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При внедрении цифровых стандартов каждая смена поколений выдвигает новые серьезные риски. Мы знаем это из первых рук, создавая свои продукты и непосредственно работая с инженерами — такими, как Вы. Решения Keysight для тестирования высокоскоростных цифровых устройств представляют собой сочетание измерительных приборов и профессионального опыта, основанного на нашем постоянном сотрудничестве со специалистами отрасли. Делясь своими последними достижениями, мы помогаем более эффективно решать стоящие перед вами проблемы и быстрее создавать продукты, которыми вы могли бы гордиться.

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Обеспечение целостности сигналов при разработке высокоскоростных цифровых устройств: рекомендации по применению, демонстрационные видеоролики и другие полезные материалы.

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W1714 SystemVue AMI Modeling Kit, W1713 SystemVue SerDes Model Library  
This datasheet provides an overview of the W1714 SystemVue AMI Modeling Kit, which consists of SerDes libraries for SystemVue plus automatic IBIS AMI model generation.

Техническая информация 2017-03-21

Ensuring High Signal Quality in PCIe Gen3 Channels 
This Signal Integrity Journal article written by Keysight engineer, Anil Kumar Pandey includes the challenges of maintaining transmission channel signal quality in today's PCIe Gen3 Channels.

Статья 2017-03-14

 
Electronic Components Tolerance and Test Limits for In-Circuit Test - Technical Overview 
In order for all assembled components to function correctly, components are measured and analyzed electrically using the In-circuit tester to ensure its value and performance are optimal.

Обзор технических характеристик 2017-03-10

PDF PDF 634 KB
Accurate Statistical-Based DDR4 Margin Estimation Using SSN Induced Jitter Model 
This paper proposes a methodology, that improves the accuracy of DDR4 statistical simulation, by using the mask correction factor.

Журнал 2017-03-04

 
Method of Implementation (MOI) for USB Type-C Cable/Adapter Assembly High Speed Compliance Test 
Keysight Method of Implementation (MOI) for USB Type-C to Type-C Cable, Type-C to Legacy Cable, Type-C to Legacy Adapter Assembly High Speed Compliance Test Using Keysight M937xA PXIe Multiport VNA

Руководство по применению 2017-02-24

PDF PDF 4.66 MB
Method of Implementation (MOI) for USB Type-C Cable Assembly Low Speed Compliance Test 
Keysight Method of Implementation (MOI) for USB Type-C to Type-C Cable Assembly Low Speed Compliance Test Using Keysight M937xA PXIe Multiport VNA

Руководство по применению 2017-02-24

PDF PDF 2.91 MB
Heidi Barnes: DesignCon 2017 Engineer of the Year 
EDN Network's Martin Rowe interviews Heidi Barnes, DesignCon 2017 Engineer of the Year.

Статья 2017-02-23

 
Signal and Power Integrity Products & Options Summary  
Signal and Power Integrity Products & Options Summary

Руководство по выбору продуктов 2017-02-22

 
B4621B Bus Decoder for DDR2, DDR3, or DDR4 Debug and Validation - Data Sheet 
The B4621B protocol-decode software translates acquired signals into easily understood bus transactions showing associated data bursts for double- edge data-rate captures up to 2.5 Gb/s.

Техническая информация 2017-02-21

PDF PDF 1.10 MB
Infiniium Z-Series Oscilloscopes - Data Sheet 
Keysight's Infiniium Z-Series oscilloscopes feature up to 63 GHz of real-time oscilloscope bandwidth and the industry's leading noise and jitter measurement floors.

Техническая информация 2017-02-18

Keysight Technologies Announces Heidi Barnes as the 2017 DesignCon Engineer of the Year 
Keysight is proud to announce that Heidi Barnes, a senior applications engineer for Keysight EEsof EDA's high-speed digital applications, was today announced as the 2017 DesignCon Engineer of the Year.

Материалы для прессы 2017-02-02

 
IBIS-AMI Modeling of Asynchronous High Speed Link Systems 
DesignCon 2017 - This paper proposes a modified IBIS-AMI model simulation flow for asynchronous link systems.

Руководство по применению 2017-01-31

PDF PDF 1.38 MB
Non-Destructive Analysis and EM Model Tuning of PCB Signal Traces using the Beatty Standard 
DesignCon 2017 - This paper shows how, using a simple resonant test structure like the Beatty standard on a PCB, it is possible to verify the as-manufactured parameters and tune the PCB simulation model.

Руководство по применению 2017-01-31

PDF PDF 6.02 MB
Signal Integrity Analysis and Compliance Test of PCIe Gen3 Serial Channel with IBIS-AMI 
DesignCon 2017 - In this paper, signal integrity analysis and compliance testing of a complete PCIe Gen3 channel with IBIS-AMI models is presented.

Руководство по применению 2017-01-31

PDF PDF 1.52 MB
Accurate Statistical-Based DDR4 Margin Estimation using SSN Induced Jitter Model 
DesignCon 2017 - This paper proposes a methodology, that improves the accuracy of DDR4 statistical simulation, by using a mask correction factor.

Руководство по применению 2017-01-31

PDF PDF 2.10 MB
IBIS-AMI Modeling and Simulation of Link Systems using Duobinary Signaling 
DesignCon 2017 - In this paper, an extension to the IBIS AMI standard to include duobinary signal modeling and simulation is proposed.

Руководство по применению 2017-01-31

PDF PDF 1.67 MB
End-to-End System-Level Simulations with Repeaters for PCIe Gen4: A How-To Guide 
DesignCon 2017 - The paper describes how to quickly and effectively evaluate the end-to-end link performance of a PCI-Express Gen-4 link involving a Root Complex, a Repeater, and an End Point.

Руководство по применению 2017-01-31

PDF PDF 1.51 MB
Characterization of DDR4 Receiver Sensitivity Impact on Post-equalization Eye 
DesignCon 2017 - This paper explores a new approach to analyze channel jitter beyond the traditional eye mask approach.

Руководство по применению 2017-01-31

PDF PDF 1.75 MB
Keysight to Address IoT, Digital, RF Test Challenges at embedded world 2017 
Keysight Technologies announces it will exhibit a number of new products at the embedded world 2017 (www.embedded-world.de/en), Stand 4-208, ECN, Nuremberg, Germany, March 14–16

Материалы для прессы 2017-01-30

 
N5393F/G PCI Express® 4.0 (Gen4) Software for Infiniium Oscilloscopes - Data Sheet 
The N5393F/G PCI Express electrical performance validation and compliance software provides accurate and automated transmitter testing devices for single and multi lane test setup reducing test time.

Техническая информация 2017-01-25

PDF PDF 1008 KB
Keysight Technologies Addresses 400G/PAM-4 Test Challenges at DesignCon 2017 
See the latest design and test solutions solve today’s toughest measurement challenges and accelerate new product development.

Материалы для прессы 2017-01-17

 
Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity - Application Note 
Make the most accurate digital measurements by learning how to evaluate oscilloscope sample rates vs. signal fidelity.

Руководство по применению 2017-01-11

HUAWEI demonstrates 112 Gb/s PAM-4 optical signal transmission with M8196A AWG 
112 Gb/s PAM-4 Optical Signal Transmission over 100-m OM4 Multimode Fiber for High-Capacity Data-Center

Статья 2016-12-05

 
Simplify PAM-4 receiver test with M8040A 64Gbaud BERT – Video 
Overview of the M8040A 64Gbaud high-performance BERT for PAM-4 and NRZ. This video explains target applications and shows key capabilities and output performance.

Демонстрация 2016-11-30

 
How to characterize PAM-4 transmitters 
This video will illustrate how to characterize PAM-4 signals described in standards such as IEEE 802.3bs (200G/400G Ethernet) and the Optical Internetworking Forum-Common Electrical Interface–56G implementation agreement (CEI-56G-XX-PAM4), using the Keysight N109X DCA-M Series of Oscilloscopes.

Демонстрация 2016-11-17

 

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