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数字设计和互连标准

数字标准的每次更新换代都会让您的前进道路变得更加崎岖。我们在开发新产品以及与您这样的工程师协作时,对此深有体会。是德科技高速数字测试解决方案系列在我们与业界专家长期合作的基础上,将先进的仪器与广泛的专业技术完美结合。通过分享我们的最新经验,我们可以帮助您预测挑战,加快创造卓越的产品。

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是德科技表征 28 Gb/s 收发信机的技巧和先进技术 
是德科技表征 28 Gb/s 收发信机的技巧和先进技术

文章 2016-05-19

PDF PDF 3 MB
Signal Integrity Tips and Techniques Using TDR, VNA and Modeling - Article Reprint  
Time and frequency domain analyses for simulation and measurements provide quick solutions for characterizing signal losses and identifying elements that control performance.

文章 2016-03-31

PDF PDF 644 KB
Solving Electronics Design Challenges of an Aerospace System with EDA Tools  
Microwave Product Digest featured article on solving electronics design challenges of an aerospace system using EDA tools.

文章 2016-03-22

 
Keysight EEsof EDA makes it easy to get back to school—at least virtually 
Rick Nelson, executive editor of Evaluation Engineering, visited Keysight Technologies and had this to say about Keysight EEsof EDA.

文章 2015-09-11

 
Challenges extend from simulation to compliance 
Tami Pippert, Keysight Technologies’ high-speed digital marketing program manager, elaborates on how Keysight is enhancing its model generation, simulation, and data analysis technologies.

文章 2015-07-08

 
Improving IBIS-AMI Model Accuracy: Model-to-Model and Model-to-Lab Correlation Case Studies - Articl 
This DesignCon 2014 paper presents case studies for model-to-model & model-to-lab correlation methods & compares favorable/unfavorable factors for both methods. 10G, 11.5G and 23G SerDes data are used as examples.

文章 2015-04-02

PDF PDF 3.34 MB
PCI Express Receiver Testing Responds To New Challenges - Article 
PCI Express Receiver Testing Responds To New Challenges

文章 2015-03-24

 
Modeling, Extraction and Verification of VCSEL Model for Optical IBIS AMI 
A technique of modeling and extraction of VCSEL devices for IBIS-AMI has been proposed.

文章 2014-08-04

PDF PDF 1.18 MB
Touchstone v2.0 SI/PI S-Parameter Models for Simultaneous Switching Noise (SSN) Analysis of DDR4 
This article reprint presents a methodology to setup and analyze Simultaneous Switching Noise for DDR4 applications using Touchstone v2.0 models.

文章 2014-08-04

PDF PDF 8.20 MB
IBIS AMI Modeling of Retimer and Performance Analysis of Retimer based Active Serial Links 
This paper presents a novel retimer modeling approach based on IBIS-AMI to capture the performance of a retimer that operates up to 15 Gbps.

文章 2014-08-04

PDF PDF 1.88 MB
Mechanism of Jitter Amplification in Clock Channels 
In this paper. jitter amplification in clock channels is analyzed analytically using the techniques developed in "Frequency domain analysis of jitter amplification in clock channels."

文章 2014-08-04

PDF PDF 715 KB
De-Mystifying the 28 Gb/s PCB Channel: Design to Measurement 
This paper demonstrates a design methodology for 28 Gb/s SERDES channels using Xilinx Virtex-7 Tx to show the required trade-offs that enable robust performance that is easy to verify with measurement.

文章 2014-08-04

PDF PDF 2.84 MB
Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale - Application Note 
This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment.

文章 2014-06-14

PDF PDF 515 KB
Tips and Advanced Techniques for Characterizing a 28 Gb/s Transceiver 
This paper shows the right combination of measurement and simulation techniques, and how the previously existing barriers for using de-embedding have been eliminated.

文章 2014-02-18

PDF PDF 3.82 MB
Partner article using ADS: Practical Fiber Weave Effect Modeling -- Lamsim Enterprises, Inc. 
Partner article using ADS: Practical Fiber Weave Effect Modeling -- Lamsim Enterprises, Inc.

文章 2011-01-11

 
Signal Integrity Simulation of PCI Express Gen 2 Channel 
Article reprint from XrossTalk Magazine, Janurary 2009, author Jason Boh.

文章 2009-03-23

PDF PDF 1.81 MB
Exploring The Test Requirements For DisplayPort Receivers 
Exploring The Test Requirements For DisplayPort Receivers

文章 2008-01-28

PDF PDF 543 Bytes
Signal Integrity Analysis and Simulation Tools include IBIS Models 
This Article describes the types of models that need to be taken together for high-speed signal integrity analysis, and illustrates their use in a simulation of a high-speed memory circuit.

文章 2004-09-01

PDF PDF 411 KB