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Control & Automation of Instruments & Systems

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Testing the Internet of Things - Article Reprint 
Connectivity is embedded in the electronics ecosystem. And test should be embedded in the devices that support it.

Article 2016-02-09

PDF PDF 79 KB
Manufacturing Test Solutions for SSDS - Article Reprint 
A new system performs both ICT and boundary scan in high-volume settings.

Article 2016-02-09

PDF PDF 222 KB
Tester for Hire - Article Reprint 
This article explores the possibility of renting test equipment to help electronics manufacturers juggle capacity according to production demand and available resources.

Article 2016-02-09

PDF PDF 381 KB
Emulating Analog Input Sensors in Automotive Electronics Functional Test - Article Reprint 
This article discusses guidelines for evaluating the digital-analog converters for your automotive electronics functional test needs.

Article 2016-02-09

PDF PDF 318 KB
Finding Fault - Article Reprint 
testing mission-critical functions in automotive electronics.

Article 2016-02-05

PDF PDF 452 KB
Testing of Small Form-Factor Products - Article Reprint 
Boundary scan and embedded test will need to make up for ICT gaps.

Article 2016-02-03

PDF PDF 546 KB
Making Boundary Scan Easy - Article Reprint 
Testing boundary scan devices no longer need be a laborious task.

Article 2016-02-03

PDF PDF 217 KB
Automating In-Circuit Test - Article Reprint 
Inline ICT is not as cumbersome as it used to be, and in the longer run, will help manufacturers save costs.

Article 2016-02-02

PDF PDF 87 KB
Testing New Grounds in Automotive Electronics - Article Reprint 
Manufacturers are increasingly designing products for ease of test.

Article 2016-02-02

PDF PDF 279 KB
TS-8989 PXI Functional Test System - Brochure 
The TS-8989 PXI functional tester helps you achieve a lower cost of test for automotive electronic control units and industrial electronics.

Brochure 2016-01-28

PDF PDF 671 KB
Boundary Scan DFT Guidelines for Good Chain Integrity and Test Coverage - Application Note 
This application note provides some key guidelines to enable good design for testability using boundary scan.

Application Note 2016-01-21

PDF PDF 1.99 MB
TS-8989 Automotive Body and Safety Test Reference Solution – Configuration Guide 
This configuration guide contains information to help you configure your body and safety test reference solution with the TS-8989 functional tester, and tailor the system to meet your requirements.

Configuration Guide 2016-01-20

PDF PDF 2.55 MB
TS-8989 System Integration Guide - Application Note 
In today’s manufacturing environment, floor space is an increasingly invaluable variable in the cost of test equation.

Application Note 2015-11-11

PDF PDF 2.87 MB
Moving the World’s Technology Forward. Faster. - Brochure 
Believe you can change the world. Bill Hewlett, one of the original co-founders of what is now Keysight Technologies, first said these words. The same passion to make the world a better and safer place still drives us more than 75 years later.

Brochure 2015-11-01

PDF PDF 7.64 MB
Configuring Lattice BSCAN2 Scan Path Linker on Keysight x1149 Boundary Scan Analyzer - App Note 
A boundary scan linker mux device links multiple boundary scan chains into one single chain or multiple chain configurations. Find out how to configure Lattice BSCAN2 scan path linkers in this paper.

Application Note 2015-10-30

PDF PDF 6.31 MB
M9393A PXIe Performance Vector Signal Analyzer - Configuration Guide 
This document provides the technical specifications and characteristics for the M9393A PXIe performance vector signal analyzer.

Configuration Guide 2015-10-22

PDF PDF 2.43 MB
M9393A PXIe Performance Vector Signal Analyzer - Flyer 
This document provides the features, benefits and performance characteristics for the M9393A PXIe performance vector signal analyzer.

Brochure 2015-10-22

PDF PDF 500 KB
M9393A PXIe Performance Vector Signal Analyzer - Data Sheet 
This document provides the technical specifications and characteristics for the M9393A PXIe performance vector signal analyzer.

Data Sheet 2015-10-21

RF PA/FEM Characterization & Test, Reference Solution - Solution Brochure 
This brochure describes the hardware, software and services components of the RF PA/FEM characterization & test, Reference Solution

Brochure 2015-09-28

PDF PDF 3.57 MB
“Shotgunning”, a Bad Fit for Lead-Free Test 
Shotgunning, a common repair technique in functional test, will be negatively affected by lead-free processes. This article explores the technique and draws broad conclusions regarding the impact of lead-free on electronics manufacturing test

Application Note 2015-07-14

PDF PDF 99 KB
5DX Windows 7 Controller Upgrade - Brochure 
Upgrade your 5DX AXI PC controller to enjoy better inspection performance.

Brochure 2015-06-09

PDF PDF 159 KB
Implementing Cover-Extend Test on Keysight x1149 Boundary Scan Analyzer - Application Note 
This application note discusses the process of test generation on the x1149 boundary scan analyzer with Cover-Extend Technology, and suggestions on fixturing in order to successfully implement CET.

Application Note 2015-05-26

PDF PDF 1.67 MB
Ensuring Medical Alert Pendants are Accurate and Reliable with Modular Functional Test 
This application note shows how the 34980A multi-function switch/measure unit is being used to test medical alert devices.

Solution Brief 2015-05-14

PDF PDF 569 KB
Testing Automotive Electronic Parking Brake Controls with the TS-8989 - Application Note 
This application note discusses the configuration of a typical Keysight TS-8989 PXI Functional Test System for testing automotive electronic parking brake controls.

Application Note 2015-05-11

Understanding the Operation and Usage of Manufacturing Execution Systems - Technical Overview 
This paper gives an overview of how typical manufacturing execution systems work on the production floor, with examples of MES connectivity with shopfloor clients to enable specific applications

Technical Overview 2015-04-28

PDF PDF 1.81 MB

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