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Keysight EEsof EDA Premier Communications Design Software 
Keysight EEsof EDA premier communications design software product overview brochure.

Brochure 2016-09-26

PDF PDF 2.78 MB
Model Builder Program (MBP) 
MBP is a one-stop solution that provides both automation and flexibility for silicon device modeling.

Brochure 2016-01-25

PDF PDF 930 KB
Model Quality Assurance (MQA) 
MQA provides the complete solution and framework to fabless design companies, IDMs, and foundries for SPICE model library validation, comparison, and documentation.

Brochure 2016-01-25

PDF PDF 3.13 MB
WaferPro Express Software 
WaferPro Express software is an efficient and powerful automated measurement test platform for wafer-level characterization.

Brochure 2015-03-15

PDF PDF 1.49 MB
Keysight EEsof EDA Customer Support - Brochure 
Whether you are a novice or an experienced user, Keysight EEsof EDA’s customer support offerings are designed to help you every step of the way.

Brochure 2014-08-03

PDF PDF 175 KB
Keysight EEsof EDA Software and Modular Solutions for Universities 
Keysight works in collaboration with universities to provide tools that enable education and research for the engineers of tomorrow. The brochure outlines available programs, software and hardware.

Brochure 2014-08-03

PDF PDF 1.44 MB
EDA Support Services - Flyer 
Keysight Support Services for EDA Products offers customers several benefits otherwise not available. This service is designed to help you get the most out of your software purchases.

Brochure 2014-08-03

PDF PDF 454 KB
RF and Microwave Industry-Ready Student Certification Program - Brochure 
This program confirms a student’s technical knowledge, design expertise, and hands-on measurement proficiency in the use of Keysight EEsof software design tools and Keysight instruments.

Brochure 2014-08-03

PDF PDF 562 KB
Compact Hierarchical Bipolar Transistor Modeling with HiCUM 
An international series on advances in solid state electronics and technology by Michael Schroter and Anjan Chakravorty.

Promotional Materials 2010-08-01

PDF PDF 330 KB