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Blazingly Fast Compact Power Supply Reduces Test Time 
Power supplies are often one of the last pieces of equipment given consideration when designing a test system. Yet there are power supplies on the market today that can significantly help reduce the cost of test.

Brochure 2005-02-07

 
A Comparison of Leading Switch/Measure Solutions 
This application note compares the features, execution speed and ease of software development for switch/measure solutions used in functional test and data acquisition environments.

Application Note 2005-01-27

Introduction to Test-System Design (AN 1465-1) 

Application Note 2005-01-20

Test System Developement Guide Notes 1465-1 through 1465-8 

Application Note 2005-01-15

PDF PDF 1.89 MB
Understanding the Effects of Racking & System Interconnections (AN 1465-6) 

Application Note 2004-12-21

PDF PDF 235 KB
Choosing Your Test-System Hardware Architecture & Instrumentation (AN 1465-5) 

Application Note 2004-12-21

Test-System Development Guide: Operational Maintenance (AN 1465-8) 

Application Note 2004-12-21

Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note 
This application note answers common questions about the use of drivers and direct I/O to send commands from a PC application to the test instrument.

Application Note 2004-12-21

PDF PDF 374 KB
Maximizing System Throughput and Optimizing System Deployment (AN 1465-7) 

Application Note 2004-12-21

Innovative Power Supplies Save Rack Space 
In the past, many programmable system DC power supplies in the medium power range (500W to 2kW) have been packaged in 2U-high (2-EIA rack units) and even 3U, full rack width chassis...

Application Note 2004-12-16

 
Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note 
Using SCPI and Direct I/O vs. Drivers, the fifth note in the series, outlines the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems

Application Note 2004-12-13

PDF PDF 408 KB
Test-System Computer I/O Considerations (AN 1465-2) - Application Note 
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing

Application Note 2004-12-09

PDF PDF 189 KB
Testing FPGullwing Misalignment Across the Pad 
A technique is described which enables detection of misalignment of gullwing joints across the joint using duplicate components and FPGullwing Misalignment.

Application Note 2004-12-08

PDF PDF 1.58 MB
Handling Surface Mapping with Varying Board Construction 
This paper describes a method for dealing with lot-to-lot or supplier-to-supplier variations in board construction. Often the variations in board construction result in different color boards which otherwise cause problems with surface mapping.

Application Note 2004-12-02

PDF PDF 1.02 MB
Understanding the PCAP Polarity Reject Signal 
This paper describes the algorithm used to determine if polarized capacitors are properly oriented.

Application Note 2004-12-02

PDF PDF 1.09 MB
Understanding and Configuring the 5DX Selftest and Black/White Level Tests 
This paper discusses the theory and practice of 5DX automatic compensation tools, Selftest and gray level correction.

Application Note 2004-12-01

PDF PDF 158 KB
How and Why: Confirmation and Adjustments 
This paper describes the process of and reason for periodic adjustment of a 5DX system using the confirmation and adjustment panel.

Application Note 2004-12-01

PDF PDF 636 KB
Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note 
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today for connecting modern instrumentation to computers are GPIB, LAN, and USB.

Application Note 2004-11-19

PDF PDF 194 KB
Increase DC-input Battery Adapter Test Throughput by Several-fold (AN 1506) 

Application Note 2004-10-22

Simplify Multiple Bias Voltage Sequencing and Ramping for PC Motherboard Test (AN 1504) 

Application Note 2004-10-22

Increase Automotive ECU Test Throughput (AN 1505) 

Application Note 2004-10-22

System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note 
Using LAN in Test Systems: PC Configuration,the third note in the series, describes the additional capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.

Application Note 2004-10-19

PDF PDF 204 KB
Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note 
The decision to use LAN in a test system delivers important benefits to your company and your team. From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking

Application Note 2004-09-14

5DX Virus Protection Software Policy 
Keysight recognizes that customers require data protection for their PC workstations and computer controlled manufacturing equipment such as the 5DX Test System and associated workstations.

Application Note 2004-08-26

 
Instructions for Using One Confirmation and Adjustment Panel with Multiple Systems  
Readjusting the thickness table setting for one machine, using the Confirmation and Adjustment Panel, and adjustment data for a second machine, improves the portability of applications between the two machines.

Application Note 2004-08-26

 

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