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是德科技使用CVI Labwindows在TS-5400 PXI 系列上开发测试程序 
是德科技使用CVI Labwindows在TS-5400 PXI 系列上开发测试程序

应用说明 2016-03-24

是德科技使用 Keysight TS-8989 PXI 功能测试系统测试汽车(电子驻车制动) EPB 控制系统 
是德科技使用 Keysight TS-8989 PXI 功能测试系统测试汽车(电子驻车制动) EPB 控制系统

应用说明 2016-03-24

TS-8989 System Integration Guide - Application Note 
In today’s manufacturing environment, floor space is an increasingly invaluable variable in the cost of test equation.

应用说明 2015-11-11

PDF PDF 2.87 MB
Optimize burn-in test with the Keysight 34980A multifunction switch/measure unit apnote overview 
This application overview will discuss the complexities of burn-in test based on the Keysight 340980A switch/measure unit

应用说明 2013-01-31

PDF PDF 440 KB
Tips in Using Keysight GPIB Solutions in National Instrument’s LabVIEW Environment- Application Note 
Tips for using Keysight GPIB solutions in National Instrument’s LabVIEW environment.

应用说明 2009-03-04

应用说明:使用USB、GPIB和LAN的提示与技巧 
Application Note: Tips & Tricks for Connectivity

应用说明 2009-01-22

构建混合测试系统,确保在两个公共开发情景中取得成功 

应用说明 2008-10-15

是德标准内核能使功能测试系统的集成和支持更经济和容易 
是德标准内核能使功能测试系统的集成和支持更经济和容易

应用说明 2007-07-04

Using the VISA COM I/O API in .NET - Application Note 
The Microsoft .NET architecture has many features that make it an excellent environment for Test & Measurement programmers. VISA COM I/O is an update of the older VISA C API to work in and with COM technology.

应用说明 2007-03-16

PDF PDF 345 KB
将系统软件从GPIB过渡到LAN/LXI 

应用说明 2007-02-02

测试系统开发指南AN1465-4 
测试系统开发指南AN1465-4

应用说明 2006-09-01

测试系统中开关/测量解决方案的比较 
测试系统中开关/测量解决方案的比较

应用说明 2006-08-01

下一代测试系统:用LXI拓展视野 

应用说明 2005-08-01

Using LAN in Test Systems: Applications (1465-14) - Application Note and Example Programs 
Topics include balancing cost, convenience and security in three common LAN scenarios: sharing instruments, remote monitoring and data acquisition, and functional test systems. Includes downloadable example programs.

应用说明 2005-04-01

 
系统开发者指南:LAN在测试系统中的使用:网络配置 

应用说明 2004-12-28

Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note 
This application note answers common questions about the use of drivers and direct I/O to send commands from a PC application to the test instrument.

应用说明 2004-12-21

PDF PDF 374 KB
Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note 
Using SCPI and Direct I/O vs. Drivers, the fifth note in the series, outlines the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems

应用说明 2004-12-13

PDF PDF 408 KB
Test-System Computer I/O Considerations (AN 1465-2) - Application Note 
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing

应用说明 2004-12-09

PDF PDF 189 KB
Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note 
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today for connecting modern instrumentation to computers are GPIB, LAN, and USB.

应用说明 2004-11-19

PDF PDF 194 KB
System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note 
Using LAN in Test Systems: PC Configuration,the third note in the series, describes the additional capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.

应用说明 2004-10-19

PDF PDF 204 KB
如何由3499A/B/C系统至新34980A 开关∕测量单元的升级中获利? 
这篇应用指南描述34980A与3499A/B/C的差别及优点。

应用说明 2004-10-05

Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note 
The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.

应用说明 2004-07-29

PDF PDF 270 KB
How to Choose VXI-based Scanning A/D Converters, Waveform Digitizers, and Oscilloscopes 
This Product Overview discusses types of measurements considered and makes choosing Keysight VXI-based Scanning A/D Converters, Waveform Digitizers, and Oscilloscopes easier by making comparisons between various models. Scanning A/Ds, waveform digitizers and oscilloscopes all digitize analog...

应用说明 2004-02-20

PDF PDF 31 KB
Multi-channel signals with the Keysight E1440A 
The attached Application Note is an example describing the test of vehicle receivers used in Decca-type location systems that require a number of synthesizers to simulate the signals from a number of fixed transmitters. The frequencies, which are multiples of the master transmitter frequency...

应用说明 2004-02-20

PDF PDF 17 KB
8 More Hints for Making Better Scopes Measurements 
This Application Note contains a variety of hints to help you understand and improve your use of oscilloscopes. It includes the following 8 hints: 1. Don't forget to check that probe 2. A quick, easy way to troubleshoot mixed hardware/software prototypes 3. Using scopes to measure noisy signals 4...

应用说明 1999-12-01

PDF PDF 840 KB

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