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BT2152A Self-Discharge Analyzer - Data Sheet 
The BT2152A provides revolutionary reduction in the time required to discern good vs. bad cell self-discharge performance in manufacturing.

Data Sheet 2017-07-18

PDF PDF 2.63 MB
Drive Down the Cost of Test Using the ENA Series Vector Network Analyzers - Application Note 
Discussion of the contributions of the Keysight ENA series vector network analyzer to drive down the cost of test in production lines. Including an in depth analysis of the total cost of ownership.

Application Note 2017-07-05

PDF PDF 2.47 MB
Network Analyzer - Selection Guide 
Provides an overview of Keysight’s network analyzer families, recommended solutions for various applications, related network analyzer products, and a comparison of specifications and features.

Selection Guide 2017-06-21

SystemVue Electronic System-Level (ESL) Design Software 
SystemVue ESL design software is a multi-domain modeling implementation and verification cockpit for electronic system-level (ESL) design.

Brochure 2017-06-20

PDF PDF 1.67 MB
BT2191A Self-Discharge Measurement System - Data Sheet 
The BT2191A Li-Ion cell self-discharge measurement system characterizes self-discharge current much faster, with a powerful software for control, graphing, logging and storage.

Data Sheet 2017-06-19

CX3300 Series Device Current Waveform Analyzer - Data Sheet 
The CX3300 series is the world's first instrument that can precisely visualize low-level current waveforms you have never seen before by 14/16-bit dynamic range, max. 200 MHz bandwidth and low noise.

Data Sheet 2017-06-19

i3070 Series 5i Inline In-Circuit Test System – Data Sheet 
Keysight’s i3070 Series 5i Inline In-Circuit Test system is SMEMA-compliant and designed to bring you all the industry-leading ICT technologies into your fully automated manufacturing line.

Data Sheet 2017-06-15

Power Products Solutions - Selection Guide 
This selection guide will help you select the right DC power supply for your application (for example, bench power supply, specialized requirements or more complex requirements).

Brochure 2017-06-13

PDF PDF 2.94 MB
E5052B Signal Source Analyzer - Data Sheet 
This 21-page data sheet provides technical specifications for the E5052B (10 MHz to 7 GHz) signal source analyzer and the E5053A Downconverter (3 GHz to 26.5 GHz). The E5052B is a single-instrument solution that offers an indispensable set of measurement functions for evaluating RF & microwave signal sources such as VCOs, crystal oscillators, SAW oscillators, dielectric resonator oscillators, YIG oscillators, PLL synthesizers, RFICs, and L.O. circuits.

Data Sheet 2017-06-12

PDF PDF 2.11 MB
5DX Windows 7 Controller Upgrade - Flyer 
Upgrade your 5DX AXI PC controller to enjoy better inspection performance.

Brochure 2017-06-09

PDF PDF 159 KB
FieldFox Handheld Analyzers 4/6.5/9/14/18/26.5/32/44/50 GHz - Data Sheet 
This data sheet provides the specified and typical performance of the FieldFox family of portable analyzers. This guide should be used in conjunction with technical overviews and configuration guide.

Data Sheet 2017-06-01

Early Design Review or Boundary Scan in Enhancing Testability and Optimazation of Test Strategy 
With complexities of PCB design scaling and manufacturing processes adopting to environmentally friendly practices raise challenges in ensuring structural quality of PCBs.

Article 2017-05-08

PDF PDF 624 KB
M9393A PXIe Performance Vector Signal Analyzer - Data Sheet 
This document provides the technical specifications and characteristics for the M9393A PXIe performance vector signal analyzer.

Data Sheet 2017-04-29

Real-Time Near-Field Cell Phone Antenna Measurements 
Co-branded Solutions Partner brochure with EMSCAN on Real-Time Near-Field Cell Phone Antenna Measurements.

Brochure 2017-04-20

PDF PDF 575 KB
TestExec SL 8.1 - Data Sheet 
TestExec SL is a test executive software designed for high-volume, high throughput functional test applications across multiple industries.

Data Sheet 2017-04-12

PDF PDF 1023 KB
Making Conducted and Radiated Emissions Measurements - Application Note 
This application note provides an overview of radiated and conducted emissions measurements as well as a methodology for EMI precompliance testing.

Application Note 2017-04-10

Expanding IEEE Std 1149.1 Boundary-Scan Architecture Beyond Manufacturing Test of PCBA 
This paper will discuss the expanded use of boundary-scan testing beyond the typical manufacturing test to capture structural defects on a components/devices in a Printed Circuit Board Assembly (PCBA)

Article 2017-04-01

PDF PDF 860 KB
Limited Parts Agreement 
Keysight understands these difficult challenges that manufacturers face, and has designed the Limited Parts Agreement – a new affordably-priced supportprogram targeting our customers’ special needs.

Brochure 2017-03-28

PDF PDF 589 KB
i3070 In-Circuit Test System Onsite Agreement - Data Sheet 
Keysight's system onsite agreement provides short term rental of the i3070 system, preconfigured according to the customer’s needs, together with the latest hardware and software.

Data Sheet 2017-03-22

PDF PDF 728 KB
Electronic Components Tolerance and Test Limits for In-Circuit Test - Technical Overview 
In order for all assembled components to function correctly, components are measured and analyzed electrically using the In-circuit tester to ensure its value and performance are optimal.

Technical Overview 2017-03-10

PDF PDF 634 KB
PXI and AXIe Products and Solutions Catalog 
Catalog for PXI and AXIe Products and Solutions

Catalog 2017-03-08

PDF PDF 5.84 MB
Precise Current Profile Measurements of Bluetooth® Low Energy Devices using the CX3300  
The CX3300 enables you to precisely visualize wide-band and low-level current waveforms and make quantitative evaluations of current waveforms, while reducing the power consumption of BLE devices.

Application Note 2017-03-03

Precise Current Measurements of MCU Power-Saving Mode Transition using the CX3300 
The CX3300 enables you to easily and accurately visualize wide-band and low-level current waveforms of the MCU power-saving mode transition.

Application Note 2017-03-03

Accurate Current Waveform Measurements of Non Volatile Memory Devices using the CX3300 
This application describes CX3300 enabling you to easily and accurately visualize never before seen true transient current waveform of NVM materials and devices.

Application Note 2017-03-03

x1149 Boundary Scan Solution for Blade Server Board - Application Note 
This application note describes in detail what the Keysight x1149 Boundary Scan Analyzer performs during the Integrity test.

Application Note 2017-03-02

PDF PDF 6.17 MB

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