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Digital Design & Interconnect Standards

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In digital standards, every generational change puts new risks in your path. We see it first hand when creating our products and working with engineers like you. Keysight’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of.

Keysight - achieve your best design

Achieve signal integrity in high-speed design with these useful tools, demos, videos and more

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Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

新聞簡訊 2014-09-09

 
High Speed Digital Design and Simulation Videos on YouTube 
Keysight EEsof EDA's High Speed Digital Design and Simulation video playlist on YouTube.

基本展示 2014-08-06

 
ADS Videos on YouTube 
Advanced Design System (ADS) Video Library playlist in Keysight EEsof EDA's Channel on YouTube

基本展示 2014-08-06

 
Quick Start for Signal Integrity Design Using Advanced Design System (ADS) – Technical Overview 
This demo guide is a part of the high-speed digital design workflow for signal integrity engineers using Advanced Design System.

技術總覽 2014-08-04

PDF PDF 3.82 MB
Modeling, Extraction and Verification of VCSEL Model for Optical IBIS AMI 
A technique of modeling and extraction of VCSEL devices for IBIS-AMI has been proposed.

專文 2014-08-04

PDF PDF 1.18 MB
N5411B SATA 6Gb/s Compliance Test Software - Data Sheet 
The N5411B SATA 6Gb/s compliance test software for Infiniium oscilloscopes provides you with a fast and easy way to validate and debug your SATA design

產品型錄 2014-08-04

EDA Support Services 
Keysight Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.

型錄 2014-08-03

PDF PDF 465 KB
An Innovative Simulation Workflow for Debugging High-Speed Digital Designs Using Jitter Separation 
This paper presents a new simulation workflow for jitter separation analysis.

應用手冊 2014-08-03

Keysight EEsof EDA Software and Modular Solutions for Universities 
Keysight works in collaboration with universities to provide tools that enable education and research for the engineers of tomorrow. The brochure outlines available programs, software and hardware.

型錄 2014-08-03

PDF PDF 1.44 MB
RF and Microwave Industry-Ready Student Certification Program 
This program confirms a student’s technical knowledge, design expertise, and hands-on measurement proficiency in the use of Keysight EEsof EDA software design tools and Keysight instruments.

型錄 2014-08-03

PDF PDF 576 KB
Analysis of Test Coupon Structures for the Extraction of High Frequency PCB Material Properties 
Exploration of the addition of Beatty series resonant impedance structures to improve the accuracy of extracting PCB material properties for the purpose of constructing 3D-EM simulations.

應用手冊 2014-08-03

PDF PDF 2.19 MB
N5416A and N5417A USB Compliance Test Software for Infiniium Oscilloscopes - Data Sheet 
N5416A provides a fast and reliable way to verify USB electrical specification compliance for USB 2.0 devices, hosts, and hubs.

產品型錄 2014-08-03

SATA II Drive TX/RX Testing & Cable SI Testing Using the 86100C DCA-J - Technical Overview 
SATA II Drive Tx/Rx Testing & Cable SI Test using 86100C DCA-J. Product Note 86100-8

應用手冊 2014-08-02

PDF PDF 1.94 MB
Controlled Impedance Line Designer in ADS 
The Controlled Impedance Line Designer in ADS enables signal integrity engineers to do pre-layout controlled impedance line design by optimizing the substrate stack up and the transmission line geometry.

基本展示 2014-08-01

 
U7243A USB 3.0 Superspeed Electrical Performance Validation - Data Sheet 
The USB 3.0 electrical test software allows you to automatically execute USB 3.0 electrical tests, and it displays the results in a flexible report format. In addition to the measurement data, the report provides a margin analysis that shows how closely your device passed or failed each test

產品型錄 2014-08-01

Simulating High-Speed Serial Channels with IBIS-AMI Models 
This paper reviews some of the benefits and limitations of using IBIS models and introduces the new AMI extensions to the latest IBIS version 5.0 specification.

應用手冊 2014-08-01

Time Domain Reflectometry Theory - Application Note 
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

應用手冊 2014-07-31

High Speed Digital Design with Advanced Design System 
This brochure describes 3 ADS suites of applicable simulators, libraries, and capabilities for signal integrity engineers.

型錄 2014-07-31

PDF PDF 1.33 MB
New ADS DDR4 Compliance Test Bench for Solving the Simulation-Measurement Correlation Challenge 
Agilent introduces Advanced Design System DDR4 Compliance Test Bench, which enables a complete workflow for DDR4 engineers from simulation of a candidate design through measurement of the finished prototype. The solution is ideal for semiconductor companies developing DDR controller IP; those developing DRAM chips and DIMMs; and OEMs integrating the controller and DIMM into a system using PCB technology.

新聞資料 2014-06-30

 
Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief 
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

應用手冊 2014-06-24

J-BERT N4903B High-Performance Serial BERT - Data Sheet 
Updated J-BERT N4903B data sheet revision 1.3. Especially PCIe3 related enhancements covered by our PR in Jan 2013. Also covers all enhancements since SW releases 6.80 to 7.40

產品型錄 2014-06-12

DisplayPort 1.2 Link Layer Testing - FuturePlus 
DisplayPort 1.2 Link Layer Testing Solution from FuturePlus and Keysight.

解決方案簡介 2014-04-29

 
DDR4 Protocol Analysis - FuturePlus 
DDR4 Protocol Analysis from FuturePlus and Keysight.

解決方案簡介 2014-04-29

 
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests 
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests Using Keysight E5071C ENA Option TDR

應用手冊 2014-04-21

PDF PDF 1.71 MB
10GBASE-KR/40GBASE-KR4 Interconnect & Tx/Rx Tests - Test Solution Overview Using the ENA Option TDR 
This describes how to make measurements of 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect & Transmitter/Receiver (Tx/Rx) Tests by using the Keysight E5071C ENA Option TDR.

技術總覽 2014-04-21

PDF PDF 3.54 MB

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