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Increasing Reliability and Efficiency in Power Converter Designs Part 2 - Application Note 
This application note part 2 will provide insight into increasing reliability and efficiency in next-generation power converter designs.

Application Note 2016-01-11

PDF PDF 977 KB
Increasing Reliability and Efficiency in Power Converter Designs Part 3 - Application Note 
This application note part 3 will provide insight into increasing reliability and efficiency in next-generation power converter designs.

Application Note 2016-01-11

PDF PDF 1.29 MB
Increasing Reliability and Efficiency in Power Converter Designs Part 4 - Application Note 
This application note part 4 is the final in the series, and will provide insight into increasing reliability and efficiency in next-generation power converter designs.

Application Note 2016-01-11

PDF PDF 1.55 MB
IV Characterizations of Solar Cells Using the B2900A Series of SMUs - Application Note 
The Keysight B2900A Series Precision SMU allows you to accurately and quickly make characterization of photovoltaic cells with its intuitive GUI and free PC-based application software.

Application Note 2015-12-14

Quickly Validate Designs for DOCSIS 3.1 Compliance - Application Brief 
This “DOCSIS 3.1 Test Solution" app brief gives insight into Keysight solutions that can be used for testing DOCSIS 3.1 transmitters, receivers and components.

Application Note 2015-11-14

TS-8989 System Integration Guide - Application Note 
In today’s manufacturing environment, floor space is an increasingly invaluable variable in the cost of test equation.

Application Note 2015-11-11

PDF PDF 2.87 MB
Alliance for Wireless Power (A4WP) Measurements Using an Oscilloscope (Part 1) - Application Note 
This application note is Part 1 of a 3-part series on A4WP wireless charging measurements. This part focuses on performing ITX_COIL measurements during the power transfer state (non-beacons).

Application Note 2015-11-06

Alliance for Wireless Power (A4WP) Measurements Using an Oscilloscope (Part 2) - Application Note 
This application note is Part 2 of a 3-part series on A4WP wireless charging measurements. This part focuses on performing ITX_COIL measurements during the power save state (beacons), including beacon.

Application Note 2015-11-06

Alliance for Wireless Power (A4WP) Measurements Using an Oscilloscope (Part 3) - Application Note 
Power and Efficiency Measurements. This application note is Part 3 of a 3-part series on A4WP wireless charging measurements. This part focuses on performing power and efficiency measurements.

Application Note 2015-11-06

Characterizing MEMS Magneto-Impedance Sensor using the Keysight Impedance Analyzer 
This application note describes the benefits of using Agilent impedance analyzers for device characterization of MEMS Magneto-Impedance (MI) sensors and how they improve design and test efficiency while offering a wide variety of design-automation tools and functions.

Application Note 2015-10-05

MEMS On-wafer Evaluation in Mass Production - Application Note 
This application note describes how to evaluate MEMS elements in the on-wafer stage in order to lower the total production cost in mass production.

Application Note 2015-08-27

Accurate Evaluation of MEMS Piezoelectric Sensor and Actuator using the 4294A - Application Note 
This application brief describes the benefits of using the Keysight 4294A for device characterization of MEMS piezoelectric sensors and actuators, along with its wide variety of analysis functions and features and how it improves design efficiency.

Application Note 2015-08-26

“Shotgunning”, a Bad Fit for Lead-Free Test 
Shotgunning, a common repair technique in functional test, will be negatively affected by lead-free processes. This article explores the technique and draws broad conclusions regarding the impact of lead-free on electronics manufacturing test

Application Note 2015-07-14

PDF PDF 99 KB
Programming with the N937xA PXIe Vector Network Analyzers - Application Note 
This application note discusses the process of developing a C# application using an IVI driver as the programming remote driver for the M937xA PXIe vector network analyzer.

Application Note 2015-07-07

PDF PDF 4.75 MB
Testing Automotive Electronic Parking Brake Controls with the TS-8989 - Application Note 
This application note discusses the configuration of a typical Keysight TS-8989 PXI Functional Test System for testing automotive electronic parking brake controls.

Application Note 2015-05-11

Drive Down the Cost of Test Using the ENA Series of Network Analyzers - Application Note 
In this application note, we discuss the contributions of Keysight Technologies, Inc.’s ENA Series of Vector Network Analyzers (ENA, hereafter) to drive down the cost of test in production lines.

Application Note 2015-05-01

PDF PDF 2.46 MB
Characterization of PCB Insertion Loss with a New Calibration Method - Application Note 
In this application note a new method for characterizing PCB loss by using AFR with 1X Open fixtures is proposed.

Application Note 2015-03-26

PDF PDF 700 KB
Automated X-Ray Inspection System Keysight Technologies - Technical Overview 
This is a technical datasheet. Keysight has developed a sealed ultra-high vacumn X-ray tube that provides stable output throughout a significantly long life.

Application Note 2015-03-24

PDF PDF 644 KB
Debug Automotive Designs Faster with CAN-dbc Symbolic Trigger and Decode - Application Note 
Learn about CAN-dbc symbolic triggering and how to improve debug of your automotive designs using an oscilloscope.

Application Note 2015-03-13

The Role of a Compact Low Voltage FE-SEM in MEMS Analysis - Application Note 
Overview of the 8500 high resolution imaging for MEMS devices without the need for metal coating to dissipate charge buildup.

Application Note 2015-03-11

PDF PDF 5.66 MB
Oscilloscopes to Test and Characterize Today’s Power Supplies - Application Brief 
InfiniiVision 3000 and 4000 X-Series oscilloscopes with the Power Measurements option provide automatic power supply characterization measurements that help you optimize your power supply designs.

Application Note 2015-02-20

Improving Speed and Accuracy in the Testing of BTS Filters and Duplexers - Application Brief 
This application brief explains why the E5080A ENA Series Network Analyzer is the ideal solution for BTS filters and duplexers manufacturing test.

Application Note 2015-02-11

CAN FD Eye-Diagram Mask Testing - Application Note 
Eye-diagram mask testing is used in a broad range of today’s serial bus applications. Learn more about eye-diagram testing for higher speed buses such as the new CAN FD serial bus.

Application Note 2015-02-05

Time Domain Reflectometry Theory - Application Note 
When compared to other measurement techniques, time domain reflectometry provides a more intuitive and direct look at the DUT's characteristics.

Application Note 2015-01-30

Detecting Tailgating Boards on the i3070 Inline In-Circuit Tester - Application Note 
Tailgating sensor improvements on the Keysight i3070 Series 5i inline in-circuit tester help to further minimize damages due to operator and upstream loading errors.

Application Note 2015-01-05

PDF PDF 437 KB

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