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Digital Design & Interconnect Standards

In digital standards, every generational change puts new risks in your path. We see it first hand when creating our products and working with engineers like you. Keysight’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of.

Keysight - Insights for your best design

Learn more about Digital Design & Interconnect solutions from Keysight. 

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1-14 of 14

How to Test USB Type-C Alt Mode and the Standards Running Across It - Application Note 
This application note discusses how Alt mode works with power delivery circuitry to transmit/receive unique data signals/more power, so Type-C can be used for many USB & non-USB, device connections/control.

Application Note 2016-04-29

How to Ensure Interoperability and Compliance of USB Type-C™ Cables and Connectors- Application Note 
Integrating USB Type-C into products, while ensuring interoperability and compliance, is challenging. This measurement brief covers USB Type-C cable and connector design and test solutions.

Application Note 2016-02-29

Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief 
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

Application Note 2015-11-14

Signal Integrity Analysis Series Part 1: Single-Port TDR, TDR/TDT, and 2-Port TDR - Application Note 
This Application Note focuses on part 1: those which use a single-port TDR, those which use TDR/TDT, and those which use 2-port TDR.

Application Note 2015-10-29

One Size Does NOT Fit All - Application Note 
This application note discusses the topic of “One Size Does NOT Fit All” and how test system configurations benefit from a choice of hardware form factors and software products.

Application Note 2015-06-08

How to Test a MIPI M-PHY High-speed Receiver - Challenges and Keysight Solutions - Application Note 
This application selectively describes critical parts of the MIPI M-Phy-specification and related receiver (RX) tests. It describes the main properties of the M-Phy interface.

Application Note 2013-08-06

How to Pass Receiver Test According to PCI Express® 3.0 CEM Specification - Application Brief 
This paper provides insight into the calibration method and tests, as well as the tools available. The biggest change between PCIe 2.x and rev. 3.0 is that RX test on cards will now be normative.

Application Note 2011-11-30

Accurate Calibration of Receiver Stress Test Signals for PCI Express® Rev. 3.0 - Application Note 
This paper describes the calibration of the receiver-stress signal according to the base specification of PCIe3. The calibration of the RX test signal is different from PCIe 2.0.

Application Note 2011-06-22

Boosting PLL Design Efficiency From free-running VCO characterizations to closed-loop PLL evaluation 
This application note describes introduces practical solutions for VCO/PLL performance evaluation and gives actual examples of parameter measurements using the E5052B.

Application Note 2008-11-21

Solutions for MB-OFDM Ultra-Wideband (UWB) Application Note 
Application note describes hardware and software for ultra wideband (UWB) testing.

Application Note 2008-08-10

Signal Integrity Analysis Series Part 3: The ABCs of De-Embedding 
This Application Note focuses on Part 3: The ABCs of De-Embedding explaining different de-embedding techniques & shows how to minimize fixture effects for best results.

Application Note 2007-07-01

Signal Integrity Analysis Series Part 2: 4-Port TDR/VNA/PLTS - Application Note 
This Application Note focuses on part 2: those which use a 4-port TDR/VNA/PLTS.

Application Note 2007-02-21

Understanding FireWire 
New Serial Interface Promises Easier, Faster, and Cheaper Instrument Control Scaleable, flexible, and plug-and-play, FireWire (aka IEEE specification 1394.1995) is an ideal interface to connect...

Application Note 2002-06-27

Functional Test & Data Acquisition I/O Benchmarks 
The following benchmarks compare computer I/O performance in functional test and data acquisition applications.

Application Note 2001-12-04