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Control & Automation of Instruments & Systems

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Testing Automotive DC-DC converter with Keysight TS-8989 - Application Note 
This paper discusses emulation of input signals, load simulations and measurements for testing high-power automotive DC-DC converter electronic control units and the TS-8989 functional tester.

Notes d’application 2016-05-15

PDF PDF 880 KB
Right Load Switching and Simulation Design Choices for High Current and Mechatronic Functional Tests 
Key considerations for designing a cost-effective high-power switching and load management automotive functional test solution.

Notes d’application 2016-02-22

PDF PDF 967 KB
TS-8989 System Integration Guide - Application Note 
In today’s manufacturing environment, floor space is an increasingly invaluable variable in the cost of test equation.

Notes d’application 2015-11-11

PDF PDF 2.87 MB
Detecting Tailgating Boards on the i3070 Inline In-Circuit Tester - Application Note 
Tailgating sensor improvements on the Keysight i3070 Series 5i inline in-circuit tester help to further minimize damages due to operator and upstream loading errors.

Notes d’application 2015-01-05

PDF PDF 437 KB
Choosing the Test System Software Architecture - Application Note 
This application note is designed to help you quickly design a test system that produces reliable results and meets throughput requirements within budget. It explores the entire software development process, from gathering and documenting software requirements through design reuse considerations.

Notes d’application 2014-07-31

6 Hints for Enhancing Measurement Integrity in RF/Microwave Test Systems - Application Note 

Notes d’application 2012-04-30

Tips in Using Keysight GPIB Solutions in National Instrument’s LabVIEW Environment- Application Note 
Tips for using Keysight GPIB solutions in National Instrument’s LabVIEW environment.

Notes d’application 2009-03-04

Application Note: Tips & Tricks for Using USB, GPIB, & LAN (AN 1465-20) 
Application Note: Tips & Tricks for Connectivity

Notes d’application 2009-01-22

Using IVI For Your Instrument Driver - Application Note 
This application note describes the use of IVI drivers in your test system to determine when IVI is the right choice

Notes d’application 2008-11-14

Building Hybrid Test Systems. Ensuring success in two common development scenarios - Application Not 
Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

Notes d’application 2008-10-15

Modifying a GPIB System to Include LAN/LXI (AN 1465-26)  
This application note takes you through the process of replacing one instrument in a typical GPIB test system and shows how simple changes to the system software make it possible.

Notes d’application 2007-05-10

Using the VISA COM I/O API in .NET - Application Note 
The Microsoft .NET architecture has many features that make it an excellent environment for Test & Measurement programmers. VISA COM I/O is an update of the older VISA C API to work in and with COM technology.

Notes d’application 2007-03-16

PDF PDF 345 KB
Standardized Core Makes Building and Supporting a Functional Test System Easier and Less Costly 
This note demonstrates how to use LXI instruments to create a standardized core - the open test platform (OTP), for building test systems.

Notes d’application 2007-02-23

Migrating system software from GPIB to LAN/LXI (AN 1465-25) - Application Note 
Migrating system software from GPIB to LAN/LXIis the sixth application note in a series designed to help you manage the shift to LXI from GPIB.

Notes d’application 2007-02-02

Using Synthetic Instruments in Your Test System (AN 1465-24) 
This note represents a brief history of SI, compares a rack-and-stack system to an SI-based system, descibes the initial applications of SIs, and illustrates the emulation of conventional instruments with SIs.

Notes d’application 2006-08-28

Next-generation Test Systems: Advancing the Vision with LXI - Application Note 
This white paper provides an introduction to LXI, presents its advantages, and outlines usage models that expand the reach and capabilities-and perhaps the definition of test systems.

Notes d’application 2006-05-03

Using LAN in Test Systems: Applications (1465-14) - Application Note and Example Programs 
Topics include balancing cost, convenience and security in three common LAN scenarios: sharing instruments, remote monitoring and data acquisition, and functional test systems. Includes downloadable example programs.

Notes d’application 2005-04-01

 
Test-System Understanding Drivers and Direct I/O (AN 1465-3) - Application Note 
This application note answers common questions about the use of drivers and direct I/O to send commands from a PC application to the test instrument.

Notes d’application 2004-12-21

PDF PDF 374 KB
Using SCPI and Direct I/O vs. Drivers (AN 1465-13) - Application Note 
Using SCPI and Direct I/O vs. Drivers, the fifth note in the series, outlines the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems

Notes d’application 2004-12-13

PDF PDF 408 KB
Test-System Computer I/O Considerations (AN 1465-2) - Application Note 
The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing

Notes d’application 2004-12-09

PDF PDF 189 KB
Using USB in the Test and Measurement Environment (AN 1465-12) - Application Note 
Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today for connecting modern instrumentation to computers are GPIB, LAN, and USB.

Notes d’application 2004-11-19

PDF PDF 194 KB
System Developer Guide Using LAN in Test Systems - PC Configuration (AN 1465-11) - Application Note 
Using LAN in Test Systems: PC Configuration,the third note in the series, describes the additional capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.

Notes d’application 2004-10-19

PDF PDF 204 KB
Using LAN in Test Systems - Network Configuration (AN 1465-10) - Application Note 
The decision to use LAN in a test system delivers important benefits to your company and your team. From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking

Notes d’application 2004-09-14

Using LAN in Test Systems - The Basics (AN 1465-9) - Application Note 
The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.

Notes d’application 2004-07-29

PDF PDF 270 KB
CDPD MDBS Cell Site Test Software Troubleshooting 
This Product Note is a troubleshooting guide designed to answer the most problematic and typical questions that occur when testing a CDPD MDBS with the Keysight Technologies 8921A CDPD test solution. General situations Data collection does not work A parameter you changed does not...

Notes d’application 1997-06-01

PDF PDF 102 KB