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E5052B Signal Source Analyzer - Brochure 
This 16-page brochure describes the features and benefits of the E5052B (10 MHz to 7 GHz, 26.5 GHz, or 110 GHz) Signal Source Analyzer. The E5052B is a single-instrument solution that offers an indispensable set of measurement functions for evaluating RF & microwave signal sources such as VCOs, crystal oscillators, SAW oscillators, dielectric resonator oscillators, YIG oscillators, PLL synthesizers, RFICs, and L.O. circuits.

Brochure 2015-02-25

PDF PDF 1.92 MB
Signal Generator Selection Guide 
This selection guide provides an overview and side-by-side comparisons to help determine which signal generator is right for you.

Selection Guide 2015-02-25

Imaging Organic and Biological Materials with Low Voltage Scanning Electron Microscopy - App Note 

Application Note 2015-02-20

PDF PDF 3.66 MB
The World’s Highest Pin Count In-Circuit Test Solutions - Brochure 
Keysight's new i3070 and 3070 in-circuit test (ICT) high node count test solution is the world’s highest pin count ICT system, bringing an unprecedented level of performance and portability to users.

Brochure 2015-02-12

PDF PDF 212 KB
i3070 High Node Count Test Solution - Technical Overview 
Keysight's high node count test solution allows any Keysight 3070/i3070 Series 3 or Series 5 four-module test system to be easily upgraded into an ultra-high pin count test system

Technical Overview 2015-02-12

PDF PDF 645 KB
M9068A Phase Noise X-Series Measurement Application for PXI Vector Signal Analyzers 
This document provides technical and other information related to the Phase Noise X-Series measurement application for modular instruments.

Technical Overview 2015-02-10

PDF PDF 2.39 MB
USB3.1 Cable-Connector Assembly Compliance Test - Test Solution Overview Using the ENA Option TDR 
This describes how to make measurements of USB 3.1 cable & connector assemblies Compliance Tests by using the Keysight E5071C ENA Option TDR.

Technical Overview 2015-02-06

PDF PDF 3.42 MB
Solutions for WLAN 802.11ac Manufacturing Test - Application Note 
This “Solutions for WLAN 802.11ac Manufacturing Test” app note gives insight into testing 802.11ac client and infrastructure devices using fast, flexible, cost-effective calibration and non-signaling.

Application Note 2015-02-04

In-Circuit Test Suite - Brochure 
Latest board and functional test solutions to help electronics manufacturers achieve better product quality withmore comprehensive test coverage.

Brochure 2015-02-01

PDF PDF 10.42 MB
Simplify Signal Creation with Signal Studio Software - Brochure 
Signal Studio is a flexible suite of signal-creation tools that reduce the time spent on signal simulation. Its performance-optimized reference signals are validated by Keysight.

Brochure 2015-01-14

PDF PDF 4.19 MB
Transmit/Receive Module Test Platform (TRM-X) - Technical Overview 
The TRM-X Test Platform, measurement science expertise and systems when and where needed, provide the capability you need to deliver AESA radar; datalink; and satcom transmit/receive modules.

Technical Overview 2015-01-10

PDF PDF 1.83 MB
Detecting Tailgating Boards on the i3070 Inline In-Circuit Tester - Application Note 
Tailgating sensor improvements on the Keysight i3070 Series 5i inline in-circuit tester help to further minimize damages due to operator and upstream loading errors.

Application Note 2015-01-05

PDF PDF 437 KB
Measuring Frequency Response with E5061B LF Network Analyzer 
This application note describes fundamentals on low frequency network analysis by featuring the E5061B LF-RF network analyzer. Here we mainly discuss simple low frequency 2-port device measurements and associated topics.

Application Note 2014-12-05

E4980A Precision LCR Meter 20 Hz to 2 MHz - Brochure 
This brochure provides an overview, specifications and ordering information for the E4980A Precision LCR Meter.

Brochure 2014-12-02

PDF PDF 835 KB
High-Speed Digitizer Technology Expertise 
This brochure presents the added values of the Keysight High-Speed Digitizer Technology, which are: better measurement fidelity, higher measurement throughput and lower total cost of ownership (TCO).

Brochure 2014-11-17

PDF PDF 815 KB
i3070 ICT Fixture Electronic Clock Measurement Modules - Technical Overview 
The Keysight clock measurement modules (CMM)for the i3070 in-circuit test application comes with three types of clock signal measurement to meet your different circuit topologies.

Technical Overview 2014-11-11

PDF PDF 213 KB
InfiniiVision 3000T X-Series Oscilloscopes - Product Fact Sheet 
Quickly see how the InfiniiVision 3000T X-Series oscilloscopes from 100MHz - 1 GHz can help you touch, discover and solve your measurement challenges.

Brochure 2014-09-29

PDF PDF 203 KB
Automatic Audio Test for Design Verification and Production using the Keysight U8903B Audio Analyzer 
U8903B’s Test Sequence Application (TSA) function provides an easy way for automatic audio test. Users are not required to familiar with any PC language or programming tools.

Application Note 2014-09-05

Designing Automated Tests Using Powerful Digital Acquisition Systems - Application Brief 
Learn how the 34970A/34972A DAQ system offers the versatility and powerful functionality you need to solve your most pressing test challenges.

Application Note 2014-08-27

PDF PDF 351 KB
Quickly Identify Thermal Measurement Points For Data Acquisition - Application Brief 
Temperature monitoring is a process that traditionally involves an amount of guess work. Learn how a thermal imaging camera can be used to quickly and easily identify temperature problem areas.

Application Note 2014-08-22

PSG, MXG, & EXG Microwave Signal Generators - Brochure 
This brochure provides an overview of Keysight's microwave signal generator portfolio including the E8267D PSG vector, E8257D PSG analog, N5183B MXG analog, and N5173B EXG analog.

Brochure 2014-08-19

PDF PDF 1.92 MB
Power-Consumption Measurements for LTE User Equipment - Application Note 
This application note focuses on determining how certain parameters affect a specific smartphone's power consumption and figure out how to adjust the parameters to improve battery life.

Application Note 2014-08-04

PDF PDF 360 KB
Solutions for LTE-Advanced Manufacturing Test - Application Note 
This “Solutions for LTE-Advanced Manufacturing Test” application note gives insight into how to better understand the requirements for LTE-Advanced Carrier Aggregation manufacturing test.

Application Note 2014-08-04

Articulated Robotic Near-Field Electromagnetic Scanning System – APREL 
Articulated Robotic Near-Field Electromagnetic Scanning System – APREL and Keysight.

Solution Brief 2014-08-04

 
Modifying DDR Libraries for Silicon Nail Test Generation on the Keysight x1149 Boundary Scan Analyzer 
This application note describes how to modify DDR libraries to generate silicon nails tests on the Keysight x1149 Boundary Scan Analyzer.

Application Note 2014-08-03

PDF PDF 1.57 MB

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