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Keysight EEsof EDA Newsletter - Product and Application News 
Keep tabs on the latest product and application news and review the archives of the Keysight EEsof EDA Newsletter.

新聞簡訊 2014-09-09

 
Keysight Technologies Introduces Design and Test Solutions at European Microwave Week 
Keysight announces that it will demonstrate a wide range of new, high-performance flexible test solutions at the European Microwave Week 2014, Oct. 7–9, Rome, Fiera di Roma, Booth F100. The test solutions are used by engineers for designing and testing components for radar systems, antennas and next-generation wireless devices.

新聞資料 2014-09-03

 
GoldenGate RFIC Solutions 
This brochure highlights the benefits of the GoldenGate RFIC Simulator.GoldenGate is the most trusted simulation, analysis and verification solution available for integrated RF circuit design within Cadence Virtuoso.

型錄 2014-09-03

PDF PDF 954 KB
ADS Videos on YouTube 
Advanced Design System (ADS) Video Library playlist in Keysight EEsof EDA's Channel on YouTube

基本展示 2014-08-06

 
Antenna Measurements for mm-wave Devices – MVG-Orbit/FR 
Antenna Measurements for mm-wave Devices from MCG-Orbit/FR and Keysight.

解決方案簡介 2014-08-04

 
Wafer-level Measurement Solutions – Cascade Microtech 
Accurate and Repeatable Wafer-level Measurements from Cascade Microtech and Keysight.

解決方案簡介 2014-08-04

 
EDA Support Services 
Keysight Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.

型錄 2014-08-03

PDF PDF 465 KB
Keysight EEsof EDA Software and Modular Solutions for Universities 
Keysight works in collaboration with universities to provide tools that enable education and research for the engineers of tomorrow. The brochure outlines available programs, software and hardware.

型錄 2014-08-03

PDF PDF 1.44 MB
RF and Microwave Industry-Ready Student Certification Program 
This program confirms a student’s technical knowledge, design expertise, and hands-on measurement proficiency in the use of Keysight EEsof EDA software design tools and Keysight instruments.

型錄 2014-08-03

PDF PDF 576 KB
Simulating Envelope Tracking with Advanced Design System 
This example applies envelope tracking to an example amplifier to show techniques of using Advanced Design System (ADS) for this type of design.

應用手冊 2014-08-02

PDF PDF 2.44 MB
IC-CAP Device Modeling Software 
Technical overview of Keysight's Integrated Circuit Characterization and Analysis Program (IC-CAP), complete and accurate parameter extraction for semiconductor device modeling

技術總覽 2014-08-02

Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief 
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

應用手冊 2014-06-24

Model Quality Assurance (MQA) 
MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.

型錄 2014-06-18

PDF PDF 1.08 MB
Advanced Modeling Solutions for Nanoscale 3D FinFETs and High-Frequency/High-Power GaN HEMTs 
Agilent announces several innovations for the 2014 release of its industry-leading suite of device modeling and characterization software tools. The suite is comprised of IC-CAP, MBP, and MQA.

新聞資料 2014-06-18

 
Model Builder Program (MBP) 
MBP is a one-stop solution that provides both automation and flexibility for silicon device modeling.

型錄 2014-06-18

PDF PDF 1.47 MB
Agilent Technologies and Cascade Microtech Announce Alliance to Streamline Wafer-Level Measurements 
Agilent Technologies and Cascade Microtech announce a strategic alliance to provide fully configured and validated RF measurement solutions that streamline wafer-level semiconductor measurements while delivering guaranteed configuration, installation and support.

新聞資料 2014-06-03

 
Genesys 2014 Delivers Breakthrough Modulated RF Analysis for Circuit, System Design 
Keysight announces the latest release of Genesys 2014.

新聞資料 2014-05-27

 
WaferPro Express 
WaferPro Express software is an efficient and powerful automated measurement test platform for wafer-level characterization.

型錄 2014-05-20

PDF PDF 2.44 MB
Offline vs Inline: Shifting to automated inline ICT - White Paper  
This paper discusses the benefits of adopting an inline in-circuit test strategy for electronics manufacturers looking to increase product quality and reliability while ensuring optimal ROIC.

應用手冊 2014-05-14

Paving the Way for Research and Innovations - Brochure 
This is a selection guide for engineering researchers. It highlights the key research areas that Keysight is involved in, and solutions that can help to meet the research & development objectives.

促銷資料 2014-05-07

PDF PDF 2.62 MB
Antenna Measurement using Multi-Probe Scanning - MVG 
Antenna Measurement Solution using Multi-Probe Scanning from Microwave Vision Group and Keysight

解決方案簡介 2014-04-30

 
X-Parameter Design Simulation Models - Modelithics 
X-Parameter Design Simulation Models from Modelithics and Keysight.

解決方案簡介 2014-04-30

 
S-Parameter Measurements on Multiport Devices – In-Phase Technologies 
S-Parameter Measurements on Multiport Devices from In-Phase Technologies and Keysight

解決方案簡介 2014-04-30

 
球面近場天線量測 
NSI 與是德共同開發的球面近場天線量測解決方案。

解決方案簡介 2014-04-30

 
Real-Time Near-Field Measurement of Antenna Characteristics - EMSCAN 
Real-Time Near-Field Measurement of Antenna Characteristics from EMSCAN and Keysight

解決方案簡介 2014-04-16

 

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