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Control & Automation of Instruments & Systems

1-12 of 12

Evaluating Battery Run-Down with the N6781A Measure Unit and 14585A Software – Application Note 
This application note will describe in detail the procedure on evaluating battery run down to easily and accurately evaluate the battery and battery-powered device.

Application Note 2016-10-10

Power-Consumption Measurements for LTE User Equipment - Application Note 
This application note focuses on determining how certain parameters affect a specific smartphone's power consumption and figure out how to adjust the parameters to improve battery life.

Application Note 2014-08-04

Solar Cell and Module Testing 
This application note describes how to decrease costs and increase flexibility for solar cell and module testing with Keysight products and solutions.

Application Note 2009-12-07

Using LXI to Boost Throughput in Semiconductor Manufacturing 
This document is a case study that discusses the successful customer implementation of a Keysight LXI solution for a multinational semiconductor manufacturer

Application Note 2007-04-25

Cathodic Protection of Steel in Concrete Using LXI 
This document discusss Cathodic protection as a remarkable technique that can substantially extend the life of a building structure by impeding corrosion.

Application Note 2007-04-25

Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly 
This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems.

Application Note 2007-02-23

N6700 Modular Power System: Determining Specifications when Paralleling Outputs (AN 1560) 

Application Note 2005-07-27

Innovative Power Supplies Save Rack Space 
In the past, many programmable system DC power supplies in the medium power range (500W to 2kW) have been packaged in 2U-high (2-EIA rack units) and even 3U, full rack width chassis...

Application Note 2004-12-16

Increase DC-input Battery Adapter Test Throughput by Several-fold (AN 1506) 

Application Note 2004-10-22

Increase Automotive ECU Test Throughput (AN 1505) 

Application Note 2004-10-22

Simplify Multiple Bias Voltage Sequencing and Ramping for PC Motherboard Test (AN 1504) 

Application Note 2004-10-22

How to use the Keysight N6700 Modular Power System to replace a Keysight 662xA (AN 1467)  
This is a high-level overview to help current 662xA owners easily convert to a Keysight N6700.

Application Note 2004-08-02