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Finding Fault - Article Reprint 
testing mission-critical functions in automotive electronics.

文章 2016-02-05

PDF PDF 452 KB
Testing of Small Form-Factor Products - Article Reprint 
Boundary scan and embedded test will need to make up for ICT gaps.

文章 2016-02-03

PDF PDF 546 KB
Making Boundary Scan Easy - Article Reprint 
Testing boundary scan devices no longer need be a laborious task.

文章 2016-02-03

PDF PDF 217 KB
Testing New Grounds in Automotive Electronics - Article Reprint 
Manufacturers are increasingly designing products for ease of test.

文章 2016-02-02

PDF PDF 279 KB
Automating In-Circuit Test - Article Reprint 
Inline ICT is not as cumbersome as it used to be, and in the longer run, will help manufacturers save costs.

文章 2016-02-02

PDF PDF 87 KB
是德科技 M9393A PXIe 高性能矢量信号分析仪 
是德科技 M9393A PXIe 高性能矢量信号分析仪

手册 2016-02-01

PDF PDF 574 KB
Boundary Scan DFT Guidelines for Good Chain Integrity and Test Coverage - Application Note 
This application note provides some key guidelines to enable good design for testability using boundary scan.

应用说明 2016-01-21

PDF PDF 1.99 MB
TS-8989 Automotive Body and Safety Test Reference Solution – Configuration Guide 
This configuration guide contains information to help you configure your body and safety test reference solution with the TS-8989 functional tester, and tailor the system to meet your requirements.

配置指南 2016-01-20

PDF PDF 2.55 MB
使用 Medalist VTEP v2.0-VTEP、iVTEP 和 NPM 使测试范围最大化 
使用 Medalist VTEP v2.0-VTEP、iVTEP 和 NPM 使测试范围最大化

应用说明 2015-12-22

TS-8989 System Integration Guide - Application Note 
In today’s manufacturing environment, floor space is an increasingly invaluable variable in the cost of test equation.

应用说明 2015-11-11

PDF PDF 2.87 MB
Moving the World’s Technology Forward. Faster. - Brochure 
Believe you can change the world. Bill Hewlett, one of the original co-founders of what is now Keysight Technologies, first said these words. The same passion to make the world a better and safer place still drives us more than 75 years later.

手册 2015-11-01

PDF PDF 7.64 MB
Configuring Lattice BSCAN2 Scan Path Linker on Keysight x1149 Boundary Scan Analyzer - App Note 
A boundary scan linker mux device links multiple boundary scan chains into one single chain or multiple chain configurations. Find out how to configure Lattice BSCAN2 scan path linkers in this paper.

应用说明 2015-10-30

PDF PDF 6.31 MB
M9393A PXIe Performance Vector Signal Analyzer - Flyer 
This document provides the features, benefits and performance characteristics for the M9393A PXIe performance vector signal analyzer.

手册 2015-10-22

PDF PDF 500 KB
M9393A PXIe Performance Vector Signal Analyzer - Configuration Guide 
This document provides the technical specifications and characteristics for the M9393A PXIe performance vector signal analyzer.

配置指南 2015-10-22

PDF PDF 2.43 MB
RF PA/FEM Characterization & Test, Reference Solution - Solution Brochure 
This brochure describes the hardware, software and services components of the RF PA/FEM characterization & test, Reference Solution

手册 2015-09-28

PDF PDF 3.57 MB
“Shotgunning”, a Bad Fit for Lead-Free Test 
Shotgunning, a common repair technique in functional test, will be negatively affected by lead-free processes. This article explores the technique and draws broad conclusions regarding the impact of lead-free on electronics manufacturing test

应用说明 2015-07-14

PDF PDF 99 KB
5DX Windows 7 Controller Upgrade - Brochure 
Upgrade your 5DX AXI PC controller to enjoy better inspection performance.

手册 2015-06-09

PDF PDF 159 KB
Implementing Cover-Extend Test on Keysight x1149 Boundary Scan Analyzer - Application Note 
This application note discusses the process of test generation on the x1149 boundary scan analyzer with Cover-Extend Technology, and suggestions on fixturing in order to successfully implement CET.

应用说明 2015-05-26

PDF PDF 1.67 MB
Ensuring Medical Alert Pendants are Accurate and Reliable with Modular Functional Test 
This application note shows how the 34980A multi-function switch/measure unit is being used to test medical alert devices.

Solution Brief 2015-05-14

PDF PDF 569 KB
Testing Automotive Electronic Parking Brake Controls with the TS-8989 - Application Note 
This application note discusses the configuration of a typical Keysight TS-8989 PXI Functional Test System for testing automotive electronic parking brake controls.

应用说明 2015-05-11

Understanding the Operation and Usage of Manufacturing Execution Systems - Technical Overview 
This paper gives an overview of how typical manufacturing execution systems work on the production floor, with examples of MES connectivity with shopfloor clients to enable specific applications

技术总览 2015-04-28

PDF PDF 1.81 MB
Shopfloor Operation of the Keysight i1000 In-Circuit Test Software - Application Note 
This application note helps developers of the shopfloor client to fully understand the format and behavior of the i1000 software files to enable communication between the i1000 and the client.

应用说明 2015-04-16

PDF PDF 1.24 MB
M9381A PXIe Vector Signal Generator & M9391A PXIe Vector Signal Analyzer - Configuration Guide 
This document provides information for configuring solutions for RF test based on the M9391A PXIe VSA and M9381A PXIe VSG.

配置指南 2015-03-31

PDF PDF 5.25 MB
Automated X-Ray Inspection System Keysight Technologies - Technical Overview 
This is a technical datasheet. Keysight has developed a sealed ultra-high vacumn X-ray tube that provides stable output throughout a significantly long life.

应用说明 2015-03-24

PDF PDF 644 KB
The World’s Highest Pin Count In-Circuit Test Solutions - Brochure 
Keysight's new i3070 and 3070 in-circuit test (ICT) high node count test solution is the world’s highest pin count ICT system, bringing an unprecedented level of performance and portability to users.

手册 2015-02-12

PDF PDF 212 KB

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