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Shopfloor Operation of the Keysight i1000 In-Circuit Test Software - Application Note 
This application note helps developers of the shopfloor client to fully understand the format and behavior of the i1000 software files to enable communication between the i1000 and the client.

应用说明 2015-04-16

PDF PDF 1.24 MB
M9381A PXIe Vector Signal Generator & M9391A PXIe Vector Signal Analyzer - Configuration Guide 
This document provides information for configuring solutions for RF test based on the M9391A PXIe VSA and M9381A PXIe VSG.

配置指南 2015-03-31

PDF PDF 5.25 MB
Automated X-Ray Inspection System Keysight Technologies - Technical Overview 
This is a technical datasheet. Keysight has developed a sealed ultra-high vacumn X-ray tube that provides stable output throughout a significantly long life.

应用说明 2015-03-24

PDF PDF 644 KB
The World’s Highest Pin Count In-Circuit Test Solutions - Brochure 
Keysight's new i3070 and 3070 in-circuit test (ICT) high node count test solution is the world’s highest pin count ICT system, bringing an unprecedented level of performance and portability to users.

手册 2015-02-12

PDF PDF 212 KB
i3070 High Node Count Test Solution - Technical Overview 
Keysight's high node count test solution allows any Keysight 3070/i3070 Series 3 or Series 5 four-module test system to be easily upgraded into an ultra-high pin count test system

技术总览 2015-02-12

PDF PDF 645 KB
是德科技 M9393A PXIe 高性能矢量信号分析仪 
是德科技 M9393A PXIe 高性能矢量信号分析仪

产品资料 2015-02-10

M9068A Phase Noise X-Series Measurement Application for PXI Vector Signal Analyzers 
This document provides technical and other information related to the Phase Noise X-Series measurement application for modular instruments.

技术总览 2015-02-10

PDF PDF 2.39 MB
In-Circuit Test Suite - Brochure 
Latest board and functional test solutions to help electronics manufacturers achieve better product quality withmore comprehensive test coverage.

手册 2015-02-01

PDF PDF 10.42 MB
Transmit/Receive Module Test Platform (TRM-X) - Technical Overview 
The TRM-X Test Platform, measurement science expertise and systems when and where needed, provide the capability you need to deliver AESA radar; datalink; and satcom transmit/receive modules.

技术总览 2015-01-10

PDF PDF 1.83 MB
Detecting Tailgating Boards on the i3070 Inline In-Circuit Tester - Application Note 
Tailgating sensor improvements on the Keysight i3070 Series 5i inline in-circuit tester help to further minimize damages due to operator and upstream loading errors.

应用说明 2015-01-05

PDF PDF 437 KB
i3070 ICT Fixture Electronic Clock Measurement Modules - Technical Overview 
The Keysight clock measurement modules (CMM)for the i3070 in-circuit test application comes with three types of clock signal measurement to meet your different circuit topologies.

技术总览 2014-11-11

PDF PDF 213 KB
Ensuring Medical Alert Pendants are Accurate and Reliable with Modular Functional Test 
This application note shows how the 34980A multi-function switch/measure unit is being used to test medical alert devices.

Solution Brief 2014-11-11

PDF PDF 848 KB
TS-8989 PXI Functional Test System - System Integration Guide - Application Note 
In today’s manufacturing environment, floor space is an increasingly invaluable variable in the cost of test equation.

应用说明 2014-11-06

PDF PDF 611 KB
RF PA/FEM Characterization and Test, Reference Solution – Brochure 
This brochure describes the hardware, software and services components of the RF PA/FEM characterization & test, Reference Solution

手册 2014-09-15

PDF PDF 2.48 MB
使用 i1000D SFP 在线测试系统 测试汽车保险丝盒 
使用 i1000D SFP 在线测试系统 测试汽车保险丝盒

应用说明 2014-08-06

M9393A PXIe Performance Vector Signal Analyzer - Configuration Guide 
This document provides the technical specifications and characteristics for the M9393A PXIe performance vector signal analyzer.

配置指南 2014-08-04

PDF PDF 3.04 MB
Modifying DDR Libraries for Silicon Nail Test Generation on the Keysight x1149 Boundary Scan Analyzer 
This application note describes how to modify DDR libraries to generate silicon nails tests on the Keysight x1149 Boundary Scan Analyzer.

应用说明 2014-08-03

PDF PDF 1.57 MB
Offline vs Inline: Shifting to automated inline ICT - White Paper  
This paper discusses the benefits of adopting an inline in-circuit test strategy for electronics manufacturers looking to increase product quality and reliability while ensuring optimal ROIC.

应用说明 2014-05-14

PXI Functional Test - TTCI 
PXI Functional Test Solution from TTCI and Keysight.

Solution Brief 2014-05-14

 
Functional Test - TTCI 
Functional Test Solutions from TTCI and Keysight.

Solution Brief 2014-05-14

 
Test Instrument Emulator - WinSoft 
Test Instrument Emulation Solution from WinSoft and Keysight.

Solution Brief 2014-05-14

 
Burn-In Test - LXinstruments 
Burn-in Testing Solutions from LXinstruments and Keysight.

Solution Brief 2014-04-30

 
Open Test Platform - LXinstruments 
LXI Functional Test Solutions from LXinstruments and Keysight.

Solution Brief 2014-04-30

 
Power Supply Test – FineTest 
Power Supply Test Solutions from FineTest and Keysight

Solution Brief 2014-04-29

 
Modular Functional Test – Circuit Check 
Modular Functional Test Solutions from Circuit Check and Keysight

Solution Brief 2014-04-16

 

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