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Digital Design & Interconnect Standards

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In digital standards, every generational change puts new risks in your path. We see it first hand when creating our products and working with engineers like you. Keysight’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of.

Keysight - Insights for your best design

Achieve signal integrity in high-speed design with these useful tools, demos, videos and more . Learn more about Digital Design & Interconnect solutions from Keysight. 
 

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PCI Express Receiver Testing Responds To New Challenges - Article 
PCI Express Receiver Testing Responds To New Challenges

Article 2015-03-24

 
Keysight Technologies’ Method of Implementation Guide Supports USB 3.1, USB Type-C Connectors, Cable 
eysight Technologies, Inc. (NYSE: KEYS) today announced the availability of its Method of Implementation (MOI) guide for USB 3.1 and USB Type-C Connectors and Cable Assemblies Compliance Testing using the Keysight ENA Series network analyzer's enhanced time domain analysis option (E5071C-TDR).

Press Materials 2015-03-16

 
HDMI 2.0 Source/Sink Impedance Compliance Test - Test Solution Overview Using the ENA Option TDR 
This describes how to make measurements of High-Definition Multimedia Interface (HDMI) 2.0 Source/Sink Impedance Compliance Tests by using the Keysight E5071C ENA Option TDR.

Technical Overview 2015-03-12

PDF PDF 2.14 MB
Analysis of Test Coupon Structures for the Extraction of High Frequency PCB Material Properties - Wh 
Exploration of the addition of Beatty series resonant impedance structures to improve the accuracy of extracting PCB material properties for the purpose of constructing 3D-EM simulations.

Application Note 2015-03-11

PDF PDF 1.73 MB
How to Do Fixture De-embedding to Match Signal Integrity Simulations to Measurements 
This video provides a quick overview of how fixture de-embedding from measurements, or embedding into simulations is a critical step for matching simulations to measurements for physical layer Tx to Rx channels.

How-To Video 2015-03-10

 
Keysight Technologies to Demonstrate Latest EMC Design, Test Tools at EMCSI Symposium 
Keysight announces it will demonstrate and discuss the latest tools and techniques on 1) EMC design and testing, and 2) signal and power integrity at the EMCSI 2015 Symposium, Santa Clara Convention Center, Booth 618, March 17-19.

Press Materials 2015-03-09

 
Digital Design & Interconnect Standards - Brochure 
Brochure shows Agilent’s high-speed digital solution set , a range of essential tools, measurement and simulation—that will help cut through the challenges of gigabit digital designs.

Brochure 2015-03-09

PDF PDF 7.71 MB
N4916B De-emphasis Signal Converter - Data Sheet 
The N4916B de-emphasis signal converter enables R&D and test engineers to accurately characterize gigabit serial ports and channels. The clock doubler option is needed to analyze half-rate clock devices.

Data Sheet 2015-03-05

PDF PDF 2.96 MB
Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

Newsletter 2015-03-04

 
DisplayPort 1.3 Cable-Connector Compliance Test - Test Solution Overview Using the ENA Option TDR 
This describes how to make measurements of VESA DisplayPort 1.3 Cable & Connector Compliance Tests by using the Keysight E5071C ENA Option TDR.

Technical Overview 2015-02-27

PDF PDF 2.17 MB
Keysight Method of Implementation (MOI) for DisplayPort 1.3 Cable-Connector Assembly Compliance Test 
Keysight Method of Implementation (MOI) for DisplayPort 1.3 Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2015-02-27

PDF PDF 1.62 MB
USB 3.1 Gen 2 (10 Gbps) Cable Assembly Test Challenges 
This document describes test challenges for USB 3.1 Gen 2 (10Gbps) cable assemblies.

Technical Overview 2015-02-26

PDF PDF 2.91 MB
B4621B for DDR2, DDR3, or DDR4 Debug and Validation - Data Sheet 
The B4621B protocol-decode software translates Translates acquired signals into easily understood bus transactions showing associated data bursts for double- edge data-rate captures up to 2.5Gb/s.

Data Sheet 2015-02-26

PDF PDF 837 KB
Keysight Method of Implementation (MOI) for USB3.1 Cable-Connector Assembly Compliance Test 
Keysight Method of Implementation (MOI) for USB3.1 Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2015-02-06

PDF PDF 2.90 MB
Method of Implementation (MOI) for USB Type-C to Type-C Cable-Connector Assembly Compliance Test 
Keysight Method of Implementation (MOI) for USB Type-C to Type-C Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2015-02-06

PDF PDF 2.96 MB
Method of Implementation (MOI) for USB Type-C to Legacy Cable-Connector Assembly Compliance Test 
Keysight Method of Implementation (MOI) for USB Type-C to Legacy Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2015-02-06

PDF PDF 2.85 MB
USB Type-C Cable-Connector Assembly Compliance Test -Test Solution Overview Using the ENA Option TDR 
This describes how to make measurements of USB Type-C cable & connector assemblies Compliance Tests by using the Keysight E5071C ENA Option TDR.

Technical Overview 2015-02-06

PDF PDF 4.02 MB
Method of Implementation (MOI) for USB Type-C to Legacy Adapter Assembly Compliance Test 
Keysight Method of Implementation (MOI) for USB Type-C to Legacy Adapter Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2015-02-06

PDF PDF 2.66 MB
USB3.1 Cable-Connector Assembly Compliance Test - Test Solution Overview Using the ENA Option TDR 
This describes how to make measurements of USB 3.1 cable & connector assemblies Compliance Tests by using the Keysight E5071C ENA Option TDR.

Technical Overview 2015-02-06

PDF PDF 3.42 MB
PCI Express® Design and Test from Electrical to Protocol - Brochure 
Thoroughly characterize and validate PCI Express designs with Keysight's PCI Express design and test solutions from electrical to protocol.

Brochure 2015-02-03

PDF PDF 3.75 MB
In-Circuit Test Suite - Brochure 
Latest board and functional test solutions to help electronics manufacturers achieve better product quality withmore comprehensive test coverage.

Brochure 2015-02-01

PDF PDF 8.51 MB
HDMI and DisplayPort Design and Test – A Better Way - Brochure 
Brochure covering Keysight’s HDMI and Displayport test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.

Brochure 2015-01-23

PDF PDF 11.70 MB
J-BERT N4903B High-Performance Serial BERT - Data Sheet 
Updated J-BERT N4903B data sheet revision 1.3. Especially PCIe3 related enhancements covered by our PR in Jan 2013. Also covers all enhancements since SW releases 6.80 to 7.40

Data Sheet 2015-01-14

Keysight Technologies Exhibits High-Speed Digital Design and Test Solutions at DesignCon 
Keysight announces that it will exhibit its high-speed digital solutions at DesignCon 2015, Booth 725, Santa Clara Convention Center, Jan. 28-29.

Press Materials 2015-01-12

 
ADS W2302EP/ET, W2500EP/ET, and W2312EP/ET Transient Convolution Products 
Advanced Design System W2302EP/ET Transient Convolution Element, W2500EP/ETTransient Convolution GT Option, and W2312EP/ET Transient Convolution Distributed Computing 8-pack

Brochure 2014-12-30

PDF PDF 1.16 MB

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