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数字设计和互连标准

数字标准的每次更新换代都会让您的前进道路变得更加崎岖。我们在开发新产品以及与您这样的工程师协作时,对此深有体会。是德科技高速数字测试解决方案系列在我们与业界专家长期合作的基础上,将先进的仪器与广泛的专业技术完美结合。通过分享我们的最新经验,我们可以帮助您预测挑战,加快创造卓越的产品。

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Sierra Circuits Interviews Heidi Barnes at DesignCon 
During DesignCon 2017, Sierra Circuits interviewed Heidi Barnes, Senior Applications Engineer at Keysight Technologies and recipient of the DesignCon Engineer of the Year Award.

基本演示 2017-06-07

 
Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

内部通讯 2017-06-02

 
S-parameters: Signal Integrity Analysis in the Blink of an Eye 
This article discusses new concepts for serial link design and analysis as applied to physical layer test and measurement techniques. Novel test fixtures and signal integrity software tools will be discussed in real world applications in the form of design case studies.

文章 2017-05-30

 
The Melting Trace Paradox 
Unlike other famous paradoxes such as the Zeno’s paradox, where Achilles and the Tortoise are involved, the melting trace paradox is one with a segment of copper trace and a current source.

文章 2017-05-24

 
N5990A Test Automation Software Platform - Data Sheet 
An efficient test strategy is a proven competitive advantage. Keysight's N5990A Test Automation Software Platform is a key element of winning strategies.

产品资料 2017-05-04

PDF PDF 5.37 MB
Master 400G - Free Poster on 400 Gb/s Technologies 
This poster gives you a broad overview on all the new evolving standards for your path to 400Gb/s- in core fiber networks and data centers, for electrical and optical interconnects

手册 2017-05-03

 
Keysight Technologies to Present a Vision for 5G Evolution at WAMICON 2017  
Keysight experts will be at WAMICON 2017, an annual IEEE Wireless and Microwave Conference, to discuss everything from circuit-level modeling to system verification for general RF, microwave, millimeter wave for 4G, emerging 5G communications, and aerospace & defense.

新闻资料 2017-04-10

 
How to Design for Power Integrity: DC-DC Converter Modeling and Simulation 
This video describes how to create an accurate DC-DC Converter measurement based model (MBM) from just a few simple measurements.

视频演示 2017-04-07

 
Download the 2017 Lightwave Catalog 
The catalog for high-performance optical T&M solutions provides information on test applications and test equipment for core fiber networks and data centers.

产品目录 2017-03-31

 
W1714 SystemVue AMI Modeling Kit, W1713 SystemVue SerDes Model Library  
This datasheet provides an overview of the W1714 SystemVue AMI Modeling Kit, which consists of SerDes libraries for SystemVue plus automatic IBIS AMI model generation.

产品资料 2017-03-21

Ensuring High Signal Quality in PCIe Gen3 Channels 
This Signal Integrity Journal article written by Keysight engineer, Anil Kumar Pandey includes the challenges of maintaining transmission channel signal quality in today's PCIe Gen3 Channels.

文章 2017-03-14

 
是德科技轻松测试通过 Type-C™ 运作的 USB 电力传输(PD)系统 
是德科技轻松测试通过 Type-C™ 运作的 USB 电力传输(PD)系统

应用说明 2017-03-10

Electronic Components Tolerance and Test Limits for In-Circuit Test - Technical Overview 
In order for all assembled components to function correctly, components are measured and analyzed electrically using the In-circuit tester to ensure its value and performance are optimal.

技术总览 2017-03-10

PDF PDF 634 KB
Accurate Statistical-Based DDR4 Margin Estimation Using SSN Induced Jitter Model 
This paper proposes a methodology, that improves the accuracy of DDR4 statistical simulation, by using the mask correction factor.

期刊 2017-03-04

 
Method of Implementation (MOI) for USB Type-C Cable/Adapter Assembly High Speed Compliance Test 
Keysight Method of Implementation (MOI) for USB Type-C to Type-C Cable, Type-C to Legacy Cable, Type-C to Legacy Adapter Assembly High Speed Compliance Test Using Keysight M937xA PXIe Multiport VNA

应用说明 2017-02-24

PDF PDF 4.66 MB
Method of Implementation (MOI) for USB Type-C Cable Assembly Low Speed Compliance Test 
Keysight Method of Implementation (MOI) for USB Type-C to Type-C Cable Assembly Low Speed Compliance Test Using Keysight M937xA PXIe Multiport VNA

应用说明 2017-02-24

PDF PDF 2.91 MB
是德科技 校准服务 助您满怀信心地执行测量并成功通过审核 
是德科技 校准服务 助您满怀信心地执行测量并成功通过审核

手册 2017-02-23

PDF PDF 504 KB
Heidi Barnes: DesignCon 2017 Engineer of the Year 
EDN Network's Martin Rowe interviews Heidi Barnes, DesignCon 2017 Engineer of the Year.

文章 2017-02-23

 
Signal and Power Integrity Products & Options Summary  
Signal and Power Integrity Products & Options Summary

选型指南 2017-02-22

 
B4621B Bus Decoder for DDR2, DDR3, or DDR4 Debug and Validation - Data Sheet 
The B4621B protocol-decode software translates acquired signals into easily understood bus transactions showing associated data bursts for double- edge data-rate captures up to 2.5 Gb/s.

产品资料 2017-02-21

PDF PDF 1.10 MB
推动世界科技加速发展 
推动世界科技加速发展

手册 2017-02-16

PDF PDF 5 MB
Keysight Technologies Announces Heidi Barnes as the 2017 DesignCon Engineer of the Year 
Keysight is proud to announce that Heidi Barnes, a senior applications engineer for Keysight EEsof EDA's high-speed digital applications, was today announced as the 2017 DesignCon Engineer of the Year.

新闻资料 2017-02-02

 
IBIS-AMI Modeling of Asynchronous High Speed Link Systems 
DesignCon 2017 - This paper proposes a modified IBIS-AMI model simulation flow for asynchronous link systems.

应用说明 2017-01-31

PDF PDF 1.38 MB
Non-Destructive Analysis and EM Model Tuning of PCB Signal Traces using the Beatty Standard 
DesignCon 2017 - This paper shows how, using a simple resonant test structure like the Beatty standard on a PCB, it is possible to verify the as-manufactured parameters and tune the PCB simulation model.

应用说明 2017-01-31

PDF PDF 6.02 MB
End-to-End System-Level Simulations with Repeaters for PCIe Gen4: A How-To Guide 
DesignCon 2017 - The paper describes how to quickly and effectively evaluate the end-to-end link performance of a PCI-Express Gen-4 link involving a Root Complex, a Repeater, and an End Point.

应用说明 2017-01-31

PDF PDF 1.51 MB

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