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Finding Fault - Article Reprint 
testing mission-critical functions in automotive electronics.

記事 2016-02-05

PDF PDF 452 KB
Testing of Small Form-Factor Products - Article Reprint 
Boundary scan and embedded test will need to make up for ICT gaps.

記事 2016-02-03

PDF PDF 546 KB
Making Boundary Scan Easy - Article Reprint 
Testing boundary scan devices no longer need be a laborious task.

記事 2016-02-03

PDF PDF 217 KB
Testing New Grounds in Automotive Electronics - Article Reprint 
Manufacturers are increasingly designing products for ease of test.

記事 2016-02-02

PDF PDF 279 KB
Automating In-Circuit Test - Article Reprint 
Inline ICT is not as cumbersome as it used to be, and in the longer run, will help manufacturers save costs.

記事 2016-02-02

PDF PDF 87 KB
Boundary Scan DFT Guidelines for Good Chain Integrity and Test Coverage - Application Note 
This application note provides some key guidelines to enable good design for testability using boundary scan.

アプリケーション・ノート 2016-01-21

PDF PDF 1.99 MB
TS-8989 Automotive Body and Safety Test Reference Solution – Configuration Guide 
This configuration guide contains information to help you configure your body and safety test reference solution with the TS-8989 functional tester, and tailor the system to meet your requirements.

構成ガイド 2016-01-20

PDF PDF 2.55 MB
TS-8989 System Integration Guide - Application Note 
In today’s manufacturing environment, floor space is an increasingly invaluable variable in the cost of test equation.

アプリケーション・ノート 2015-11-11

PDF PDF 2.87 MB
Moving the World’s Technology Forward. Faster. - Brochure 
Believe you can change the world. Bill Hewlett, one of the original co-founders of what is now Keysight Technologies, first said these words. The same passion to make the world a better and safer place still drives us more than 75 years later.

ブローシャ 2015-11-01

PDF PDF 7.64 MB
Configuring Lattice BSCAN2 Scan Path Linker on Keysight x1149 Boundary Scan Analyzer - App Note 
A boundary scan linker mux device links multiple boundary scan chains into one single chain or multiple chain configurations. Find out how to configure Lattice BSCAN2 scan path linkers in this paper.

アプリケーション・ノート 2015-10-30

PDF PDF 6.31 MB
M9393A PXIe Performance Vector Signal Analyzer - Configuration Guide 
This document provides the technical specifications and characteristics for the M9393A PXIe performance vector signal analyzer.

構成ガイド 2015-10-22

PDF PDF 2.43 MB
Keysight Technologies RF PA/FEM特性評価/テストのリファレンスソリューション 
このリファレンスソリューションは、高いスループット、測定品質、性能により、携帯電話などの次世代パワーアンプ/フロントエンドモジュールのデザイン評価/製造テストに対応しています。

ブローシャ 2015-08-17

PDF PDF 2.28 MB
Keysight M9393A PXIe高性能ベクトル・シグナル・アナライザ 
M9393Aは、これまでのモジュール計測器にはないマイクロ波性能を備え、厳しいシステム要件にも対応しています。

ブローシャ 2015-07-29

PDF PDF 377 KB
“Shotgunning”, a Bad Fit for Lead-Free Test 
Shotgunning, a common repair technique in functional test, will be negatively affected by lead-free processes. This article explores the technique and draws broad conclusions regarding the impact of lead-free on electronics manufacturing test

アプリケーション・ノート 2015-07-14

PDF PDF 99 KB
Keysight Technologies Keysight TS-8989 PXIファンクション・テスト・システムによる自動車用電動パーキングブレーキの制御部のテスト 
Keysight Technologies Keysight TS-8989 PXIファンクション・テスト・システムによる自動車用電動パーキングブレーキの制御部のテスト

アプリケーション・ノート 2015-07-01

5DX Windows 7 Controller Upgrade - Brochure 
Upgrade your 5DX AXI PC controller to enjoy better inspection performance.

ブローシャ 2015-06-09

PDF PDF 159 KB
Implementing Cover-Extend Test on Keysight x1149 Boundary Scan Analyzer - Application Note 
This application note discusses the process of test generation on the x1149 boundary scan analyzer with Cover-Extend Technology, and suggestions on fixturing in order to successfully implement CET.

アプリケーション・ノート 2015-05-26

PDF PDF 1.67 MB
Ensuring Medical Alert Pendants are Accurate and Reliable with Modular Functional Test 
This application note shows how the 34980A multi-function switch/measure unit is being used to test medical alert devices.

ソリューション概要 2015-05-14

PDF PDF 569 KB
Understanding the Operation and Usage of Manufacturing Execution Systems - Technical Overview 
This paper gives an overview of how typical manufacturing execution systems work on the production floor, with examples of MES connectivity with shopfloor clients to enable specific applications

技術概要 2015-04-28

PDF PDF 1.81 MB
Shopfloor Operation of the Keysight i1000 In-Circuit Test Software - Application Note 
This application note helps developers of the shopfloor client to fully understand the format and behavior of the i1000 software files to enable communication between the i1000 and the client.

アプリケーション・ノート 2015-04-16

PDF PDF 1.24 MB
M9381A PXIe Vector Signal Generator & M9391A PXIe Vector Signal Analyzer - Configuration Guide 
This document provides information for configuring solutions for RF test based on the M9391A PXIe VSA and M9381A PXIe VSG.

構成ガイド 2015-03-31

PDF PDF 5.25 MB
Automated X-Ray Inspection System Keysight Technologies - Technical Overview 
This is a technical datasheet. Keysight has developed a sealed ultra-high vacumn X-ray tube that provides stable output throughout a significantly long life.

アプリケーション・ノート 2015-03-24

PDF PDF 644 KB
The World’s Highest Pin Count In-Circuit Test Solutions - Brochure 
Keysight's new i3070 and 3070 in-circuit test (ICT) high node count test solution is the world’s highest pin count ICT system, bringing an unprecedented level of performance and portability to users.

ブローシャ 2015-02-12

PDF PDF 212 KB
i3070 High Node Count Test Solution - Technical Overview 
Keysight's high node count test solution allows any Keysight 3070/i3070 Series 3 or Series 5 four-module test system to be easily upgraded into an ultra-high pin count test system

技術概要 2015-02-12

PDF PDF 645 KB
M9068A Phase Noise X-Series Measurement Application for PXI Vector Signal Analyzers 
This document provides technical and other information related to the Phase Noise X-Series measurement application for modular instruments.

技術概要 2015-02-10

PDF PDF 2.39 MB

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