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Application Information About Specific Components & Devices

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What is a linkage bit in a BSDL? 
The linkage bit in a Boundary Scan Description Language (BSDL) is use to describe a nondigital pins such as power, ground, no-connects, or analog signals in a boundary scan device.

FAQ 2012-01-01

 
What is a BSDL logical port? 
The Boundary Scan Description Language (BSDL) logical port description is used to assign names and connections on the device pin.

FAQ 2012-01-01

 
Is it possible to test non-boundary scan digital devices connected to boundary scan devices? 
This test strategy is commonly known as Silicon Nail test where the boundary scan cell (driver/receiver) of the boundary scan device connected to the non boundary scan device pins will be able to simulate the operation of the non-boundary scan device.

FAQ 2011-12-01

 
What is a boundary scan linker mux? 
A boundary scan linker mux (multiplexer) device, also known as JTAG scan bridge or scan path linker.

FAQ 2011-12-01

 
What is a compliance enable pin? 
Compliance enable pins must be held with stable logic states as described in the boundary scan description language (BSDL) before the device can be engaged in any 1149.1 boundary scan activities.

FAQ 2011-11-01

 
What is a USERCODE instruction? 
The USERCODE is an optional instruction in the boundary scan description language) (BSDL) that allows a 32-bit user programmable identification code to be loaded and shifted out for examination.

FAQ 2011-11-01

 
What is “Boundary Length"? 
The “Boundary Length” defines the number (length) of cells in the boundary scan register.

FAQ 2011-09-27

 
What is “Device Identification Register”? 
Use of the optional device identification register allows a data to be serially read from the device.

FAQ 2011-09-27

 
What are the Keysight Medalist i3070 limited access test solutions? 
Traditional in-circuit test (ICT) techniques are based on the assumption of 100% electrical test access to nodes on a printed circuit board assembly (PCBA). However...

FAQ 2011-08-29

 
What is the Max DC Input Voltage Before the Battery Charger Shuts Down? 
21-22 Volts.

FAQ 2011-08-29

 
What is a boundary scan chain? 
A boundary scan chain consists of two or more boundary scan devices

FAQ 2011-08-29

 
What is a CPLD ISP? 
The Keysight Medalist ICT system can be used to program IEEE 1149.1 compliant CPLD using the test access port (TAP). This programming becomes part of the overall testplan and is executed during in circuit test (ICT).

FAQ 2011-07-29

 
What is a silicon nail test on Keysight Medalist i3070? 
The silicon nail test refers to the use of boundary register cells to replace the needs for physical probes on nodes during in circuit testing of non boundary scan device.

FAQ 2011-07-29

 
What is a Boundary Register? 
The Boundary Register is the most important part of the boundary scan, it is a shift-register-based structure which has one or more boundary scan cell connected to a device pin.

FAQ 2011-06-23

 
What is the IEEE 1149.6 Standard? 
IEEE Standard 1149.6 refer to the “Boundary scan testing of Advanced Digital Networks” but is more popularly known as Dot6 or AC extest standard.

FAQ 2011-06-23

 
What is the IEEE 1532 Standard? 
The IEEE Standard 1532-2002 is a standard for in-system configuration of programmable components such as complex programmable logic device (CPLD), erasable programmable logic device (EPLD), and field programmable gate arrays (FPGA).

FAQ 2011-06-01

 
Is IEEE 1532 Standard supported on Keysight Medalist i3070? 
The IEEE 1532 Boundary-Scan Description Language (BSDL) can be compiled on the Keysight Medalist i3070 but it will not generate a specific IEEE 1532 test to run on the Keysight Medalist i3070.

FAQ 2011-06-01

 
What are the Data Register in a Boundary Scan? 
What are the Data Register in a Boundary Scan?

FAQ 2011-05-04

 
What is a Boundary Scan TAP Controller? 
A TAP controller is a 16-state machine, programmed by the Test Mode Select (TMS) and Test Clock (TCK) inputs, which controls the flow of data bits to the Instruction Register (IR) and the Data Registers (DR). The TAP Controller can be thought of as the control center of a boundary-scan device.

FAQ 2011-05-03

 
What is Boundary scan? 
Boundary-Scan is a test technique that involves devices designed with shift registers placed between each device pin and the internal logic

FAQ 2011-03-29

 
What is an Instruction Register? 
The Instruction Register lets you define the test to be performed, or the test data register to be accessed, or both during boundary scan test. Each Instruction Register cell comprises a shift-register flip-flop and a parallel output latch.

FAQ 2011-03-29

 
What are the IEEE standards related to Boundary Scan? 
The following IEEE standards are related to boundary scan testing:

FAQ 2011-02-25

 
What are the IEEE 1149.6 Boundary Scan tests generated on the Keysight Medalist i3070 in-circuit tester?  
The following IEEE 1149.6 Boundary Scan tests are generated on the Medalist i3070 in-circuit tester:

FAQ 2011-02-25

 
I have an AOI machine and am interested in requesting a feature enhancement. How can I do this?  
A system enhancement request can be submitted by phone or email, 1.800.829.4444 or emt-hstd-support_americas@keysight.com. It can also be submitted through any member of your local Keysight sales team.

FAQ 2011-01-11

 
Why use Boundary Scan Self Monitoring cell? 
The use of Self-Monitoring cells is an important consideration.

FAQ 2010-12-01

 

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