate the Hybrid32 technology into their existing systems.

Application Note 2000-11-01

PDF PDF 61 KB

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