Digital Design & Interconnect Standards
In digital standards, every generational change puts new risks in your path. We see it first hand when creating our products and working with engineers like you. Keysight’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of.
Keysight - Insights for your best design
Learn more about Digital Design & Interconnect solutions from Keysight.
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- Design and Simulation of High-Speed Digital (3)
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- MIPI Design & Tests (1)
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How to Design for Power Integrity: Selecting a VRM
This video explains why you should avoid Voltage mode VRMs and shunt compensation for the VRM Error Amplifier. The better performance of a current mode VRM with series compensation for the Error Amplifier is clearly demonstrated with simulations and measurements.
How-To Video 2016-05-05
How to Design for Power Integrity: Finding Power Delivery Noise Problems
This video provides an understanding of how the voltage regulator module (VRM) interacts with the printed circuit board planes and decoupling capacitors within a power distribution network (PDN). A well designed PDN provides optimum system performance while a poorly matched designed PDN can result in poor system performance. In the extreme case, rogue waves can occur within the PDN generating much higher voltage noise levels than expected, potentially interfering with system performance or resulting in permanent damage. Recommendations for keeping the impedance flat are also provided.
How-To Video 2015-06-05
How to Do Fixture De-embedding to Match Signal Integrity Simulations to Measurements
This video provides a quick overview of how fixture de-embedding from measurements, or embedding into simulations is a critical step for matching simulations to measurements for physical layer Tx to Rx channels.
How-To Video 2015-03-10
Overcoming LTE-Advanced Test Challenges - Inter-Band Carrier Aggregation
This video will explain one of the major test challenges of demodulating the multiple component carriers simultaneously since the frequency band separation in inter-band aggregation is wider than the IF BW of any commercially available signal analyzer. Watch how Keysight addresses this test challenge with the 89600 VSA software along with dual X-Series signal analyzers or N7109A multi-channel signal analyzer.
How-To Video 2012-07-15
Soft Touch Probing Video
Soft Touch Probing Video
How-To Video 2004-05-11
WMF 6.93 MB