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Application Information About Specific Components & Devices

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Antenna Measurement Basics 
Review the terminology, measurement types, errors sources and test considerations. Reprinted with the permission of Orbit/FR Inc.

Training Materials 2004-03-03

PDF PDF 1.11 MB
Automated Stimulus & Current Drain Analysis for Validating/Optimizing Mobile Device Run Time 
customer viewable presentation

Training Materials 2008-04-15

PDF PDF 773 KB
Boundary Scan Online Training 
Get up to speed on boundary scan! Access online training materials for boundary scan from the comfort of your desk!

Training Materials 2010-01-28

 
Boundary Scan Test Methods for DDR Memories  
In-circuit testing of DDR Memories has become increasingly difficult. This webcast discusses methods of DDR test development and debug.

Training Materials 2011-03-28

 
Cheetah PNA RCS and Antenna Measurement System Presentation 
View the presentation on Cheetah PNA RCS and Antenna Measurement Systems. Reprinted with the permission of SPC Corp.

Training Materials 2004-03-25

PDF PDF 2.29 MB
DfT rules for boundary scan during ICT 
Learn about the design for test rules for boundary scan used at in-circuit test, that can help you create a good test, minimizing the time and effort needed for debugging while maximizing the efficiency of your test.

Training Materials 2009-12-01

PDF PDF 276 KB
Genesys Workspaces Companion and Sample Chapters for Microwave and RF Engineering Text Book 
Get the Genesys workspaces download and sample chapters for Ali Behagi and Steven Turner's text book, "Microwave and RF Engineering: An Eletronic Design Automation Approach".

Training Materials 2014-09-30

 
Keysight EEsof EDA Customer Education and Services 
Brief overview of Keysight EEsof EDA Customer Education and Services.

Training Materials 2010-08-11

 
Near-field vs. Far-field 
Review the tradeoffs and advantages of either a near field or far field antenna test solution. Reprinted with the permission of NearField Systems Inc.

Training Materials 2004-03-03

PDF PDF 582 KB
New Tools For Optimizing Operating Time of Mobile Wireless Devices 
Explore challenges of measuring battery current consumption in design validation of next generation digital communications devices including 2.5/3G handsets, Wireless LAN, and Bluetooth technology.

Training Materials 2002-06-25

 
Surviving State Disruptions Caused by Test: the "Lobotomy Problem” 
Boundary scan test may affect the logic states of a device as it switches between core logic operation to test mode operation. This webcast puts forth proposals to restore the logic state to a defined state after testing.

Training Materials 2010-12-21