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Digital Design & Interconnect Standards

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In digital standards, every generational change puts new risks in your path. We see it first hand when creating our products and working with engineers like you. Keysight’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of.

Keysight - achieve your best design

Achieve signal integrity in high-speed design with these useful tools, demos, videos and more

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Keysight to Exhibit Latest PCI Express® Design, Test Solutions at PCI-SIG® Developers Conference 
Keysight Technologies announces it will exhibit its PCI Express® (PCIe®) solutions at the PCI-SIG Developers Conference 2015, Booth 7, Santa Clara Convention Center, June 23-24.

新聞資料 2016-06-16

 
Keysight Technologies' University Educational Support Programs Now in More Than 200 Universities 
Keysight announces that more than 200 universities in North America are now participating in the Keysight EEsof EDA University Educational Support Programs, which provide several thousand students with EDA software licenses.

新聞資料 2015-08-20

 
Keysight EEsof EDA Premier Communications Design Software 
Keysight EEsof EDA premier communications design software product overview brochure.

型錄 2015-08-19

PDF PDF 1.61 MB
PCI Express® Design and Test from Electrical to Protocol - Brochure 
This brochure provides insight into how to thoroughly simulate, characterize and validate PCI Express Designs.

型錄 2015-08-17

PDF PDF 4.78 MB
Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief 
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

應用手冊 2015-08-14

J-BERT N4903B High-Performance Serial BERT - Data Sheet 
This is a data sheet discussing the Keysight Technologies J-BERT N4903B High-Performance Serial BERT.

產品型錄 2015-08-11

Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

新聞簡訊 2015-08-05

 
DDR3 Memory Protocol Analysis and Compliance Verification – FuturePlus 
Straightforward and reliable DDR3 DIMM bus analysis at 2400MT/s and DDR3 SO-DIMM analysis at 1867MT/s – FuturePlus System and Keysight

解決方案簡介 2015-07-14

 
Challenges extend from simulation to compliance 
Tami Pippert, Keysight Technologies’ high-speed digital marketing program manager, elaborates on how Keysight is enhancing its model generation, simulation, and data analysis technologies.

專文 2015-07-08

 
DDR4 Protocol Analysis - FuturePlus 
DDR4 Protocol Analysis from FuturePlus and Keysight.

解決方案簡介 2015-06-30

 
DisplayPort 1.2 Link Layer Testing - FuturePlus 
DisplayPort 1.2 Link Layer Testing Solution from FuturePlus and Keysight.

解決方案簡介 2015-06-30

 
U7236A 10GBASE-T Ethernet Electrical Conformance Application - Data Sheet 
The U7236A 10GBASE-T Ethernet electrical conformance application for Infiniium oscilloscopes provides you with a fast and accurate way to verify and debug your 10GBASE-T Ethernet designs.

產品型錄 2015-06-22

Asygn & Kalray use Keysight Simulation Tool Suite to Validate PCI Express® Gen3 Serial Links 
Keysight Technologies announces it will exhibit its PCI Express® (PCIe®) solutions at the PCI-SIG Developers Conference 2015, Booth 7, Santa Clara Convention Center, June 23-24.

新聞資料 2015-06-19

 
One Size Does NOT Fit All - Application Note 
This application note discusses the topic of “One Size Does NOT Fit All” and how test system configurations benefit from a choice of hardware form factors and software products.

應用手冊 2015-06-08

PDF PDF 3.34 MB
How to Design for Power Integrity: Finding Power Delivery Noise Problems 
This video provides an understanding of how the voltage regulator module (VRM) interacts with the printed circuit board planes and decoupling capacitors within a power distribution network (PDN). A well designed PDN provides optimum system performance while a poorly matched designed PDN can result in poor system performance. In the extreme case, rogue waves can occur within the PDN generating much higher voltage noise levels than expected, potentially interfering with system performance or resulting in permanent damage. Recommendations for keeping the impedance flat are also provided.

使用說明影片 2015-06-05

 
Keysight Method of Implementation (MOI) for PCIe 3.0 Tx/Rx Impedance and Return Loss Test 
Keysight Method of Implementation (MOI) for PCIe 3.0 Tx/Rx Impedance and Return Loss Test Using Keysight E5071C ENA Network Analyzer Option TDR

應用手冊 2015-06-05

PDF PDF 1.43 MB
Test Solutions for Greater Insight into Wireless Connectivity - Brochure 
This WiCON brochure focuses on test solutions for WiMAXT, RFID, NFC, WLAN, Bluetooth®, UWB, ZigBee technologies.

型錄 2015-06-02

PDF PDF 5.68 MB
Soft Touch Connectorless Logic Analyzer Probes - Application Notes 

應用手冊 2015-05-20

Forward Clocking - Receiver (RX) Jitter Tolerance Test with J-BERT N4903B High-P - Application Note 
This document describes the requirements for forward clocking topology RX Jitter tolerance testing.

應用手冊 2015-04-24

PDF PDF 2.22 MB
Ethernet 100BASE-TX Cable Test - Test Solution Overview Using the ENA Option TDR 
This describes how to make measurements of 100BASE-TX Ethernet Cable Tests by using the Keysight E5071C ENA Option TDR.

技術總覽 2015-04-08

PDF PDF 1.90 MB
Keysight Method of Implementation (MOI) for 100BASE-TX Ethernet Cable Tests 
Keysight Method of Implementation (MOI) for 100BASE-TX Cable Tests Using Keysight E5071C ENA Option TDR

應用手冊 2015-04-07

PDF PDF 2.12 MB
Keysight's ADS PCIe, USB Compliance Test Benches Solve Simulation-Measurement Correlation Challenge 
Keysight introduces the ADS PCIe and USB Compliance Test Benches, which enable a complete workflow for SerDes engineers, from simulation of a candidate design, through measurement of the finished prototype.

新聞資料 2015-04-06

 
Improving IBIS-AMI Model Accuracy: Model-to-Model and Model-to-Lab Correlation Case Studies - Articl 
This DesignCon 2014 paper presents case studies for model-to-model & model-to-lab correlation methods & compares favorable/unfavorable factors for both methods. 10G, 11.5G and 23G SerDes data are used as examples.

專文 2015-04-02

PDF PDF 3.34 MB
PCI Express Receiver Testing Responds To New Challenges - Article 
PCI Express Receiver Testing Responds To New Challenges

專文 2015-03-24

 
Keysight Technologies’ Method of Implementation Guide Supports USB 3.1, USB Type-C Connectors, Cable 
eysight Technologies, Inc. (NYSE: KEYS) today announced the availability of its Method of Implementation (MOI) guide for USB 3.1 and USB Type-C Connectors and Cable Assemblies Compliance Testing using the Keysight ENA Series network analyzer's enhanced time domain analysis option (E5071C-TDR).

新聞資料 2015-03-16

 

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