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Digital Design & Interconnect Standards

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In digital standards, every generational change puts new risks in your path. We see it first hand when creating our products and working with engineers like you. Keysight’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of.

Keysight - achieve your best design

Achieve signal integrity in high-speed design with these useful tools, demos, videos and more

 

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Method of Implementation (MOI) for HEAC Cable Assembly Test 
Method of Implementation (MOI) for HEAC Cable Assembly Test Using Keysight E5071C ENA Network Analyzer Option TDR.

应用说明 2014-10-20

PDF PDF 1.93 MB
N5980A 3.125 Gb/s Serial BERT - Data Sheet 
The Keysight Technologies, Inc. N5980A 3.125 Gb/s Serial BERT is ideal for manual or automated manufacturing test of electrical and optical devices running at speeds between 125 Mb/s to 3.125 Gb/s.

产品资料 2014-10-17

Design Challenges in DDR4 - The Keysight DDR Bus Simulator 
This video is about design challenges in DDR4 and in particular the DDR Bus Simulator, which is a new Keysight EEsof EDA simulation tool for DDR4 and beyond.

基本演示 2014-10-16

 
Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

内部通讯 2014-10-14

 
Keysight Technologies Demonstrates Simulation, Debug, Validation and Test Solutions at MemCon 
Keysight announces it will demonstrate solutions that provide simulation, debug, validation and test for the fastest speed memory designs at MemCon, Santa Clara Convention Center, Booth102, Santa Clara, Calif., Oct. 15.

新闻资料 2014-10-13

 
MIPI™ Phy S-Param & Impedance Conformance Test - Test Solution Overview Using the ENA Option TDR 

技术总览 2014-10-10

PDF PDF 3.58 MB
Method of Implementation(MOI) for MIPI D-PHY Interface S-Parameter and Impedance Conformance Tests 
Keysight Method of Implementation (MOI) for MIPI D-PHY Interface S-Parameter and Impedance Conformance Tests Using Keysight E5071C ENA Network Analyzer Option TDR

应用说明 2014-10-10

PDF PDF 1.07 MB
DDR Compliance Integration with Advanced Design System 
The W2351EP DDR4 Compliance Test Bench helps solve the problem of simulation-measurement correlation.

基本演示 2014-10-03

 
DDR Memory Test Solutions Overview 
This video provides an overview of Keysight's DDR Memory test solutions, from simulation, transmitter compliance, protocol, and probing solutions.

基本演示 2014-10-03

 
Keysight Introduces DDR Bus Simulator to Solve the Bit-Error-Rate Contour Simulation Challenge 
Keysight Technologies introduces the DDR Bus Simulator; the industry’s first tool to generate accurate Bit-Error-Rate (BER) contours for the JEDEC DDR memory bus specification.

新闻资料 2014-09-30

 
USB2.0 Cable-Connector Assembly Compliance Test - Test Solution Overview Using the ENA Option TDR 
This describes how to make measurements of USB 2.0 cable & connector assemblies Compliance Tests by using the Keysight E5071C ENA Option TDR.

技术总览 2014-09-24

PDF PDF 2.33 MB
Keysight Method of Implementation (MOI) for USB2.0 Cable-Connector Assembly Compliance Test 
Keysight Method of Implementation (MOI) for USB2.0 Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

应用说明 2014-09-24

PDF PDF 2.34 MB
High Speed Digital Design and Simulation Videos on YouTube 
Keysight EEsof EDA's High Speed Digital Design and Simulation video playlist on YouTube.

基本演示 2014-08-06

 
Evaluating Oscilloscope Sample Rates vs. Sampling Fidelity - Application Note 
Make the most accurate digital measurements by learning how to evaluate oscilloscope sample rates vs. signal fidelity.

应用说明 2014-08-04

N5411B SATA 6Gb/s Compliance Test Software - Data Sheet 
The N5411B SATA 6Gb/s compliance test software for Infiniium oscilloscopes provides you with a fast and easy way to validate and debug your SATA design

产品资料 2014-08-04

Modeling, Extraction and Verification of VCSEL Model for Optical IBIS AMI 
A technique of modeling and extraction of VCSEL devices for IBIS-AMI has been proposed.

文章 2014-08-04

PDF PDF 1.18 MB
Quick Start for Signal Integrity Design Using Advanced Design System (ADS) – Technical Overview 
This demo guide is a part of the high-speed digital design workflow for signal integrity engineers using Advanced Design System.

技术总览 2014-08-04

PDF PDF 3.82 MB
Keysight EEsof EDA Customer Support - Brochure 
Whether you are a novice or an experienced user, Keysight EEsof EDA’s customer support offerings are designed to help you every step of the way.

手册 2014-08-03

PDF PDF 175 KB
Keysight EEsof EDA Software and Modular Solutions for Universities 
Keysight works in collaboration with universities to provide tools that enable education and research for the engineers of tomorrow. The brochure outlines available programs, software and hardware.

手册 2014-08-03

PDF PDF 1.44 MB
EDA Support Services - Flyer 
Keysight Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.

手册 2014-08-03

PDF PDF 454 KB
RF and Microwave Industry-Ready Student Certification Program - Brochure 
This program confirms a student’s technical knowledge, design expertise, and hands-on measurement proficiency in the use of Keysight EEsof software design tools and Keysight instruments.

手册 2014-08-03

PDF PDF 562 KB
USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note 
This Application Note discusses the solution for the USB 2.0 test suite. The Keysight solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

应用说明 2014-08-03

N5416A and N5417A USB Compliance Test Software for Infiniium Oscilloscopes - Data Sheet 
N5416A provides a fast and reliable way to verify USB electrical specification compliance for USB 2.0 devices, hosts, and hubs.

产品资料 2014-08-03

An Innovative Simulation Workflow for Debugging High-Speed Digital Designs Using Jitter Separation 
This paper presents a new simulation workflow for jitter separation analysis.

应用说明 2014-08-03

Analysis of Test Coupon Structures for the Extraction of High Frequency PCB Material Properties 
Exploration of the addition of Beatty series resonant impedance structures to improve the accuracy of extracting PCB material properties for the purpose of constructing 3D-EM simulations.

应用说明 2014-08-03

PDF PDF 2.19 MB

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