您可能感興趣的網頁。 觀看搜尋結果:

 

聯絡是德專家

元件與特定裝置

縮小範圍

移除所有細分

依產業/技術

依內容類型

依產品分類

1-21 / 21

排序:
Testing a Network Communication PCBA from Prototype to Manufacturing - Article Reprint 
Early implementation of BST can cut test costs and time.

專文 2016-02-17

PDF PDF 178 KB
New IEEE Standards for Board and System Tests - Article Reprint 
This article highlights of changes to IEEE Std 1149.1, IEEE Std 1149.6, IEEE P1149.10 and IEEE P1838.

專文 2016-02-16

PDF PDF 190 KB
The Boundary Scan Toolbox - Article Reprint 
Find out how boundary scan can enable embedded and other value-added test in your toolbox.

專文 2016-02-16

PDF PDF 409 KB
I'm a Board Test Engineer and I'm Loving It! - Article Reprint 
Life on the road can be relentless, but it’s never boring. Find out why from this personal story of a test engineer.

專文 2016-02-12

PDF PDF 178 KB
Tester for Hire - Article Reprint 
This article explores the possibility of renting test equipment to help electronics manufacturers juggle capacity according to production demand and available resources.

專文 2016-02-09

PDF PDF 381 KB
Testing the Internet of Things - Article Reprint 
Connectivity is embedded in the electronics ecosystem. And test should be embedded in the devices that support it.

專文 2016-02-09

PDF PDF 79 KB
Manufacturing Test Solutions for SSDS - Article Reprint 
A new system performs both ICT and boundary scan in high-volume settings.

專文 2016-02-09

PDF PDF 222 KB
Emulating Analog Input Sensors in Automotive Electronics Functional Test - Article Reprint 
This article discusses guidelines for evaluating the digital-analog converters for your automotive electronics functional test needs.

專文 2016-02-09

PDF PDF 318 KB
Finding Fault - Article Reprint 
testing mission-critical functions in automotive electronics.

專文 2016-02-05

PDF PDF 452 KB
Making Boundary Scan Easy - Article Reprint 
Testing boundary scan devices no longer need be a laborious task.

專文 2016-02-03

PDF PDF 217 KB
Testing of Small Form-Factor Products - Article Reprint 
Boundary scan and embedded test will need to make up for ICT gaps.

專文 2016-02-03

PDF PDF 546 KB
Automating In-Circuit Test - Article Reprint 
Inline ICT is not as cumbersome as it used to be, and in the longer run, will help manufacturers save costs.

專文 2016-02-02

PDF PDF 87 KB
Testing New Grounds in Automotive Electronics - Article Reprint 
Manufacturers are increasingly designing products for ease of test.

專文 2016-02-02

PDF PDF 279 KB
Principal Component Analysis-Based Compensation for Measurement Errors 
This paper examines some issues and trends that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing. Published with kind permission of the IEEE

專文 2015-06-08

PDF PDF 1.86 MB
Comparing Boundary Scan Methods White Paper 
The need for reusable tests is driving standalone boundary scan-ICT integration. This article first appeared in the September 2009 issue of Circuits Assembly and is reprinted with kind permission.

專文 2014-07-31

PDF PDF 2.75 MB
Boundary-Scan Advanced Diagnostic Methods 
This paper illustrates how usage of boundary scan circuit information and predictive analysis of potential assembly faults will provide more precise and accurate diagnostic information.

專文 2012-04-17

PDF PDF 1.20 MB
Testing DDR Memory; How On-Chip DFT Helps 
This paper discusses DDR memory testing challenges we see today, and how the adoption of DFT capabilities pays off in higher test coverage, better diagnostics and reduced programming/support time.

專文 2012-04-17

PDF PDF 530 KB
Solutions for Undetected Shorts on IEEE 1149.1 Self-Monitoring Pins 
This paper presents the problem of undetected shorts on IEEE 1149.1 compliant self-monitoring pins, and potential mitigating solutions.

專文 2010-12-10

PDF PDF 789 KB
Surviving State Disruptions Caused by Test: the "Lobotomy Problem" 
This paper examines some issues and trends that justify adding features to IEEE 1149.1 that will facilitate safe, fast and effective initialization of a board or system, to get it ready for testing. Published with kind permission of the IEEE

專文 2010-12-10

PDF PDF 402 KB
The Proposed IEEE Test Standards - Article Reprint 
There is a resurgence of interest in Boundary Scan and Built in Self Test (BIST) initiatives to be part of IEEE standards. This article explains the IEEE standard and their benefits to the industry. Agilent Boundary Scan, 1149.6, 1149.1, bead probes, cover-extend

專文 2010-10-20

PDF PDF 2.83 MB
Limited Access Tools Improve Test Coverage - Article Reprint 
Smaller test pads and shrinking board sizes are posing new challenges, and driving innovations to overcome limited access with new test solutions. Agilent Boundary Scan, 1149.6, 1149.1, bead probes, cover-extend

專文 2010-10-20

PDF PDF 275 KB