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Quad Flat No Lead (QFN) Best Practices 
The purpose of this application note and best practices guide is to describer the QFN-type component and provide testing methods to ensure robust testing on the Medalist 5DX Automated X-ray Inspection (AXI) System.

Application Note 2008-08-26

PDF PDF 492 KB
Optimizing Power Savings on WiMax and Other Cellular WWAN Interface Devices - Application Note 
This document describes how to optimze power savings on WiMax and other cellular WWAN interface devices.

Application Note 2008-07-15

Small Engine Dynamometer Testing - Application Note 
Performing Dynamometer Testing on Combustion Engines

Application Note 2008-06-01

PDF PDF 443 KB
High Node Count Fixturing Solutions for Keysight Short-Wire Test Fixtures 
This paper discusses problems encountered in building large, high node count vacuum actuated test fixtures for the Keysight 3070 family of board test systems.

Application Note 2008-04-30

PDF PDF 67 KB
Automotive ECU Transient Testing Using Captured Power System Waveforms 

Application Note 2008-01-10

The Benefits of Using LXI in Automotive Functional Test 
LXI can help maximize performance, minimize cost and extend capital investments into the future. This whitepaper explores the benefits associated with using LXI in Automotive Functional test.

Application Note 2007-11-29

PDF PDF 471 KB
The Future of In-Circuit Testing in the High-speed, Complex Electronics Environment 
As board complexity and node counts continue to rise and high speed differential signaling continues to grow in popularity, In-Circuit Test needs to move quickly beyond the traditional realms. This article explores this in detail.

Application Note 2007-10-31

Tips for X-ray Users On Exporting NDF’s With No Loads Set To False 
Navigating CAD can be a time consuming process. Small tips can be extremely helpful in creating quality programs in a short amount of time.

Application Note 2007-10-18

 
Making the Most of Keysight Throughput Multiplier on Medalist In-Circuit Test Systems 
Keysight Throughput Multiplier reduces test time on in-circuit test systems by testing up to four boards of a single-board-type panel simultaneously. The tips in this application note will help users make the most of this valuable tool.

Application Note 2007-10-12

 
X-ray Test Users Utilize BOM Explorer to Change  
Automated X-ray Inspection 5DX Users can save time by implementing these quick and easy steps to use BOM explorer to change "no pops" to "untested".

Application Note 2007-10-12

 
Medalist SP50 User Tips for Nominal Paste Factor Field  
Registered users, on valid support contracts, can login to learn about how using the Nominal Paste Factor appropriately can improve the system measurement results on the Medalist SP50 Solder Paste Inspection System.

Application Note 2007-10-11

 
Automating Keysight 14565B Software Battery Drain Measurements with LabVIEW 
This document describes the process of making battery drain measurements with the Keysight 14565B and National Instruments Labview

Application Note 2007-10-11

PDF PDF 188 KB
Accelerate Wireless Mobile Device Design Validation with Automated Test Solution 
This document describes how to accelerate wireless mobile device design validation using Keysight automated test solutions.

Application Note 2007-10-11

Accurate Mixer Measurements with ENA Frequency-Offset Mode (AN 1463-6) 
Recommended measurement procedures for evaluating mixers.

Application Note 2007-05-07

Advanced Measurement Techniques for RF Amplifiers Using Unique Functions of the Keysight E5071C ENA 
This application note will briefly review the basic measurement fundamentals of characterizing amplifiers with network analyzers.

Application Note 2007-04-27

Maximising Test Coverage with Keysight Medalist VTEP v2.0 
This paper describes how to get the most from Keysight Technologies’ industry-leading vectorless test innovation, the Medalist VTEP v2.0 which is a suite of solution comprising VTEP, iVTEP and NPM.

Application Note 2007-04-17

Improving the Test Efficiency of the MEMS Capacitive Sensor using the E4980A 
This application brief describes the features of the Keysight E4980A and how it can dramatically improve the test efficiency of MEMS capacitive sensors.

Application Note 2007-04-13

Improving Test Efficiency of MEMS Electrostatic Actuator using the E4980A 
This application brief describes how the Keysight E4980A can greatly improve the test efficiency of MEMS electrostatic actuators.

Application Note 2007-04-12

Characterizing Electromagnetic MEMS Optical Switch Actuator using the E4980A 
This application brief describes how the Keysight E4980A improves the test efficiency of electromagnetic MEMS optical switch actuators.

Application Note 2007-04-04

Characterizing Electromagnetic MEMS Optical Scanner using the E4980A 
This application brief describes how the Keysight E4980A can greatly improve the test efficiency of electromagnetic MEMS optical scanners.

Application Note 2007-04-04

Battery Drain Analysis Improves Mobile-Device Operating Time - Application Note 
Using specialized tools and analysis techniques can help you create mobile-device designs that extend battery life and improve your productivity.

Application Note 2007-02-01

Evaluating Battery Run-down Performance of the 66319D and the 14565B (AN 1427) 
This application note describes how to easily and accurately evaluate the performance of a mobile wireless device while being directly powered by its battery.

Application Note 2007-01-31

Mobile Communications Device Testing (AN 1310) 
Pulsed battery drain currents, regulated charge currents, and remote DUT fixtures, dictate the need for specialized power sourcing, loading, and measurement capabilities for testing mobile communications devices.

Application Note 2007-01-16

PDF PDF 251 KB
Current Drain Analysis Enhances WLAN Network Card Design and Test - Application Note 
This application note explains how to simplify the complex task of accurately measuring and evaluating the current drain of a WLAN network card for its various operating modes.

Application Note 2006-12-14

Highly Accurate Amplifier ACLR and ACPR Testing with the Keysight N5182A MXG Vector Signal Generator 
This note discusses ACLR/ACPR as a key performance characteristic for power amplifiers used to test wireless communications systems and how the Keysight MXG vector signal generator is used to test them.

Application Note 2006-08-30

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