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Application Information About Specific Components & Devices

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DesignCon 2017 
February 1-2, 2017; Santa Clara Convention Center, CA

Tradeshow

 
Keysight EEsof EDA Customer Education and Services 
Brief overview of Keysight EDA Customer Education and Services.

Training Materials 2016-07-20

 
International Microwave Symposium (IMS) 2016 
May 22-27, 2016; San Francisco, CA

Tradeshow

 
DynaFET: Advanced model for GaN/GaAs HEMTs from NVNA measurements and ANNs Webcast 
Original broadcast September 4, 2014

Webcast - recorded

 
Innovations in EDA: Accurate Modeling of GaAs & GaN HEMT’s for Nonlinear Applications Webcast 
Original broadcast May 7, 2013

Webcast - recorded

 
Setting Up IC-CAP WaferPro For On-Wafer Measurements 
Original broadcast June 22, 2011

Webcast - recorded

 
Automating SPICE Library Validation 
Recorded webcast and slide set for a Model Quality Assurance (MQA) webcast held on October 22, 2013.

Seminar Materials 2013-10-22

 
MQA: Automating Library Validation 
MQA is the industry standard qualification platform that assists modeling experts and model users to perform comprehensive model qualification with an knowledge-based, rules-driven approach.

Seminar Materials 2013-10-22

PDF PDF 1.48 MB
Measurement Based FET Modeling using Artifical Neural Networks (ANN) 
This presentation was given by Jianjun Xu with introduction by David Root as part of the Innovations in EDA Webcast Series.

Seminar Materials 2012-02-07

PDF PDF 2.51 MB
Setting up IC-CAP WaferPro for On-Wafer Measurements 
IC-CAP WaferProIs is an extremely powerful test plan suite, for on-Wafer DC/CV and RF device modeling measurements.

Seminar Materials 2011-06-22

PDF PDF 3.07 MB
IC-CAP User Training 
This 3-day course will show device modelers how to use Keysight EEsof EDA's IC-CAP software. Click on link to view full course description and class dates and locations.

Classroom Training