Digital Design & Interconnect Standards
In digital standards, every generational change puts new risks in your path. We see it first hand when creating our products and working with engineers like you. Keysight’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of.
Keysight - Insights for your best design
Learn more about Digital Design & Interconnect solutions from Keysight.
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Boundary Scan DFT Guidelines for Good Chain Integrity and Test Coverage - Application Note
This application note provides some key guidelines to enable good design for testability using boundary scan.
Application Note 2016-01-21
PDF 1.99 MB
Configuring Lattice BSCAN2 Scan Path Linker on Keysight x1149 Boundary Scan Analyzer - App Note
A boundary scan linker mux device links multiple boundary scan chains into one single chain or multiple chain configurations. Find out how to configure Lattice BSCAN2 scan path linkers in this paper.
Application Note 2015-10-30
PDF 6.31 MB
A Time-Saving Method for Analyzing Signal Integrity in DDR Memory Buses
This application note covers new tools and measurement techniques for characterizing and validating signal integrity of DDR (double data rate synchronous dynamic random access memory) signals.
Application Note 2008-09-10