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Digital Design & Interconnect Standards

In digital standards, every generational change puts new risks in your path. We see it first hand when creating our products and working with engineers like you. Keysight’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of.

Keysight - Insights for your best design

Learn more about Digital Design & Interconnect solutions from Keysight. 
 

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USB 2.0 Compliance Testing with Infiniium Oscilloscopes - Application Note 
This Application Note discusses the solution for the USB 2.0 test suite. The Keysight solution is the only one-box solution that uses the official USB-IF scripts for precompliance ans compliance testing.

Application Note 2014-08-03

EDA Support Services - Flyer 
Keysight Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.

Brochure 2014-08-03

PDF PDF 454 KB
S-parameter Series: Transforming Oscilloscope Acquisitions for De-Embedding, Embedding & Simulating 
This application note is the first in a series of s-parameter application notes and introduces us to signal acquisition and theory.

Application Note 2014-08-02

SATA II Drive TX/RX Testing & Cable SI Testing Using the 86100C DCA-J - Technical Overview 
SATA II Drive Tx/Rx Testing & Cable SI Test using 86100C DCA-J. Product Note 86100-8

Application Note 2014-08-02

PDF PDF 1.94 MB
N5412B Serial Attached SCSI-2 (SAS-2) Compliance Test Software for Infiniium 90000 Series Oscillosco 
The N5412B SAS compliance test application provides a fast and easy way to test, debug and characterize your serial attached SCSI designs.

Data Sheet 2014-08-02

PDF PDF 4.08 MB
MIPI DigRF v4 (M-PHY) Protocol Triggering and Decode for Infiniium Series Oscilloscopes 
Extend you scope's capability with MIPI DigRF v4 (M-Phy) triggering and decode application.

Data Sheet 2014-08-02

PDF PDF 4.15 MB
U7238A MIPI D-PHY Compliance Test Software for Infiniium Oscilloscopes - Application Note 
Keysight Technologies' U7238A MIPI D-PHY compliance test software for Infiniium oscilloscopes gives you a fast, easy way to validate and debug your embedded D-PHY data links.

Data Sheet 2014-08-02

Practical Application of the InfiniiSim Waveform Transformation Toolset - Application Note 
This final paper puts together the concepts and theory already presented in the preceding papers. It presents and addresses five common problems that confront engineers.

Application Note 2014-08-02

Controlled Impedance Line Designer in ADS 
The Controlled Impedance Line Designer in ADS enables signal integrity engineers to do pre-layout controlled impedance line design by optimizing the substrate stack up and the transmission line geometry.

Demo 2014-08-01

 
Simulating High-Speed Serial Channels with IBIS-AMI Models 
This paper reviews some of the benefits and limitations of using IBIS models and introduces the new AMI extensions to the latest IBIS version 5.0 specification.

Application Note 2014-08-01

U7243A USB 3.0 Superspeed Electrical Performance Validation - Data Sheet 
The USB 3.0 electrical test software allows you to automatically execute USB 3.0 electrical tests, and it displays the results in a flexible report format. In addition to the measurement data, the report provides a margin analysis that shows how closely your device passed or failed each test

Data Sheet 2014-08-01

An Overview of the Electrical Validation of 10BASE-T, 100BASE-TX, and 1000BASE-T - Application Note 
The technology used in these ports, commonly known as “LAN” or “NIC” ports, is usually one of the 10BASE-T, 100BASE-TX, and 1000BASE-T standards or a combination of them.

Application Note 2014-08-01

USB Design and Test - A Better Way - Application Note 
Brochure covering Keysight's USB 2.0 and 3.0 test solutions portfolio and applications, discussing measurement challenges and showing how the test solutions and services address these.

Application Note 2014-07-31

Properly Powering On & Off Multiple Power Inputs in Embedded Designs - Application Note 
This is the first in a series of application notes that addresses power optimization, characterization and simulation challenges in embedded designs.

Application Note 2014-07-31

Strategies for Debugging Serial Bus Systems with Infiniium Oscilloscopes – Application Note 
This application note discusses the challenges associated with and new solutions for debugging serial bus designs including PCI-Express Generation 1, Inter Integrated Circuit (I2C), Serial Peripheral Interface (SPI), or Universal Serial Bus (USB)

Application Note 2014-07-31

Practical Analysis of Backplane Vias - White Paper 
This paper describes the methodology of using measurements on a test vehicle to build a high bandwidth, scalable model of long vias which includes the through and stub effects which can be used for system simulation.

Case Study 2014-07-31

PDF PDF 4.57 MB
High Speed Digital Design with Advanced Design System - Brochure 
This brochure describes 3 ADS suites of applicable simulators, libraries, and capabilities for signal integrity engineers.

Brochure 2014-07-31

PDF PDF 1.33 MB
Digital Communication Analyzer (DCA), Measure Relative Intensity Noise (RIN) - Application Note 
Digital Communication Analyzer (DCA), Measure Relative Intensity Noise (RIN).

Application Note 2014-07-31

Separating Read/Write Signals for DDR DRAM and Controller Validation - Application Note 
To analyze the signal integrity of DDR signals, you need to differentiate the complex traffic on the data bus to independently analyze the signal performance for both DDR chip and memory controller.

Application Note 2014-07-31

PDF PDF 805 KB
New ADS DDR4 Compliance Test Bench for Solving the Simulation-Measurement Correlation Challenge 
Agilent introduces Advanced Design System DDR4 Compliance Test Bench, which enables a complete workflow for DDR4 engineers from simulation of a candidate design through measurement of the finished prototype. The solution is ideal for semiconductor companies developing DDR controller IP; those developing DRAM chips and DIMMs; and OEMs integrating the controller and DIMM into a system using PCB technology.

Press Materials 2014-06-30

 
Jitter Analysis: The Dual-Dirac Model, RJ/DJ, and Q-Scale - Application Note 
This paper provides a complete description of the dual-Dirac model, how it is used in technology standards and a summary of how it is applied on different types of test equipment.

Article 2014-06-14

PDF PDF 515 KB
Network Analyzer Time Domain Reflectometry (TDR) Measurements – Granite River Labs 
Network Analyzer Time Domain Reflectometry (TDR) Measurements from Granite River Labs and Keysight

Solution Brief 2014-04-29

 
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests 
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Tx/Rx Return Loss Tests Using Keysight E5071C ENA Option TDR

Application Note 2014-04-21

PDF PDF 1.03 MB
10GBASE-KR/40GBASE-KR4 Interconnect & Tx/Rx Tests - Test Solution Overview Using the ENA Option TDR 
This describes how to make measurements of 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect & Transmitter/Receiver (Tx/Rx) Tests by using the Keysight E5071C ENA Option TDR.

Technical Overview 2014-04-21

PDF PDF 3.54 MB
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests 
Keysight Method of Implementation (MOI) for 10GBASE-KR/40GBASE-KR4 Ethernet Interconnect Tests Using Keysight E5071C ENA Option TDR

Application Note 2014-04-21

PDF PDF 1.71 MB

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