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Oscilloscope Measurement Tools to Help Debug Automotive Serial Buses Faster - Application Note 
Keysight's InfiniiVision Series oscilloscopes offer some unique measurement capabilities for debugging and characterizing the physical layer of automotive serial buses.

アプリケーション・ノート 2015-08-01

PDF PDF 3.86 MB
Keysight Technologies E5080A ENAシリーズ ネットワーク・アナライザ 
Keysight E5080Aは、クラス最高の性能、柔軟な機能、高いユーザビリティーを備えた次世代 のENAです

ブローシャ 2015-02-19

PDF PDF 2.21 MB
i3070 High Node Count Test Solution - Technical Overview 
Keysight's high node count test solution allows any Keysight 3070/i3070 Series 3 or Series 5 four-module test system to be easily upgraded into an ultra-high pin count test system

技術概要 2015-02-12

PDF PDF 645 KB
Introducing Keysight E5080A ENA Vector Network Analyzer - Demo 
This video introduces the Keysight E5080A ENA vector network analyzer, which has the new touch-based GUI and offers the industry’s best combination of RF measurement performance and speed.

デモ 2015-02-12

MP4 MP4 49.80 MB
The World’s Highest Pin Count In-Circuit Test Solutions - Brochure 
Keysight's new i3070 and 3070 in-circuit test (ICT) high node count test solution is the world’s highest pin count ICT system, bringing an unprecedented level of performance and portability to users.

ブローシャ 2015-02-12

PDF PDF 212 KB
Improving Speed and Accuracy in the Testing of BTS Filters and Duplexers - Application Brief 
This application brief explains why the E5080A ENA Series Network Analyzer is the ideal solution for BTS filters and duplexers manufacturing test.

アプリケーション・ノート 2015-02-11

PDF PDF 597 KB
How to Use Envelope Tracking to Improve Power Amplifier Efficiency 
This video introduces basic concepts regarding applying envelope tracking to improve power amplifier efficiency.

使用法の説明ビデオ 2015-02-10

 
M9068A Phase Noise X-Series Measurement Application for PXI Vector Signal Analyzers 
This document provides technical and other information related to the Phase Noise X-Series measurement application for modular instruments.

技術概要 2015-02-10

PDF PDF 2.39 MB
Antenna Measurements for mm-wave Devices – MVG-Orbit/FR 
Antenna Measurements for mm-wave Devices from MCG-Orbit/FR and Keysight.

ソリューション概要 2015-02-09

 
Keysight Technologies Model Builder Program 

ブローシャ 2015-02-04

PDF PDF 1.60 MB
Keysight Technologies WaferPro Expressソフトウェア 
自動オンウエハー測定ソフトウェア

ブローシャ 2015-01-29

PDF PDF 1.28 MB
E5080A ENA Series Network Analyzer - Data Sheet 
This literature describes the technical specifications for E5080A and E5092A.

データシート 2015-01-28

PDF PDF 2.90 MB
E5080A ENA Series Network Analyzer - Configuration Guide 
This configuration guide describes standard configurations, options, accessories and peripherals for the E5080A network analyzers.

構成ガイド 2015-01-28

PDF PDF 597 KB
How to Design an RF Power Amplifier: Class F 
This short video will provide an introduction to Class F Power Amplifier Design by first building a nonlinear device model and then using this model in a circuit simulation environment to generate the idealized “square” Class F waveforms.

使用法の説明ビデオ 2015-01-27

 
How to Setup and Run Load Pull Simulations: The Basics 
This video introduces basic concepts regarding running load pull simulations. It then uses load pull simulation to find a load impedance that enables you to obtain greater than 43 dBm output power and greater than 55% PAE from a Cree FET.

使用法の説明ビデオ 2015-01-27

 
How to Make Accurate, Automated RF Wafer-level Measurements 
The video introduces automation as a way to increase productivity and efficiency. Keysight WaferPro Express measurement software is used to illustrate the various steps in combination with Cascade Microtech Velox software for prober control and Cascade WinCalXE software for automated calibration.

使用法の説明ビデオ 2015-01-27

 
How to Design an RF Power Amplifier: The Basics  
This video provides a foundation for understanding how power amplifier circuits work. If you are new to High Frequency Power Amplifier Circuit Design, this is the place to start.

使用法の説明ビデオ 2015-01-15

 
How to Design an RF Power Amplifier: Class A, AB and B 
This video provides an introduction to the most basic modes of power amplifier operation by first building a nonlinear device model from scratch and then using this model in a circuit simulation environment to demonstrate various modes of power amplifier operation.

使用法の説明ビデオ 2015-01-15

 
How to Design RF and Microwave Impedance Matching Networks 
This video describes how to design RF and Microwave impedance matching networks.

使用法の説明ビデオ 2015-01-14

 
How to Extract SRAM Models  
This video shows how to extract SRAM device models efficiently on Keysight's device modeling platform.

使用法の説明ビデオ 2015-01-14

 
How to Use “Design of Experiments” to Create Robust Designs With High Yield 
This video explains how to use the DOE methodology to help you create and produce robust designs with first pass success and high yield.

使用法の説明ビデオ 2015-01-14

 
How to Optimize the Performance of Your RF Layout 
This video shows a practical and effective approach to optimize the performance of your RF layout by parameterizing it and performing EM optimization prior to going to fabrication – thus helping to achieve fist pass success.

使用法の説明ビデオ 2015-01-14

 
Transmit/Receive Module Test Platform (TRM-X) - Technical Overview 
The TRM-X Test Platform, measurement science expertise and systems when and where needed, provide the capability you need to deliver AESA radar; datalink; and satcom transmit/receive modules.

技術概要 2015-01-10

PDF PDF 1.83 MB
Keysight Technologies M937xAPXIeベクトル・ネットワーク・アナライザ 
基本的なSパラメーターを測定する場合、速度、性能、占有面積の最適な組み合わせが重要になります。以下のテストに対応するKeysight PXIベクトル・ネットワーク・アナライザ(VNA)を使用すれば、競争力が高まります。

ブローシャ 2015-01-08

PDF PDF 546 KB
Detecting Tailgating Boards on the i3070 Inline In-Circuit Tester - Application Note 
Tailgating sensor improvements on the Keysight i3070 Series 5i inline in-circuit tester help to further minimize damages due to operator and upstream loading errors.

アプリケーション・ノート 2015-01-05

PDF PDF 437 KB

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