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При внедрении цифровых стандартов каждая смена поколений выдвигает новые серьезные риски. Мы знаем это из первых рук, создавая свои продукты и непосредственно работая с инженерами — такими, как Вы. Решения Keysight для тестирования высокоскоростных цифровых устройств представляют собой сочетание измерительных приборов и профессионального опыта, основанного на нашем постоянном сотрудничестве со специалистами отрасли. Делясь своими последними достижениями, мы помогаем более эффективно решать стоящие перед вами проблемы и быстрее создавать продукты, которыми вы могли бы гордиться.

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Обеспечение целостности сигналов при разработке высокоскоростных цифровых устройств: рекомендации по применению, демонстрационные видеоролики и другие полезные материалы.

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Infiniium Z-Series Oscilloscopes - Data Sheet 
Keysight's Infiniium Z-Series oscilloscopes feature up to 63 GHz of real-time oscilloscope bandwidth and the industry's leading noise and jitter measurement floors.

Техническая информация 2017-07-17

Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Информационный бюллетень 2017-07-07

 
Time & Frequency Domain Simulation-to-Measurement Techniques by Mike Resso 
This presentation discusses a step-by-step process that signal integrity engineers can follow to ensure their success in designing with USB Type-C devices.

Демонстрация 2017-06-18

 
Sierra Circuits Interviews Heidi Barnes at DesignCon 
During DesignCon 2017, Sierra Circuits interviewed Heidi Barnes, Senior Applications Engineer at Keysight Technologies and recipient of the DesignCon Engineer of the Year Award.

Демонстрация 2017-06-07

 
S-parameters: Signal Integrity Analysis in the Blink of an Eye 
This article discusses new concepts for serial link design and analysis as applied to physical layer test and measurement techniques. Novel test fixtures and signal integrity software tools will be discussed in real world applications in the form of design case studies.

Статья 2017-05-30

 
Power Integrity Ecosystem by Heidi Barnes from Keysight  
This Power Integrity overview provides an understanding of power integrity, why it is important, how to design for it, and it teaches techniques for high-fidelity simulation, analysis and measurement.

Демонстрация 2017-05-29

 
The Melting Trace Paradox 
Unlike other famous paradoxes such as the Zeno’s paradox, where Achilles and the Tortoise are involved, the melting trace paradox is one with a segment of copper trace and a current source.

Статья 2017-05-24

 
N5990A Test Automation Software Platform - Data Sheet 
An efficient test strategy is a proven competitive advantage. Keysight's N5990A Test Automation Software Platform is a key element of winning strategies.

Техническая информация 2017-05-04

PDF PDF 5.37 MB
Master 400G - Free Poster on 400 Gb/s Technologies 
This poster gives you a broad overview on all the new evolving standards for your path to 400Gb/s- in core fiber networks and data centers, for electrical and optical interconnects

Брошюра 2017-05-03

 
Keysight Technologies to Present a Vision for 5G Evolution at WAMICON 2017  
Keysight experts will be at WAMICON 2017, an annual IEEE Wireless and Microwave Conference, to discuss everything from circuit-level modeling to system verification for general RF, microwave, millimeter wave for 4G, emerging 5G communications, and aerospace & defense.

Материалы для прессы 2017-04-10

 
How to Design for Power Integrity: DC-DC Converter Modeling and Simulation 
This video describes how to create an accurate DC-DC Converter measurement based model (MBM) from just a few simple measurements.

Видеоролики, демонстрирующие решение прикладных задач 2017-04-07

 
Download the 2017 Lightwave Catalog 
The catalog for high-performance optical T&M solutions provides information on test applications and test equipment for core fiber networks and data centers.

Каталог 2017-03-31

 
W1714 SystemVue AMI Modeling Kit, W1713 SystemVue SerDes Model Library  
This datasheet provides an overview of the W1714 SystemVue AMI Modeling Kit, which consists of SerDes libraries for SystemVue plus automatic IBIS AMI model generation.

Техническая информация 2017-03-21

Ensuring High Signal Quality in PCIe Gen3 Channels 
This Signal Integrity Journal article written by Keysight engineer, Anil Kumar Pandey includes the challenges of maintaining transmission channel signal quality in today's PCIe Gen3 Channels.

Статья 2017-03-14

 
Electronic Components Tolerance and Test Limits for In-Circuit Test - Technical Overview 
In order for all assembled components to function correctly, components are measured and analyzed electrically using the In-circuit tester to ensure its value and performance are optimal.

Обзор технических характеристик 2017-03-10

PDF PDF 634 KB
Accurate Statistical-Based DDR4 Margin Estimation Using SSN Induced Jitter Model 
This paper proposes a methodology, that improves the accuracy of DDR4 statistical simulation, by using the mask correction factor.

Журнал 2017-03-04

 
Method of Implementation (MOI) for USB Type-C Cable/Adapter Assembly High Speed Compliance Test 
Keysight Method of Implementation (MOI) for USB Type-C to Type-C Cable, Type-C to Legacy Cable, Type-C to Legacy Adapter Assembly High Speed Compliance Test Using Keysight M937xA PXIe Multiport VNA

Руководство по применению 2017-02-24

PDF PDF 4.66 MB
Method of Implementation (MOI) for USB Type-C Cable Assembly Low Speed Compliance Test 
Keysight Method of Implementation (MOI) for USB Type-C to Type-C Cable Assembly Low Speed Compliance Test Using Keysight M937xA PXIe Multiport VNA

Руководство по применению 2017-02-24

PDF PDF 2.91 MB
Heidi Barnes: DesignCon 2017 Engineer of the Year 
EDN Network's Martin Rowe interviews Heidi Barnes, DesignCon 2017 Engineer of the Year.

Статья 2017-02-23

 
Signal and Power Integrity Products & Options Summary  
Signal and Power Integrity Products & Options Summary

Руководство по выбору продуктов 2017-02-22

 
B4621B Bus Decoder for DDR2, DDR3, or DDR4 Debug and Validation - Data Sheet 
The B4621B protocol-decode software translates acquired signals into easily understood bus transactions showing associated data bursts for double- edge data-rate captures up to 2.5 Gb/s.

Техническая информация 2017-02-21

PDF PDF 1.10 MB
Keysight Technologies Announces Heidi Barnes as the 2017 DesignCon Engineer of the Year 
Keysight is proud to announce that Heidi Barnes, a senior applications engineer for Keysight EEsof EDA's high-speed digital applications, was today announced as the 2017 DesignCon Engineer of the Year.

Материалы для прессы 2017-02-02

 
IBIS-AMI Modeling of Asynchronous High Speed Link Systems 
DesignCon 2017 - This paper proposes a modified IBIS-AMI model simulation flow for asynchronous link systems.

Руководство по применению 2017-01-31

PDF PDF 1.38 MB
Accurate Statistical-Based DDR4 Margin Estimation using SSN Induced Jitter Model 
DesignCon 2017 - This paper proposes a methodology, that improves the accuracy of DDR4 statistical simulation, by using a mask correction factor.

Руководство по применению 2017-01-31

PDF PDF 2.10 MB
Signal Integrity Analysis and Compliance Test of PCIe Gen3 Serial Channel with IBIS-AMI 
DesignCon 2017 - In this paper, signal integrity analysis and compliance testing of a complete PCIe Gen3 channel with IBIS-AMI models is presented.

Руководство по применению 2017-01-31

PDF PDF 1.52 MB

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