Here’s the page we think you wanted. See search results instead:

 

Contact an Expert

Digital Design & Interconnect Standards

In digital standards, every generational change puts new risks in your path. We see it first hand when creating our products and working with engineers like you. Keysight’s solution set for high-speed digital test is a combination of instrumentation and broad expertise built on our ongoing involvement with industry experts. By sharing our latest experiences, we can help anticipate challenges and accelerate your ability to create products you’ll be proud of.

Keysight - Insights for your best design

Learn more about Digital Design & Interconnect solutions from Keysight. 

Keysight RF and Digital Learning Center - A commitment to learning with industry experts 
 

Explore YouTube Videos 

Refine the List

By Industry/Technology

By Type of Content

By Product Category

251-275 of 422

Sort:
Electrical Redriver Modeling Solution to Solve Key Challenges in Designing Chip-to-Chip Links 
Agilent introduces a redriver modeling solution designed to quickly and accurately solve the challenge posed by signal distortion in multigigabit-per-second systems.

Press Materials 2012-11-05

 
Frequency Domain Analysis of Jitter Amplification in Clock Channels 
Clock channel jitter amplification factor in terms of transfer function or S-parameters is derived. Amplification is shown to arise from smaller attenuation in jitter lower sideband than in the fundamental. Amplification scaling with loss is obtained.

Application Note 2012-11-01

PDF PDF 257 KB
Agilent Technologies to Demonstrate High-Speed Digital Design Solutions at EPEPS 
Agilent announces it will demonstrate its high-speed digital design solutions at EPEPS 2013, Oct. Oct. 28 & 29, at the DoubleTree by Hilton Hotel in San Jose, Calif

Press Materials 2012-10-28

 
Keysight Method of Implementation (MOI) for PCI Express 3.0 PCB Differential Trace Impedance Test 
Keysight Method of Implementation (MOI) for PCI Express 3.0 PCB Differential Trace Impedance Test Using Keysight E5071C ENA Network Analyzer Option TDR

Application Note 2012-10-16

PDF PDF 1.62 MB
Explore the SERDES Design Space Using the IBIS AMI Channel Simulation Flow 
Simulation of modern chip-to-chip links requires you abandon the SPICE-based approach and adopt a new approach based on an IBIS AMI channel simulation flow.

Application Note 2012-09-21

STATS ChipPAC Launches QFN Package Design Kit for Agilent Technologies’ Advanced Design System 
STATS ChipPAC announces the launch of its Quad Flat No-Lead (QFN) package design kit for ADS.

Press Materials 2012-09-12

 
The Power of S-Parameters for High Speed Digital Design Tutorial 
Learn to use S-parameters for high-speed digital designs with this video tutorial.

Promotional Materials 2012-09-07

 
B4623B Bus Decoder for LPDDR, LPDDR2, or LPDDR3 Debug and Validation - Data Sheet 
The B4623B protocol-decode software translates Translates acquired signals into easily understood bus transactions showing associated data bursts for LPDDR, LPDDR2, LPDDR3 at full bus data rates.

Data Sheet 2012-09-03

PDF PDF 1.03 MB
Agilent to Demonstrate Test Solutions at International Symposium on Electromagnetic Compatibility 
Agilent will demonstrate its test solutions at the IEEE International Symposium on Electromagnetic Compatibility in Pittsburg, Aug. 5-10, 2012.

Press Materials 2012-07-18

 
Overcoming LTE-Advanced Test Challenges - Inter-Band Carrier Aggregation  
This video will explain one of the major test challenges of demodulating the multiple component carriers simultaneously since the frequency band separation in inter-band aggregation is wider than the IF BW of any commercially available signal analyzer. Watch how Keysight addresses this test challenge with the 89600 VSA software along with dual X-Series signal analyzers or N7109A multi-channel signal analyzer.

How-To Video 2012-07-15

 
Deep Memory and Raw Data Views Give Unprecedented Insight into Demanding CSI-2/DSI Designs 

Press Materials 2012-06-12

 
Agilent Technologies’ Advanced Design System Selected by ADATA to Speed Product Development 
ADATA Technology Co., a provider of complete memory solutions in Taipei, Taiwan, has selected ADS software for developing memory modules for the high-speed digital market.

Press Materials 2012-05-15

 
Crossing the Digital-Analog Divide - White Paper 
This white paper helps to better understand how to cope with the physical nature of signals that we might prefer to think of as bits, nibbles and bytes, let's start with an ideal digital waveform.

Application Note 2012-05-02

PDF PDF 6.46 MB
Agilent Technologies Introduces 6-GHz Signal Generators with Industry-Best Performance 
Today's aerospace/defense environment requires enhanced radar performance to detect weak signals at long distances. To provide the pure and precise signals needed to test these designs, the MXG uses an innovative triple-loop synthesizer to deliver phase noise performance of -146 dBc/Hz at 1 GHz and 20 kHz offset. For developers of radar components such as mixers and analog-to-digital converters, the MXG also features industry-leading spurious performance of -96 dBc at 1 GHz.

Press Materials 2012-05-01

 
Test Solution Overview for SATA Cable Assembly & Phy Tx/Rx Impedance Compliance Tests 
This describes how to use the Keysight E5071C ENA Network Analyzer Option TDR to make the measurements required per the Serial ATA specification rev 3.1 for cable assemblies.

Technical Overview 2012-04-23

PDF PDF 2.99 MB
N4880A Reference Clock Multiplier Data Sheet 
This data sheet details how this reference clock multiplier can characterize receivers, lock the stressed pattern generator to the reference clock, and use multiple clock rates.

Data Sheet 2012-04-16

PDF PDF 3.31 MB
Oscilloscope Considerations for Multilane MIPI M-PHY Transmitter Validation 
To help improve your electrical validation, there are a few considerations in choosing the oscilloscope to validate your multilane M-PHY designs.

Application Note 2012-04-09

PDF PDF 1.10 MB
Which Electromagnetic Simulator Should I Use? 
This paper outlines three of the key EM simulation technologies, MoM, FEM, FDTD and attempt to compare and contrast the relative merits of each.

Application Note 2012-04-06

PDF PDF 3.21 MB
LTE Digital and Analog Vector Modulation Debug 
Watch this video to learn how to debug and validate the vector signal path in an LTE radio. A common analysis environment allows for both digital and analog/RF teams to evaluate the quality of key LTE signals. Both digital and analog signals are processed by the 89600 Vector Signal Analyzer (VSA) software where the constellation diagram, spectral content, and error vector magnitude can be observed and compared to SystemVue simulation results.

Demo 2012-03-27

 
USB 3.0 Protocol Testing with Active Error Insertion Application Note 
Speed up design and verification of USB designs using the U4612A Jammer

Application Note 2012-03-19

PDF PDF 3.51 MB
Ethernet Controller Demo 
Gain direct control of your ethernet controller by watching this short demo video.

Demo 2012-03-15

 
S-parameter Series: Using De-embedding Tools for Virtual Probing Application Note 
Discusses using de-embedding tools to gain virtual access to difficult measurement points

Application Note 2012-03-11

42 Mbps DC-HSDPA Throughput with the 8960 
This video is a demonstration of the new E5515E measuring the maximum 42 Mbps throughput of a DC-HSDPA device in an environment that closely simulates real-world conditions

Demo 2012-03-05

 
MIMO OTA Two-Stage Method Using PXT and PXB  
This video is a demonstration of testing the MIMO OTA performance of an LTE device using the two-stage method with Keysight Technologies' N5106A PXB and E6621A PXT. This method is efficient and cost-effective and can be used for multiple stages of test including design verification testing of antennas or devices on a lab bench. 3GPP and CTIA are currently evaluating this method to be added to LTE conformance testing.

Demo 2012-03-05

 
S-parameter Series: S-parameter Requirements for Oscilloscope De-Embedding Applications 
A tutorial in helping the reader achieve the big picture of interoperating oscilloscope data and how to understand its relationship to S-parameters

Application Note 2012-03-02

Previous ... 11 12 13 14 15 16 17 Next