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Digital Design & Interconnect Standards

In digital standards, every generational change puts new risks in your path. We see it first hand when creating our products and working with engineers like you. Keysight’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of.

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Learn more about Digital Design & Interconnect solutions from Keysight. 

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New ADS DDR4 Compliance Test Bench for Solving the Simulation-Measurement Correlation Challenge 
Agilent introduces Advanced Design System DDR4 Compliance Test Bench, which enables a complete workflow for DDR4 engineers from simulation of a candidate design through measurement of the finished prototype. The solution is ideal for semiconductor companies developing DDR controller IP; those developing DRAM chips and DIMMs; and OEMs integrating the controller and DIMM into a system using PCB technology.

Press Materials 2014-06-30

 
Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale - Application Note 
This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment.

Article 2014-06-14

PDF PDF 515 KB
Network Analyzer Time Domain Reflectometry (TDR) Measurements – Granite River Labs 
Network Analyzer Time Domain Reflectometry (TDR) Measurements from Granite River Labs and Keysight

Solution Brief 2014-04-29

 
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests 
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests Using Keysight E5071C ENA Option TDR

Application Note 2014-04-21

PDF PDF 1.71 MB
10GBASE-KR/40GBASE-KR4 Interconnect & Tx/Rx Tests - Test Solution Overview Using the ENA Option TDR 
This describes how to make measurements of 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect & Transmitter/Receiver (Tx/Rx) Tests by using the Keysight E5071C ENA Option TDR.

Technical Overview 2014-04-21

PDF PDF 3.54 MB
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests 
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests Using Keysight E5071C ENA Option TDR

Application Note 2014-04-21

PDF PDF 1.03 MB
Certification of HDMI 2.0 Test Solution 
Certification of HDMI 2.0 Test Solution for HDMI 2.0 Compliance Test, With Widest Coverage of Test Items

Press Materials 2014-04-17

 
USB Type-C Cable Testing - BitifEye 
USB Type-C Cable Testing Solution from BitifEye and Keysight.

Solution Brief 2014-04-09

 
Oscilloscope Probe Switching - BitifEye 
Oscilloscope Probe Switching Solution from BitifEye and Keysight.

Solution Brief 2014-04-09

 
HDMI Cable Testing - BitifEye 
HDMI Cable Testing Solution from BitifEye and Keysight.

Solution Brief 2014-04-09

 
Method of Implementation(MOI) for MIPI M-PHY Interface S-Parameter and Impedance Conformance Tests 
Keysight Method of Implementation (MOI) for MIPI M-PHY Interface S-Parameter and Impedance Conformance Tests Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2014-03-20

PDF PDF 978 KB
ADS 2014 Dramatically Improves Design Productivity and Efficiency 
Agilent announces a powerful new version of Advanced Design System software, ADS 2014. Designed to dramatically improve design productivity and efficiency with new technologies and capabilities, ADS 2014 is the software's most significant ADS release to date.

Press Materials 2014-02-20

 
Tips and Advanced Techniques for Characterizing a 28 Gb/s Transceiver 
This paper shows the right combination of measurement and simulation techniques, and how the previously existing barriers for using de-embedding have been eliminated.

Article 2014-02-18

PDF PDF 3.82 MB
Sanjay Gangal of EDACafé interviews Colin Warwick on New SI and EM Products at Designcon 2014 
Sanjay Gangal, V.P. Sales & Marketing at EDACafé interviews Colin Warwick, Product Manager at Keysight Technologies, at Designcon 2014, .

Demo 2014-02-04

 
ADS Controlled Impedance Line Designer Solves Key Challenges in Designing Chip-to-Chip Links 
Agilent introduces Agilent EEsof EDA’s Controlled Impedance Line Designer. The software product quickly and accurately optimizes stack up and line geometry for multigigabit-per-second chip-to-chip links, using the most relevant metric.

Press Materials 2014-01-27

 
High Precision Time Domain Reflectometry - Application Note 
Time domain reflectometry (TDR) is a well-established technique for verifying the impedance and quality of signal pats in components, interconnects, and transmission lines.

Application Note 2014-01-23

Introducing Physics-Based VCSEL Model to Solve Challenges in Designing Rack-to-Rack Opto Links 
Agilent introduces a physics-based model for its opto model library that quickly and accurately solves the challenges posed by signal distortion in vertical cavity surface emitting lasers (VCSELs) used in rack-to-rack opto links.

Press Materials 2013-10-23

 
Agilent Technologies’ Advanced Design System Selected by Kamstrup to Develop Smart Metering System 
Agilent announces that Kamstrup A/S, a provider of metering solutions for electricity, heat, water and natural gas, has selected Agilent's Advanced Design System (ADS).

Press Materials 2013-10-07

 
Keysight EEsof EDA Premier Communications Design Software 
The Keysight EEsof EDA catalog provides an excellent overview of all of Keysight's Electronic Design Automation (EDA) tools.

Catalog 2013-10-07

PDF PDF 8.61 MB
Measuring Jitter in Digital Systems (AN 1448-1) - Application Brief 
This application note is for R&D designers and engineers working on high-speed digital designs. It addresses jitter measurements in digital circuits, how the different measurement techniques are best applied, and how these decisions may change as the data rates increase.

Application Note 2013-09-16

PDF PDF 1.78 MB
U4301A PCI Express® 3.0 Analyzer Module - Data Sheet 
Keysight's U4301A PCI Express® 3.0 analyzer module is a protocol analyzer supporting all PCIe applications from Gen1 - Gen3 and speeds from 2.5 GT/s (Gen1) - PCI 8 GT/s (Gen3), link widths X1-X16.

Data Sheet 2013-09-04

M9252A DigRF Host Adapter – Data Sheet 
The M9252A DigRF Host Adapter provides the serial stimulus capabilities required for the MIPITM Alliance DigRF v4-based RFIC evaluation and characterization.

Data Sheet 2013-08-07

PDF PDF 565 KB
How to Test a MIPI M-PHY High-speed Receiver - Challenges and Keysight Solutions - Application Note 
This application selectively describes critical parts of the MIPI M-Phy-specification and related receiver (RX) tests. It describes the main properties of the M-Phy interface.

Application Note 2013-08-06

PDF PDF 6.63 MB
Agilent Technologies to Demonstrate Products at EMC 2013 
Agilent announce that it will demonstrate some of its key products at EMC 2013, the IEEE International Symposium on Electromagnetic Compatibility, Aug. 5-9 at the Denver Convention Center (Booth 830), in Denver, Colorado.

Press Materials 2013-07-29

 
Agilent Technologies Announces Next-Generation MIPI M-PHY Protocol Analyzer for Mobile Computing App 
Agilent Technologies Announces Next-Generation MIPITM M-PHY Protocol Analyzer for Mobile Computing Applications

Press Materials 2013-06-18

 

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