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BT2152A Self-Discharge Analyzer - Data Sheet 
The BT2152A provides revolutionary reduction in the time required to discern good vs. bad cell self-discharge performance in manufacturing.

데이터시트 2017-07-18

PDF PDF 2.63 MB
Drive Down the Cost of Test Using the ENA Series Vector Network Analyzers - Application Note 
Discussion of the contributions of the Keysight ENA series vector network analyzer to drive down the cost of test in production lines. Including an in depth analysis of the total cost of ownership.

어플리케이션 노트 2017-07-05

PDF PDF 2.47 MB
Network Analyzer - Selection Guide 
Provides an overview of Keysight’s network analyzer families, recommended solutions for various applications, related network analyzer products, and a comparison of specifications and features.

선택 가이드 2017-06-21

SystemVue Electronic System-Level (ESL) Design Software 
SystemVue ESL design software is a multi-domain modeling implementation and verification cockpit for electronic system-level (ESL) design.

브로셔 2017-06-20

PDF PDF 1.67 MB
CX3300 Series Device Current Waveform Analyzer - Data Sheet 
The CX3300 series is the world's first instrument that can precisely visualize low-level current waveforms you have never seen before by 14/16-bit dynamic range, max. 200 MHz bandwidth and low noise.

데이터시트 2017-06-19

BT2191A Self-Discharge Measurement System - Data Sheet 
The BT2191A Li-Ion cell self-discharge measurement system characterizes self-discharge current much faster, with a powerful software for control, graphing, logging and storage.

데이터시트 2017-06-19

i3070 Series 5i Inline In-Circuit Test System – Data Sheet 
Keysight’s i3070 Series 5i Inline In-Circuit Test system is SMEMA-compliant and designed to bring you all the industry-leading ICT technologies into your fully automated manufacturing line.

데이터시트 2017-06-15

E5052B Signal Source Analyzer - Data Sheet 
This 21-page data sheet provides technical specifications for the E5052B (10 MHz to 7 GHz) signal source analyzer and the E5053A Downconverter (3 GHz to 26.5 GHz). The E5052B is a single-instrument solution that offers an indispensable set of measurement functions for evaluating RF & microwave signal sources such as VCOs, crystal oscillators, SAW oscillators, dielectric resonator oscillators, YIG oscillators, PLL synthesizers, RFICs, and L.O. circuits.

데이터시트 2017-06-12

PDF PDF 2.11 MB
5DX Windows 7 Controller Upgrade - Flyer 
Upgrade your 5DX AXI PC controller to enjoy better inspection performance.

브로셔 2017-06-09

PDF PDF 159 KB
Early Design Review or Boundary Scan in Enhancing Testability and Optimazation of Test Strategy 
With complexities of PCB design scaling and manufacturing processes adopting to environmentally friendly practices raise challenges in ensuring structural quality of PCBs.

기사 2017-05-08

PDF PDF 624 KB
M9393A PXIe Performance Vector Signal Analyzer - Data Sheet 
This document provides the technical specifications and characteristics for the M9393A PXIe performance vector signal analyzer.

데이터시트 2017-04-29

TestExec SL 8.1 - Data Sheet 
TestExec SL is a test executive software designed for high-volume, high throughput functional test applications across multiple industries.

데이터시트 2017-04-12

PDF PDF 1023 KB
Making Conducted and Radiated Emissions Measurements - Application Note 
This application note provides an overview of radiated and conducted emissions measurements as well as a methodology for EMI precompliance testing.

어플리케이션 노트 2017-04-10

Expanding IEEE Std 1149.1 Boundary-Scan Architecture Beyond Manufacturing Test of PCBA 
This paper will discuss the expanded use of boundary-scan testing beyond the typical manufacturing test to capture structural defects on a components/devices in a Printed Circuit Board Assembly (PCBA)

기사 2017-04-01

PDF PDF 860 KB
Limited Parts Agreement 
Keysight understands these difficult challenges that manufacturers face, and has designed the Limited Parts Agreement – a new affordably-priced supportprogram targeting our customers’ special needs.

브로셔 2017-03-28

PDF PDF 589 KB
i3070 In-Circuit Test System Onsite Agreement - Data Sheet 
Keysight's system onsite agreement provides short term rental of the i3070 system, preconfigured according to the customer’s needs, together with the latest hardware and software.

데이터시트 2017-03-22

PDF PDF 728 KB
Electronic Components Tolerance and Test Limits for In-Circuit Test - Technical Overview 
In order for all assembled components to function correctly, components are measured and analyzed electrically using the In-circuit tester to ensure its value and performance are optimal.

기술 개요 2017-03-10

PDF PDF 634 KB
FieldFox 핸드형 분석기 4/6.5/9/14/18/26.5/32/44/50GHz - 데이터 시트 (영어) 
이 데이터 시트는 FieldFox 휴대용 분석기 제품군의 명시된 일반적인 성능을 제공합니다. 이 가이드는 기술 개요 및 구성 가이드와 함께 사용해야 합니다.

데이터시트 2017-03-10

모듈형 솔루션 카탈로그 (한글판) 
모듈형 솔루션 카탈로그 (한글판)

카탈로그 2017-03-08

PDF PDF 4.88 MB
PXI and AXIe Products and Solutions Catalog 
Catalog for PXI and AXIe Products and Solutions

카탈로그 2017-03-08

PDF PDF 5.84 MB
Accurate Current Waveform Measurements of Non Volatile Memory Devices using the CX3300 
This application describes CX3300 enabling you to easily and accurately visualize never before seen true transient current waveform of NVM materials and devices.

어플리케이션 노트 2017-03-03

Precise Current Measurements of MCU Power-Saving Mode Transition using the CX3300 
The CX3300 enables you to easily and accurately visualize wide-band and low-level current waveforms of the MCU power-saving mode transition.

어플리케이션 노트 2017-03-03

Precise Current Profile Measurements of Bluetooth® Low Energy Devices using the CX3300  
The CX3300 enables you to precisely visualize wide-band and low-level current waveforms and make quantitative evaluations of current waveforms, while reducing the power consumption of BLE devices.

어플리케이션 노트 2017-03-03

x1149 Boundary Scan Solution for Blade Server Board - Application Note 
This application note describes in detail what the Keysight x1149 Boundary Scan Analyzer performs during the Integrity test.

어플리케이션 노트 2017-03-02

PDF PDF 6.17 MB
Understanding x1149 Integrity Test - Application Note 
This application note describes in detail what the Keysight x1149 Boundary Scan Analyzer performs during the Integrity test.

어플리케이션 노트 2017-02-16

PDF PDF 2.48 MB

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