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How to Model RF Passive Devices: Spiral Inductors 
This video explains and demonstrates a method to develop accurate Spice models based on verified S-parameter measurements. The video walks you through the entire modeling flow for two RF spiral inductors using IC-CAP.

使用說明影片 2016-02-11

 
Genesys Overview 
Genesys continues to offer the industry’s most powerful RF circuit and system synthesis capabilities in an affordable, accurate and easy-to-use simulation software that you’ve come to love. Keysight Sys-Parameters provide breakthrough convenience in using component datasheet parameters such as amplifier P1dB, IP3, gain and noise figure over frequency, temperature and bias for simulation without the need to create custom files and equations.

基本展示 2016-02-11

 
N6854A Geolocation System - Configuration Guide 
Use this guide to configure a Keysight Geolocation system with the right capabilities to meet your specific requirements.

配置設定指南 2016-02-10

PDF PDF 2.60 MB
Testing the Internet of Things - Article Reprint 
Connectivity is embedded in the electronics ecosystem. And test should be embedded in the devices that support it.

專文 2016-02-09

PDF PDF 79 KB
Manufacturing Test Solutions for SSDS - Article Reprint 
A new system performs both ICT and boundary scan in high-volume settings.

專文 2016-02-09

PDF PDF 222 KB
Tester for Hire - Article Reprint 
This article explores the possibility of renting test equipment to help electronics manufacturers juggle capacity according to production demand and available resources.

專文 2016-02-09

PDF PDF 381 KB
Emulating Analog Input Sensors in Automotive Electronics Functional Test - Article Reprint 
This article discusses guidelines for evaluating the digital-analog converters for your automotive electronics functional test needs.

專文 2016-02-09

PDF PDF 318 KB
Finding Fault - Article Reprint 
testing mission-critical functions in automotive electronics.

專文 2016-02-05

PDF PDF 452 KB
Testing of Small Form-Factor Products - Article Reprint 
Boundary scan and embedded test will need to make up for ICT gaps.

專文 2016-02-03

PDF PDF 546 KB
Making Boundary Scan Easy - Article Reprint 
Testing boundary scan devices no longer need be a laborious task.

專文 2016-02-03

PDF PDF 217 KB
Automating In-Circuit Test - Article Reprint 
Inline ICT is not as cumbersome as it used to be, and in the longer run, will help manufacturers save costs.

專文 2016-02-02

PDF PDF 87 KB
Testing New Grounds in Automotive Electronics - Article Reprint 
Manufacturers are increasingly designing products for ease of test.

專文 2016-02-02

PDF PDF 279 KB
Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

新聞簡訊 2016-02-01

 
Bluetooth Audio Measurement with the U8903B Performance Audio Analyzer - Application Note 
This article focuses on the Bluetooth audio measurement applications of the U8903B performance audio analyzer. Bluetooth audio is also part of the whole audio measurement and analysis ecosystem.

應用手冊 2016-01-28

PDF PDF 2.48 MB
TS-8989 PXI Functional Test System - Brochure 
The TS-8989 PXI functional tester helps you achieve a lower cost of test for automotive electronic control units and industrial electronics.

型錄 2016-01-28

PDF PDF 671 KB
ADS Videos on YouTube 
Advanced Design System (ADS) Video Library playlist in Keysight EEsof EDA's Channel on YouTube

基本展示 2016-01-28

 
Genesys 2015 Software Enables Industry’s Fastest Realization of RF Systems and Circuits 
Keysight announces the latest release of its industry leading, affordable RF simulation and synthesis software, Genesys 2015. Designed for circuit and system designers, the software features breakthrough Keysight Sys-Parameters that enables RF system simulation with off-the-shelf component datasheets; and comprehensive RF circuit synthesis to enable the industry’s fastest realization of RF systems and circuits.

新聞資料 2016-01-26

 
Low-Frequency Noise Measurement System Adopted by China CEPREI Laboratory for Reliability Studies 
Keysight announces that CEPREI Laboratory has successfully adopted the Keysight EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer (A-LFNA) for measurement and analysis of flicker noise (1/f noise) and random telegraph noise (RTN) during its reliability studies of semiconductor devices including MOSFETs, HEMTs and TFTs.

新聞資料 2016-01-25

 
Model Builder Program (MBP) 
MBP is a one-stop solution that provides both automation and flexibility for silicon device modeling.

型錄 2016-01-25

PDF PDF 930 KB
Model Quality Assurance (MQA) 
MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.

型錄 2016-01-25

PDF PDF 3.13 MB
Boundary Scan DFT Guidelines for Good Chain Integrity and Test Coverage - Application Note 
This application note provides some key guidelines to enable good design for testability using boundary scan.

應用手冊 2016-01-21

PDF PDF 1.99 MB
TS-8989 Automotive Body and Safety Test Reference Solution – Configuration Guide 
This configuration guide contains information to help you configure your body and safety test reference solution with the TS-8989 functional tester, and tailor the system to meet your requirements.

配置設定指南 2016-01-20

PDF PDF 2.55 MB
Increasing Reliability and Efficiency in Power Converter Designs Part 1 - Application Note 
This application note will provide insight into increasing reliability and efficiency in next-generation power converter designs.

應用手冊 2016-01-12

PDF PDF 2.20 MB
Increasing Reliability and Efficiency in Power Converter Designs Part 3 - Application Note 
This application note part 3 will provide insight into increasing reliability and efficiency in next-generation power converter designs.

應用手冊 2016-01-11

PDF PDF 1.29 MB
Increasing Reliability and Efficiency in Power Converter Designs Part 2 - Application Note 
This application note part 2 will provide insight into increasing reliability and efficiency in next-generation power converter designs.

應用手冊 2016-01-11

PDF PDF 977 KB

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