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Digital Design & Interconnect Standards

In digital standards, every generational change puts new risks in your path. We see it first hand when creating our products and working with engineers like you. Keysight’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of.

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SATA II Drive TX/RX Testing & Cable SI Testing Using the 86100C DCA-J - Technical Overview 
SATA II Drive Tx/Rx Testing & Cable SI Test using 86100C DCA-J. Product Note 86100-8

Application Note 2014-08-02

PDF PDF 1.94 MB
Practical Application of the InfiniiSim Waveform Transformation Toolset - Application Note 
This final paper puts together the concepts and theory already presented in the preceding papers. It presents and addresses five common problems that confront engineers.

Application Note 2014-08-02

S-parameter Series: Transforming Oscilloscope Acquisitions for De-Embedding, Embedding & Simulating 
This application note is the first in a series of s-parameter application notes and introduces us to signal acquisition and theory.

Application Note 2014-08-02

Simulating High-Speed Serial Channels with IBIS-AMI Models 
This paper reviews some of the benefits and limitations of using IBIS models and introduces the new AMI extensions to the latest IBIS version 5.0 specification.

Application Note 2014-08-01

An Overview of the Electrical Validation of 10BASE-T, 100BASE-TX, and 1000BASE-T - Application Note 
The technology used in these ports, commonly known as “LAN” or “NIC” ports, is usually one of the 10BASE-T, 100BASE-TX, and 1000BASE-T standards or a combination of them.

Application Note 2014-08-01

Strategies for Debugging Serial Bus Systems with Infiniium Oscilloscopes – Application Note 
This application note discusses the challenges associated with and new solutions for debugging serial bus designs including PCI-Express Generation 1, Inter Integrated Circuit (I2C), Serial Peripheral Interface (SPI), or Universal Serial Bus (USB)

Application Note 2014-07-31

Separating Read/Write Signals for DDR DRAM and Controller Validation - Application Note 
To analyze the signal integrity of DDR signals, you need to differentiate the complex traffic on the data bus to independently analyze the signal performance for both DDR chip and memory controller.

Application Note 2014-07-31

PDF PDF 805 KB
USB Design and Test - A Better Way - Application Note 
Brochure covering Keysight's USB 2.0 and 3.0 test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.

Application Note 2014-07-31

Digital Communication Analyzer (DCA), Measure Relative Intensity Noise (RIN) - Application Note 
Digital Communication Analyzer (DCA), Measure Relative Intensity Noise (RIN).

Application Note 2014-07-31

Properly Powering On & Off Multiple Power Inputs in Embedded Designs - Application Note 
This is the first in a series of application notes that addresses power optimization, characterization and simulation challenges in embedded designs.

Application Note 2014-07-31

Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests 
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests Using Keysight E5071C ENA Option TDR

Application Note 2014-04-21

PDF PDF 1.03 MB
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests 
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests Using Keysight E5071C ENA Option TDR

Application Note 2014-04-21

PDF PDF 1.71 MB
Method of Implementation(MOI) for MIPI M-PHY Interface S-Parameter and Impedance Conformance Tests 
Keysight Method of Implementation (MOI) for MIPI M-PHY Interface S-Parameter and Impedance Conformance Tests Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2014-03-20

PDF PDF 978 KB
High Precision Time Domain Reflectometry - Application Note 
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

Application Note 2014-01-23

Measuring Jitter in Digital Systems (AN 1448-1) - Application Brief 
This application note is for R&D designers and engineers working on high-speed digital designs. It addresses jitter measurements in digital circuits, how the different measurement techniques are best applied, and how these decisions may change as the data rates increase.

Application Note 2013-09-16

PDF PDF 1.78 MB
How to Test a MIPI M-PHY High-speed Receiver - Challenges and Keysight Solutions - Application Note 
This application selectively describes critical parts of the MIPI M-Phy-specification and related receiver (RX) tests. It describes the main properties of the M-Phy interface.

Application Note 2013-08-06

PDF PDF 6.63 MB
Keysight Method of Implementation (MOI) for 10GBASE-T Ethernet Cable Tests 
Keysight Method of Implementation (MOI) for 10GBASE-T Cable Tests Using Keysight E5071C ENA Option TDR

Application Note 2013-05-21

PDF PDF 2.13 MB
Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test 
Method of Implementation (MOI) for HDMI 1.4b Cable Assembly Test Using Keysight E5071C ENA Network Analyzer Option TDR.

Application Note 2013-04-24

PDF PDF 2.02 MB
MOI for DisplayPort PHY CTS 1.2b Source Testing  
This document is provided "AS IS" and without any warranty of any kind, including, without limitation, any expressed or implied warranty of non-infringement, merchantability or fitness for a particular purpose. In no event shall VESA™ or any member of VESA be liable for any direct, indirect, special, exemplary, punitive, or consequential damages, including, without limitation, lost profits, even if advised of the possibility of such damages. This material is provided for reference only. VESA does not endorse any vendor’s equipment, including equipment outlined in this document.

Application Note 2013-03-21

PDF PDF 5.63 MB
MOI for DisplayPort PHY CTS 1.2b Sink Tests 
This document is provided "AS IS" and without any warranty of any kind, including, without limitation, any express or implied warranty of non-infringement, merchantability or fitness for a particular purpose. In no event shall VESA™ or any member of VESA be liable for any direct, indirect, special, exemplary, punitive, or consequential damages, including, without limitation, lost profits, even if advised of the possibility of such damages. This material is provided for reference only. VESA does not endorse any vendor’s equipment including equipment outlined in this document.

Application Note 2013-03-21

PDF PDF 7.99 MB
Jitter Measurements on Long Patterns Using 86100DU-401 Advanced Waveform Analysis - Application Note 
To overcome pattern length limitations found in many of today’s jitter analysis tools, Keysight developed a Microsoft Office Excel-based application called 86100DU Option 401 Advanced Waveform Analysis

Application Note 2013-02-21

PDF PDF 3.47 MB
Keysight Method of Implementation (MOI) for DisplayPort1.2b Cable-Connector Assembly Compliance Test 
Keysight Method of Implementation (MOI) for DisplayPort 1.2b Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2013-02-18

PDF PDF 1.29 MB
Keysight Method of Implementation (MOI) for MHL Cables Compliance Tests 
Keysight Method of Implementation (MOI) for MHL Cable Compliance Tests Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2013-02-14

PDF PDF 1.76 MB
DDR4 TdiVW/VdiVW Bit Error Rate Measurement or Understanding Bit Error Rate 
Importance of making BER measurement calculations to form a statistical measurement of total jitter to understand the design's data valid window result and design error rates.

Application Note 2013-01-24

PDF PDF 1.65 MB
Keysight Method of Implementation (MOI) for USB3.0 Cable-Connector Assembly Compliance Test 
Keysight Method of Implementation (MOI) for USB3.0 Cable-Connector Assembly Compliance Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2012-12-17

PDF PDF 1.82 MB

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