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Oscilloscope Measurement Tools to Help Debug Automotive Serial Buses Faster - Application Note 
Keysight's InfiniiVision Series oscilloscopes offer some unique measurement capabilities for debugging and characterizing the physical layer of automotive serial buses.

應用手冊 2015-08-01

Advanced Low-Frequency Noise Analyzer Overview 
This video will provide a brief overview of Keysight E4727A Advanced Low-Frequency Noise Analyzer (ALFNA), the next-generation system for measurement of 1/f noise and random telegraph noise. It will describe ALFNA’s innovative modular design and its technical advantages. It will also touch on wide-range applications and how they are enabled by ALFNA’s industry-leading technical specifications and rich feature set.

產品導覽 2015-04-21

 
Keysight Technologies to Showcase Semiconductor Parametric, Modeling Solutions at IRPS 2015 
Keysight announces it will demonstrate some of its many semiconductor parametric and modeling solutions at the 53rd International Reliability Physics Symposium (IRPS), Hyatt Regency Monterey Resort, Booth 203/205, Monterey, Calif., April 19-23.

新聞資料 2015-04-16

 
Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

新聞簡訊 2015-04-07

 
PXIe Vector Network Analyzer M937xA - Product Fact Sheet 
This two page flyer highlights the features and benefits of the Keysight PXI vector network analyzer which is a full two-port VNA that fits in just one slot.

型錄 2015-03-29

PDF PDF 271 KB
Characterization of PCB Insertion Loss with a New Calibration Method - Application Note 
In this application note a new method for characterizing PCB loss by using AFR with 1X Open fixtures is proposed.

應用手冊 2015-03-26

PDF PDF 700 KB
E5080A ENA Series Network Analyzer - Configuration Guide 
This configuration guide describes standard configurations, options, accessories and peripherals for the E5080A network analyzers.

配置設定指南 2015-03-25

PDF PDF 879 KB
Keysight WaferPro Express 
The Keysight WaferPro Express software performs automated wafer-level measurements of semiconductor devices such as transistors and circuit components. It provides turnkey drivers and test routines for a variety of instruments and wafer probers. Its user interface makes it easy to setup and run complex wafer-level test plans, while powerful customization capabilities are enabled by the new Python programming environment.

產品導覽 2015-03-24

 
Automated X-Ray Inspection System Keysight Technologies - Technical Overview 
This is a technical datasheet. Keysight has developed a sealed ultra-high vacumn X-ray tube that provides stable output throughout a significantly long life.

應用手冊 2015-03-24

PDF PDF 644 KB
WaferPro Express Software 
WaferPro Express software is an efficient and powerful automated measurement test platform for wafer-level characterization.

型錄 2015-03-15

PDF PDF 1.49 MB
Challenges and Solutions for Power Testing in Automotive Applications - Technical Overview 
This technical overview provides a synopsis of automotive electronic systems, the challenges they face and what tools automotive electronics engineers need to meet them. It concludes with a discussion of Keysight’s solutions to these challenges.

技術總覽 2015-03-12

PDF PDF 1.18 MB
航太與國防應用資源 
訂購 DVD 並下載應用說明

促銷資料 2015-03-11

 
How to Design an RF Power Amplifier: Class E 
This video provides an introduction to Class E Power Amplifiers and demonstrates a superior, time saving methodology to design and practically realize a Class E RF power amplifier using first principles to build an ideal circuit and then utilizing circuit design tools to synthesize a more realistic circuit topology from the ideal case.

使用說明影片 2015-03-11

 
Introducing Keysight E5080A ENA Vector Network Analyzer - Demo 
This video introduces the Keysight E5080A ENA vector network analyzer, which has the new touch-based GUI and offers the industry’s best combination of RF measurement performance and speed.

基本展示 2015-02-12

MP4 MP4 49.80 MB
The World’s Highest Pin Count In-Circuit Test Solutions - Brochure 
Keysight's new i3070 and 3070 in-circuit test (ICT) high node count test solution is the world’s highest pin count ICT system, bringing an unprecedented level of performance and portability to users.

型錄 2015-02-12

PDF PDF 212 KB
i3070 High Node Count Test Solution - Technical Overview 
Keysight's high node count test solution allows any Keysight 3070/i3070 Series 3 or Series 5 four-module test system to be easily upgraded into an ultra-high pin count test system

技術總覽 2015-02-12

PDF PDF 645 KB
Improving Speed and Accuracy in the Testing of BTS Filters and Duplexers - Application Brief 
This application brief explains why the E5080A ENA Series Network Analyzer is the ideal solution for BTS filters and duplexers manufacturing test.

應用手冊 2015-02-11

PDF PDF 597 KB
How to Use Envelope Tracking to Improve Power Amplifier Efficiency 
This video introduces basic concepts regarding applying envelope tracking to improve power amplifier efficiency.

使用說明影片 2015-02-10

 
M9068A Phase Noise X-Series Measurement Application for PXI Vector Signal Analyzers 
This document provides technical and other information related to the Phase Noise X-Series measurement application for modular instruments.

技術總覽 2015-02-10

PDF PDF 2.39 MB
Antenna Measurements for mm-wave Devices – MVG-Orbit/FR 
Antenna Measurements for mm-wave Devices from MCG-Orbit/FR and Keysight.

解決方案簡介 2015-02-09

 
In-Circuit Test Suite - Brochure 
Latest board and functional test solutions to help electronics manufacturers achieve better product quality withmore comprehensive test coverage.

型錄 2015-02-01

PDF PDF 10.42 MB
E5080A ENA Series Network Analyzer - Brochure 
This brochure introduces the Keysight E5080A ENA series network analyzer that is our next-generation ENA, providing best-in-class performance, flexible functionality and advanced usability.

型錄 2015-01-28

PDF PDF 3.87 MB
E5080A ENA Series Network Analyzer - Data Sheet 
This literature describes the technical specifications for E5080A and E5092A.

產品型錄 2015-01-28

PDF PDF 2.90 MB
How to Setup and Run Load Pull Simulations: The Basics 
This video introduces basic concepts regarding running load pull simulations. It then uses load pull simulation to find a load impedance that enables you to obtain greater than 43 dBm output power and greater than 55% PAE from a Cree FET.

使用說明影片 2015-01-27

 
How to Make Accurate, Automated RF Wafer-level Measurements 
The video introduces automation as a way to increase productivity and efficiency. Keysight WaferPro Express measurement software is used to illustrate the various steps in combination with Cascade Microtech Velox software for prober control and Cascade WinCalXE software for automated calibration.

使用說明影片 2015-01-27

 

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