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Digital Design & Interconnect Standards

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In digital standards, every generational change puts new risks in your path. We see it first hand when creating our products and working with engineers like you. Keysight’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of.

Keysight - Insights for your best design

Achieve signal integrity in high-speed design with these useful tools, demos, videos and more . Learn more about Digital Design & Interconnect solutions from Keysight. 
 

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Innovations in EDA: Multi-Technology RF Design Using the New Advances in ADS 2011 
Originally broadcast March 1, 2011

Webcast - recorded

 
Innovations in EDA: Opto-Electronic Signal Integrity on Optical Fiber Chip-to-Chip Link 
Originally broadcast April 7, 2011

Webcast - recorded

 
Innovations in EM Simulation for High Speed Digital Design 
Original broadcast Nov 18, 2010; Part of the Series: Signal Integrity for High Speed Digital Interconnects.

Webcast - recorded

 
Introducing the New Infiniium V-Series High-Performance Oscilloscope Webcast 
Original broadcast April 14, 2015

Webcast - recorded

 
Introduction to Digital RF Communications 
This course teaches the basics of vector modulation, effectively the basics of digital modulation.

Classroom Training

 
Introduction to EMI/EMC Challenges and Their Solution 
Keysight EEsof EDA presentation on how to, "Overcome High Speed Digital Design Challenges".

Seminar Materials 2014-10-14

PDF PDF 2.96 MB
Introduction to the Keysight x1149 Boundary Scan Analyzer Webcast 
Original broadcast August 26, 2014; 9am PT / 12pm ET

Webcast - recorded

 
Jitter Analysis: What Works, What Doesn't & Why eSeminar FAQs 
FAQs from the eSeminar

Seminar Materials 2006-05-11

PDF PDF 63 KB
Jitter in Digital Circuits eSeminar FAQs 
FAQs from the eSeminar

Seminar Materials 2006-05-11

PDF PDF 34 KB
Jitter Measurements and Real-Time Eye Analysis Using an Oscilloscope Webcast 
Original broadcast May 28, 2015

Webcast - recorded

 
Jitter Measurements for High-Speed Digital 
Jitter Measurements for High-Speed Digital Transmission

Seminar Materials 2006-06-14

PDF PDF 44 KB
Jitter Measurements with a High-Speed Scope eSeminar FAQs 
FAQs from the eSeminar

Seminar Materials 2006-05-11

PDF PDF 117 KB
Keysight's Events for United Kingdom and Ireland 
Welcome to Keysight's Upcoming Events Page for United Kingdom and Ireland

Seminar

 
Logic Analysis Fundamentals for Computer Solutions 
Learn how to configure and use the 16700 series of logic analysis tools to design and debug digital systems in this logic analysis fundamentals course.

Classroom Training

 
Maximizing test coverage of multiple limited access boards by linking multiple boundary scan chains 
Original broadcast October 9, 2014

Webcast - recorded

 
Measuring Power Rail Signal Integrity with Oscilloscopes Webcast 
Original broadcast October 29, 2014

Webcast - recorded

 
Minimizing Crosstalk in Hi-Speed Interconnects using Measurement-based Modeling 
This Presentation presented by Mike Resso (Agilent Technologies) focuses on minimizing crosstalk in high speed interconnects using measurement-based modeling.

Seminar Materials 2006-09-01

PDF PDF 1.50 MB
MIPI M-PHY, D-PHY and C-PHY Receiver Testing – Today and Tomorrow 
Original broadcast October 21, 2014

Webcast - recorded

 
MIPI Physical Layer Standards and Receiver Test Solutions Webcast 
Original broadcast May 13, 2015

Webcast - recorded

 
MIPI – Overcome Test Challenges to Ensure Interoperability for your PHY Webcast 
Live broadcast June 23, 2015; 10am PT / 1pm ET

Webcast

 
Network Analysis Back to Basics Webcast 
Recorded broadcast August 21, 2013

Webcast - recorded

 
New 2014 Keysight EEsof EDA Simulation Tools for Signal Integrity, Power Integrity and EMI/EMC 
In this seminar, leading Keysight EEsof EDA R&D Designers provide a first-hand look at the new HSD features for the world class ADS transient and channel convolution simulators.

Seminar Materials 2014-09-18

 
New Calibration Method Simplifies Measurements of Fixtured Devices Webcast 
Original broadcast July 29, 2014

Webcast - recorded

 
Next generation BERT Ensures Signal Integrity in High-speed Digital Designs Webcast 
Original broadcast January 21, 2014

Webcast - recorded

 
One Size Does Not Fit All - Choose the Right Instrument Form Factor Webcast 
Original broadcast March 11, 2015

Webcast - recorded

 

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